NeXus NXDL vocabulary

Anchors for all NeXus fields, groups, attributes, and links

NXDL Vocabulary

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@auxiliary_signals
/NXdata@auxiliary_signals-attribute
@axes
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@axes-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@axes-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient@axes-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude@axes-attribute
/NXcxi_ptycho/DATA@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@axes-attribute
/NXcxi_ptycho/entry_1/instrument_1/detector_1@axes-attribute
/NXdata/DATA@axes-attribute
/NXdata@axes-attribute
/NXdetector/efficiency@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack@axes-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary@axes-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model@axes-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map@axes-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@axes-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi@axes-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack@axes-attribute
/NXguide/reflectivity@axes-attribute
/NXopt/ENTRY/data_collection/DATA@axes-attribute
/NXopt/ENTRY/plot@axes-attribute
/NXtransmission/ENTRY/data@axes-attribute
@axis
/NXdata/AXISNAME@axis-attribute
/NXdetector/time_of_flight@axis-attribute
/NXdetector/x_pixel_offset@axis-attribute
/NXdetector/y_pixel_offset@axis-attribute
/NXdetector/z_pixel_offset@axis-attribute
@axisname_indices
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum@AXISNAME_indices-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA@AXISNAME_indices-attribute
/NXdata@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack@AXISNAME_indices-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi@AXISNAME_indices-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack@AXISNAME_indices-attribute
@baseline_reference
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@baseline_reference-attribute
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials@baseline_reference-attribute
/NXxpcs/entry/twotime/two_time_corr_func@baseline_reference-attribute
@cansas_class
/NXcanSAS/ENTRY/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/DATA@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE@canSAS_class-attribute
/NXcanSAS/ENTRY/INSTRUMENT@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS/COLLECTION@canSAS_class-attribute
/NXcanSAS/ENTRY/PROCESS@canSAS_class-attribute
/NXcanSAS/ENTRY/SAMPLE@canSAS_class-attribute
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@canSAS_class-attribute
/NXcanSAS/ENTRY@canSAS_class-attribute
@check_sum
/NXdetector/data@check_sum-attribute
@comment
/NXentry/revision@comment-attribute
/NXsubentry/revision@comment-attribute
@configuration
/NXentry/program_name@configuration-attribute
/NXsubentry/program_name@configuration-attribute
@creator
/NXroot@creator-attribute
@creator_version
/NXroot@creator_version-attribute
@default
/NXaperture@default-attribute
/NXattenuator@default-attribute
/NXbeam@default-attribute
/NXbeam_stop@default-attribute
/NXbending_magnet@default-attribute
/NXcanSAS/ENTRY@default-attribute
/NXcapillary@default-attribute
/NXcite@default-attribute
/NXcollimator@default-attribute
/NXcrystal@default-attribute
/NXcylindrical_geometry@default-attribute
/NXdetector@default-attribute
/NXdetector_group@default-attribute
/NXdetector_module@default-attribute
/NXdisk_chopper@default-attribute
/NXentry@default-attribute
/NXevent_data@default-attribute
/NXfermi_chopper@default-attribute
/NXfilter@default-attribute
/NXflipper@default-attribute
/NXfresnel_zone_plate@default-attribute
/NXgeometry@default-attribute
/NXgrating@default-attribute
/NXguide@default-attribute
/NXinsertion_device@default-attribute
/NXinstrument@default-attribute
/NXlog@default-attribute
/NXmirror@default-attribute
/NXmoderator@default-attribute
/NXmonitor@default-attribute
/NXmonochromator@default-attribute
/NXnote@default-attribute
/NXoff_geometry@default-attribute
/NXorientation@default-attribute
/NXparameters@default-attribute
/NXpinhole@default-attribute
/NXpolarizer@default-attribute
/NXpositioner@default-attribute
/NXprocess@default-attribute
/NXreflections@default-attribute
/NXroot@default-attribute
/NXsample@default-attribute
/NXsample_component@default-attribute
/NXsensor@default-attribute
/NXshape@default-attribute
/NXslit@default-attribute
/NXsource@default-attribute
/NXsubentry@default-attribute
/NXtransformations@default-attribute
/NXtranslation@default-attribute
/NXuser@default-attribute
/NXvelocity_selector@default-attribute
/NXxraylens@default-attribute
@default_slice
/NXdata@default_slice-attribute
@depends_on
/NXbeam/TRANSFORMATIONS/DIRECTION@depends_on-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@depends_on-attribute
/NXbeam_path/TRANSFORMATIONS/AXISNAME@depends_on-attribute
/NXdetector_module/fast_pixel_direction@depends_on-attribute
/NXdetector_module/module_offset@depends_on-attribute
/NXdetector_module/slow_pixel_direction@depends_on-attribute
/NXms_feature_set@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@depends_on-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@depends_on-attribute
/NXtransformations/AXISNAME@depends_on-attribute
@description
/NXelectrostatic_kicker/timing@description-attribute
/NXmagnetic_kicker/timing@description-attribute
/NXreflections/background_mean@description-attribute
/NXreflections/bounding_box@description-attribute
/NXreflections/d@description-attribute
/NXreflections/det_module@description-attribute
/NXreflections/entering@description-attribute
/NXreflections/flags@description-attribute
/NXreflections/h@description-attribute
/NXreflections/id@description-attribute
/NXreflections/int_prf@description-attribute
/NXreflections/int_prf_errors@description-attribute
/NXreflections/int_prf_var@description-attribute
/NXreflections/int_sum@description-attribute
/NXreflections/int_sum_errors@description-attribute
/NXreflections/int_sum_var@description-attribute
/NXreflections/k@description-attribute
/NXreflections/l@description-attribute
/NXreflections/lp@description-attribute
/NXreflections/observed_frame@description-attribute
/NXreflections/observed_frame_errors@description-attribute
/NXreflections/observed_frame_var@description-attribute
/NXreflections/observed_phi@description-attribute
/NXreflections/observed_phi_errors@description-attribute
/NXreflections/observed_phi_var@description-attribute
/NXreflections/observed_px_x@description-attribute
/NXreflections/observed_px_x_errors@description-attribute
/NXreflections/observed_px_x_var@description-attribute
/NXreflections/observed_px_y@description-attribute
/NXreflections/observed_px_y_errors@description-attribute
/NXreflections/observed_px_y_var@description-attribute
/NXreflections/observed_x@description-attribute
/NXreflections/observed_x_errors@description-attribute
/NXreflections/observed_x_var@description-attribute
/NXreflections/observed_y@description-attribute
/NXreflections/observed_y_errors@description-attribute
/NXreflections/observed_y_var@description-attribute
/NXreflections/overlaps@description-attribute
/NXreflections/partiality@description-attribute
/NXreflections/polar_angle@description-attribute
/NXreflections/predicted_frame@description-attribute
/NXreflections/predicted_phi@description-attribute
/NXreflections/predicted_px_x@description-attribute
/NXreflections/predicted_px_y@description-attribute
/NXreflections/predicted_x@description-attribute
/NXreflections/predicted_y@description-attribute
/NXreflections/prf_cc@description-attribute
/NXreflections/reflection_id@description-attribute
/NXreflections@description-attribute
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control@description-attribute
@direction
/NXsample/electric_field@direction-attribute
/NXsample/magnetic_field@direction-attribute
/NXsample/stress_field@direction-attribute
@distribution
/NXdata/AXISNAME@distribution-attribute
@entry
/NXarpes/ENTRY@entry-attribute
/NXiqproc/ENTRY@entry-attribute
/NXsastof/ENTRY@entry-attribute
/NXsqom/ENTRY@entry-attribute
/NXxas/ENTRY@entry-attribute
/NXxasproc/ENTRY@entry-attribute
@equipment_component
/NXtransformations/AXISNAME@equipment_component-attribute
@file_name
/NXroot@file_name-attribute
@file_time
/NXroot@file_time-attribute
@file_update_time
/NXroot@file_update_time-attribute
@first_good
/NXdata/AXISNAME@first_good-attribute
@first_point_for_fit
/NXxpcs/entry/twotime/g2_from_two_time_corr_func@first_point_for_fit-attribute
@flux
/NXmx/ENTRY/INSTRUMENT/BEAM@flux-attribute
@frequency
/NXdetector/raw_time_of_flight@frequency-attribute
@h5py_version
/NXroot@h5py_version-attribute
@hdf5_version
/NXroot@HDF5_Version-attribute
@hdf_version
/NXroot@HDF_version-attribute
@i_axes
/NXcanSAS/ENTRY/DATA@I_axes-attribute
@idf_version
/NXentry@IDF_Version-attribute
/NXsubentry@IDF_Version-attribute
@index
/NXarchive/entry@index-attribute
@interpretation
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation@interpretation-attribute
@last_good
/NXdata/AXISNAME@last_good-attribute
@local_name
/NXdetector/crate@local_name-attribute
/NXdetector/input@local_name-attribute
/NXdetector/slot@local_name-attribute
@long_name
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/axis_mass_to_charge@long_name-attribute
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/data_counts@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_x@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_y@long_name-attribute
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_z@long_name-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient@long_name-attribute
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude@long_name-attribute
/NXdata/AXISNAME@long_name-attribute
/NXdata/DATA@long_name-attribute
/NXdetector/data@long_name-attribute
/NXdetector/time_of_flight@long_name-attribute
/NXdetector/x_pixel_offset@long_name-attribute
/NXdetector/y_pixel_offset@long_name-attribute
/NXdetector/z_pixel_offset@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_image_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/axis_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_image_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_energy_loss@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/axis_energy_loss@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/pattern_identifier@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_photon_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_x@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_y@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/data_counts@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/axis_photon_energy@long_name-attribute
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/data_counts@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/data@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_z@long_name-attribute
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/data@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_z@long_name-attribute
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/data@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/data@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_x@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_y@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/data_counts@long_name-attribute
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/pattern_identifier@long_name-attribute
/NXimage_set/stack/axis_image_identifier@long_name-attribute
/NXimage_set/stack/axis_x@long_name-attribute
/NXimage_set/stack/axis_y@long_name-attribute
/NXimage_set_em_adf/stack/axis_image_identifier@long_name-attribute
/NXimage_set_em_adf/stack/axis_x@long_name-attribute
/NXimage_set_em_adf/stack/axis_y@long_name-attribute
/NXimage_set_em_kikuchi/stack/axis_x@long_name-attribute
/NXimage_set_em_kikuchi/stack/axis_y@long_name-attribute
/NXimage_set_em_kikuchi/stack/data_counts@long_name-attribute
/NXimage_set_em_kikuchi/stack/pattern_identifier@long_name-attribute
/NXspectrum_set/stack/axis_energy@long_name-attribute
/NXspectrum_set/stack/axis_x@long_name-attribute
/NXspectrum_set/stack/axis_y@long_name-attribute
/NXspectrum_set/stack/data_counts@long_name-attribute
/NXspectrum_set/summary/axis_energy@long_name-attribute
/NXspectrum_set/summary/data_counts@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_energy_loss@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_x@long_name-attribute
/NXspectrum_set_em_eels/stack/axis_y@long_name-attribute
/NXspectrum_set_em_eels/stack/data_counts@long_name-attribute
/NXspectrum_set_em_eels/summary/axis_energy_loss@long_name-attribute
/NXspectrum_set_em_eels/summary/data_counts@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_x@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_y@long_name-attribute
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/data_counts@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_photon_energy@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_x@long_name-attribute
/NXspectrum_set_em_xray/stack/axis_y@long_name-attribute
/NXspectrum_set_em_xray/stack/data_counts@long_name-attribute
/NXspectrum_set_em_xray/summary/axis_photon_energy@long_name-attribute
/NXspectrum_set_em_xray/summary/data_counts@long_name-attribute
@mask
/NXcanSAS/ENTRY/DATA@mask-attribute
@mask_indices
/NXcanSAS/ENTRY/DATA@Mask_indices-attribute
@mime_type
/NXsubentry/thumbnail@mime_type-attribute
@name
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM@name-attribute
/NXcanSAS/ENTRY/run@name-attribute
@nexus_release
/NXroot@NeXus_release-attribute
@nexus_repository
/NXroot@NeXus_repository-attribute
@nexus_version
/NXroot@NeXus_version-attribute
@nx_class
/NXroot@NX_class-attribute
@offset
/NXbeam/TRANSFORMATIONS/DIRECTION@offset-attribute
/NXbeam/TRANSFORMATIONS/reference_plane@offset-attribute
/NXdetector_module/fast_pixel_direction@offset-attribute
/NXdetector_module/module_offset@offset-attribute
/NXdetector_module/slow_pixel_direction@offset-attribute
/NXevent_data/event_time_zero@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset@offset-attribute
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction@offset-attribute
/NXtomoproc/entry/data/data@offset-attribute
/NXtransformations/AXISNAME@offset-attribute
@offset_units
/NXdetector_module/fast_pixel_direction@offset_units-attribute
/NXdetector_module/module_offset@offset_units-attribute
/NXdetector_module/slow_pixel_direction@offset_units-attribute
/NXtransformations/AXISNAME@offset_units-attribute
@populated_elements
/NXxpcs/entry/twotime/two_time_corr_func@populated_elements-attribute
@primary
/NXdetector/time_of_flight@primary-attribute
/NXdetector/x_pixel_offset@primary-attribute
/NXdetector/y_pixel_offset@primary-attribute
/NXdetector/z_pixel_offset@primary-attribute
@program_url
/NXsensor_scan/ENTRY/PROCESS/program@program_url-attribute
@q_indices
/NXcanSAS/ENTRY/DATA@Q_indices-attribute
@region_type
/NXregion@region_type-attribute
@resolutions
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude@zpos_indices-attribute
a
/NXcsg/a-group
a_1
/NXaberration_model_ceos/a_1-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1-group
a_2
/NXaberration_model_ceos/a_2-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2-group
a_3
/NXaberration_model_ceos/a_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3-group
a_4
/NXaberration_model_ceos/a_4-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4-group
a_6
/NXaberration_model_ceos/a_6-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6-group
abbe_number
/NXlens_opt/Abbe_number-field
aberration
/NXaberration_model/ABERRATION-group
aberration_correction
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction-group
abrasive_medium
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium-field
abrasive_medium_carrier
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/abrasive_medium_carrier-field
absorbed_beam
/NXxas/ENTRY/DATA/absorbed_beam-link
/NXxas/ENTRY/INSTRUMENT/absorbed_beam-group
absorbing_material
/NXcollimator/absorbing_material-field
/NXfermi_chopper/absorbing_material-field
absorption_cross_section
/NXattenuator/absorption_cross_section-field
ac_line_sync
/NXscanbox_em/ac_line_sync-field
acceleration_time
/NXpositioner/acceleration_time-field
acceptance_angle
/NXfiber/acceptance_angle-field
/NXpolarizer_opt/acceptance_angle-field
accepted_photon_beam_divergence
/NXbending_magnet/accepted_photon_beam_divergence-field
accepting_aperture
/NXcapillary/accepting_aperture-field
acquisition
/NXem_ebsd/ENTRY/experiment/acquisition-group
acquisition_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/acquisition_mode-field
/NXdetector/acquisition_mode-field
acquisition_program
/NXtransmission/ENTRY/acquisition_program-group
adc
/NXcircuit_board/ADC-group
additional_phase_information
/NXdispersive_material/ENTRY/sample/additional_phase_information-field
address
/NXapm/ENTRY/USER/address-field
/NXapm_composition_space_results/ENTRY/USER/address-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/address-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/address-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/address-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/address-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/address-field
/NXapm_paraprobe_results_selector/ENTRY/USER/address-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/address-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/address-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/address-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/address-field
/NXem/ENTRY/USER/address-field
/NXem_ebsd/ENTRY/USER/address-field
/NXmpes/ENTRY/USER/address-field
/NXms/ENTRY/USER/address-field
/NXms_score_results/ENTRY/USER/address-field
/NXopt/ENTRY/USER/address-field
/NXsensor_scan/ENTRY/USER/address-field
/NXtransmission/ENTRY/operator/address-field
/NXuser/address-field
adf
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf-group
adf_inner_half_angle
/NXimage_set_em_adf/PROCESS/adf_inner_half_angle-field
adf_outer_half_angle
/NXimage_set_em_adf/PROCESS/adf_outer_half_angle-field
aequatorial_angle
/NXsas/ENTRY/INSTRUMENT/DETECTOR/aequatorial_angle-field
/NXsas/ENTRY/SAMPLE/aequatorial_angle-field
/NXsastof/ENTRY/instrument/detector/aequatorial_angle-field
/NXsastof/ENTRY/sample/aequatorial_angle-field
affiliation
/NXapm/ENTRY/USER/affiliation-field
/NXapm_composition_space_results/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_selector/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/affiliation-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/affiliation-field
/NXem/ENTRY/USER/affiliation-field
/NXem_ebsd/ENTRY/USER/affiliation-field
/NXmpes/ENTRY/USER/affiliation-field
/NXms/ENTRY/USER/affiliation-field
/NXms_score_results/ENTRY/USER/affiliation-field
/NXopt/ENTRY/USER/affiliation-field
/NXsensor_scan/ENTRY/USER/affiliation-field
/NXtransmission/ENTRY/operator/affiliation-field
/NXuser/affiliation-field
alias
/NXaberration/alias-field
/NXapm/ENTRY/specimen/alias-field
alpha
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/alpha-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/alpha-field
/NXcg_alpha_complex/alpha-field
/NXxkappa/entry/sample/alpha-field
alpha_complex
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex-group
alpha_value_choice
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_value_choice-field
alpha_values
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/alpha_values-field
alternative
/NXopt/ENTRY/INSTRUMENT/sample_stage/alternative-field
amplifier_bias
/NXelectron_detector/amplifier_bias-field
amplifier_type
/NXelectron_detector/amplifier_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/amplifier_type-field
amplifier_voltage
/NXelectron_detector/amplifier_voltage-field
analyser
/NXarpes/ENTRY/INSTRUMENT/analyser-group
/NXindirecttof/entry/INSTRUMENT/analyser-group
/NXtas/entry/INSTRUMENT/analyser-group
analysis_chamber
/NXapm/ENTRY/atom_probe/analysis_chamber-group
/NXapm/ENTRY/atom_probe/control_software/analysis_chamber-group
analysis_description
/NXapm_paraprobe_config_clusterer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_distancer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_description-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_description-field
/NXapm_paraprobe_config_ranger/ENTRY/analysis_description-field
/NXapm_paraprobe_config_selector/ENTRY/analysis_description-field
/NXapm_paraprobe_config_spatstat/ENTRY/analysis_description-field
/NXapm_paraprobe_config_surfacer/ENTRY/analysis_description-field
/NXapm_paraprobe_config_tessellator/ENTRY/analysis_description-field
/NXapm_paraprobe_config_transcoder/ENTRY/analysis_description-field
/NXapm_paraprobe_results_clusterer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_distancer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_intersector/ENTRY/analysis_description-field
/NXapm_paraprobe_results_nanochem/ENTRY/analysis_description-field
/NXapm_paraprobe_results_ranger/ENTRY/analysis_description-field
/NXapm_paraprobe_results_selector/ENTRY/analysis_description-field
/NXapm_paraprobe_results_spatstat/ENTRY/analysis_description-field
/NXapm_paraprobe_results_surfacer/ENTRY/analysis_description-field
/NXapm_paraprobe_results_tessellator/ENTRY/analysis_description-field
/NXapm_paraprobe_results_transcoder/ENTRY/analysis_description-field
/NXms_score_config/ENTRY/analysis_description-field
/NXms_score_results/ENTRY/analysis_description-field
analysis_identifier
/NXapm_paraprobe_config_clusterer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_distancer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_nanochem/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_ranger/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_selector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_spatstat/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_surfacer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_tessellator/ENTRY/analysis_identifier-field
/NXapm_paraprobe_config_transcoder/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_distancer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_intersector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_ranger/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_selector/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_spatstat/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_surfacer/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/analysis_identifier-field
/NXapm_paraprobe_results_transcoder/ENTRY/analysis_identifier-field
/NXms_score_config/ENTRY/analysis_identifier-field
/NXms_score_results/ENTRY/analysis_identifier-field
analysis_program
/NXopt/ENTRY/derived_parameters/ANALYSIS_program-group
analyze_coprecipitation
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_coprecipitation-field
analyze_intersection
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_intersection-field
analyze_proximity
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/analyze_proximity-field
angle
/NXaberration/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/angle-field
angle_of_incidence
/NXopt/ENTRY/INSTRUMENT/angle_of_incidence-field
angles
/NXarpes/ENTRY/INSTRUMENT/analyser/angles-field
/NXgrating/angles-field
angular_calibration
/NXdetector/angular_calibration-field
/NXmpes/ENTRY/PROCESS/angular_calibration-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration-field
angular_calibration_applied
/NXdetector/angular_calibration_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/angular_calibration_applied-field
angular_dispersion
/NXbeam_path/GRATING/angular_dispersion-field
/NXbeam_path/MONOCHROMATOR/GRATING/angular_dispersion-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/angular_dispersion-field
angular_resolution
/NXelectronanalyser/angular_resolution-field
angular_spread
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/focussing_probes/angular_spread-field
aoi_range
/NXbeam_splitter/AOI_range-field
aperture
/NXbeam_path/ATTENUATOR/APERTURE-group
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE-group
/NXcollectioncolumn/APERTURE-group
/NXenergydispersion/APERTURE-group
/NXinstrument/APERTURE-group
/NXsnsevent/ENTRY/instrument/APERTURE-group
/NXsnshisto/ENTRY/instrument/APERTURE-group
/NXxraylens/aperture-field
aperture_em
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM-group
/NXebeam_column/APERTURE_EM-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/APERTURE_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/APERTURE_EM-group
/NXibeam_column/APERTURE_EM-group
aperture_number
/NXbeam_path/aperture_NUMBER-group
applied
/NXapm/ENTRY/atom_probe/REFLECTRON/applied-field
/NXcalibration/applied-field
/NXcorrector_cs/applied-field
/NXdistortion/applied-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/applied-field
/NXmpes/ENTRY/PROCESS/angular_calibration/applied-field
/NXmpes/ENTRY/PROCESS/energy_calibration/applied-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/applied-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/applied-field
/NXregistration/applied-field
apply
/NXms_score_config/ENTRY/solitary_unit_model/apply-field
apply_existent_ranging
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging-group
area
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/area-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/area-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/area-field
/NXcg_polygon_set/area-field
/NXcg_triangle_set/area-field
arrival_time_pairs
/NXapm/ENTRY/atom_probe/ion_impact_positions/arrival_time_pairs-field
aspect
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/aspect-field
assumed_composition_isotopes
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/assumed_composition_isotopes-field
atom
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom-field
/NXem_ebsd_crystal_structure_model/atom-field
atom_identifier
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_identifier-field
/NXem_ebsd_crystal_structure_model/atom_identifier-field
atom_occupancy
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_occupancy-field
/NXem_ebsd_crystal_structure_model/atom_occupancy-field
atom_positions
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/atom_positions-field
/NXem_ebsd_crystal_structure_model/atom_positions-field
atom_probe
/NXapm/ENTRY/atom_probe-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe-group
atom_types
/NXapm/ENTRY/specimen/atom_types-field
/NXdispersive_material/ENTRY/sample/atom_types-field
/NXem/ENTRY/sample/atom_types-field
/NXmpes/ENTRY/SAMPLE/atom_types-field
/NXopt/ENTRY/SAMPLE/atom_types-field
atomic_decomposition_rule
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule-group
attached_to
/NXsensor/attached_to-field
attenuation
/NXbeam_path/ATTENUATOR/attenuation-field
/NXfiber/attenuation-field
attenuator
/NXbeam_path/ATTENUATOR-group
/NXinstrument/ATTENUATOR-group
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR-group
/NXsnsevent/ENTRY/instrument/ATTENUATOR-group
/NXsnshisto/ENTRY/instrument/ATTENUATOR-group
/NXxrot/entry/instrument/attenuator-group
attenuator_transmission
/NXattenuator/attenuator_transmission-field
/NXbeam_path/ATTENUATOR/attenuator_transmission-field
/NXmx/ENTRY/INSTRUMENT/ATTENUATOR/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/ref_attenuator/attenuator_transmission-field
/NXtransmission/ENTRY/instrument/sample_attenuator/attenuator_transmission-field
/NXxrot/entry/instrument/attenuator/attenuator_transmission-field
author
/NXnote/author-field
/NXsnsevent/ENTRY/SNSHistoTool/author-field
/NXsnshisto/ENTRY/SNSHistoTool/author-field
average_value
/NXlog/average_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value-field
average_value_error
/NXlog/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_error-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_error-field
average_value_errors
/NXlog/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/LOG/average_value_errors-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/average_value_errors-field
axis_angle_convention
/NXem_ebsd/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
/NXem_ebsd_conventions/rotation_conventions/axis_angle_convention-field
/NXms/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
/NXms_score_results/ENTRY/conventions/rotation_conventions/axis_angle_convention-field
axis_energy
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_energy-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary/axis_energy-field
/NXspectrum_set/stack/axis_energy-field
/NXspectrum_set/summary/axis_energy-field
axis_energy_loss
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_energy_loss-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/axis_energy_loss-field
/NXspectrum_set_em_eels/stack/axis_energy_loss-field
/NXspectrum_set_em_eels/summary/axis_energy_loss-field
axis_image_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_image_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_image_identifier-field
/NXimage_set/stack/axis_image_identifier-field
/NXimage_set_em_adf/stack/axis_image_identifier-field
axis_mass_to_charge
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axis_photon_energy
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_photon_energy-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/axis_photon_energy-field
/NXspectrum_set_em_xray/stack/axis_photon_energy-field
/NXspectrum_set_em_xray/summary/axis_photon_energy-field
axis_x
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/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_x-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_x-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_x-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_x-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_x-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_x-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_x-field
/NXimage_set/stack/axis_x-field
/NXimage_set_em_adf/stack/axis_x-field
/NXimage_set_em_kikuchi/stack/axis_x-field
/NXspectrum_set/stack/axis_x-field
/NXspectrum_set_em_eels/stack/axis_x-field
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_x-field
/NXspectrum_set_em_xray/stack/axis_x-field
axis_y
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/axis_y-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/axis_y-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/axis_y-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_y-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/axis_y-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/axis_y-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/axis_y-field
/NXimage_set/stack/axis_y-field
/NXimage_set_em_adf/stack/axis_y-field
/NXimage_set_em_kikuchi/stack/axis_y-field
/NXspectrum_set/stack/axis_y-field
/NXspectrum_set_em_eels/stack/axis_y-field
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary/axis_y-field
/NXspectrum_set_em_xray/stack/axis_y-field
axis_z
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/axis_z-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/axis_z-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/axis_z-field
axisname
/NXbeam_path/TRANSFORMATIONS/AXISNAME-field
/NXdata/AXISNAME-field
/NXtransformations/AXISNAME-field
axisname_end
/NXtransformations/AXISNAME_end-field
axisname_increment_set
/NXtransformations/AXISNAME_increment_set-field
azimuthal
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azimuthal_angle
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/NXdetector/azimuthal_angle-field
/NXlauetof/entry/instrument/detector/azimuthal_angle-field
/NXreflections/azimuthal_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/azimuthal_angle-field
/NXsastof/ENTRY/instrument/detector/azimuthal_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/azimuthal_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/azimuthal_angle-field
/NXtofraw/entry/instrument/detector/azimuthal_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/azimuthal_angle-field
azimuthal_width
/NXspe/ENTRY/data/azimuthal_width-field
b
/NXcsg/b-group
b_2
/NXaberration_model_ceos/b_2-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2-group
b_4
/NXaberration_model_ceos/b_4-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4-group
background_correction
/NXem_ebsd/ENTRY/experiment/indexing/background_correction-group
background_mean
/NXreflections/background_mean-field
background_quantification
/NXapm/ENTRY/atom_probe/ranging/background_quantification-group
backside_roughness
/NXellipsometry/ENTRY/SAMPLE/backside_roughness-field
bandwidth
/NXbeam_path/SOURCE/bandwidth-field
/NXinsertion_device/bandwidth-field
base_temperature
/NXapm/ENTRY/atom_probe/stage_lab/base_temperature-field
beam
/NXapm/ENTRY/atom_probe/pulser/SOURCE/BEAM-group
/NXcontainer/beam-group
/NXebeam_column/BEAM-group
/NXibeam_column/BEAM-group
/NXinstrument/BEAM-group
/NXmpes/ENTRY/INSTRUMENT/BEAM-group
/NXmx/ENTRY/INSTRUMENT/BEAM-group
/NXpulser_apm/SOURCE/BEAM-group
/NXsample/BEAM-group
beam_1
/NXcxi_ptycho/entry_1/instrument_1/beam_1-group
beam_center_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_derived-field
beam_center_x
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_x-field
/NXdetector/beam_center_x-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_x-field
/NXsastof/ENTRY/instrument/detector/beam_center_x-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_x-field
/NXxrot/entry/instrument/detector/beam_center_x-field
beam_center_y
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/beam_center_y-field
/NXdetector/beam_center_y-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/beam_center_y-field
/NXsastof/ENTRY/instrument/detector/beam_center_y-field
/NXxpcs/entry/instrument/DETECTOR/beam_center_y-field
/NXxrot/entry/instrument/detector/beam_center_y-field
beam_current
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current-field
/NXoptical_system_em/beam_current-field
beam_current_description
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/beam_current_description-field
/NXoptical_system_em/beam_current_description-field
beam_path
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH-group
/NXopt/ENTRY/INSTRUMENT/BEAM_PATH-group
beam_position
/NXdisk_chopper/beam_position-field
beam_profile
/NXbeam_path/SOURCE/beam_profile-field
beam_shape
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_shape-field
beam_size_x
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_x-field
beam_size_y
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/beam_size_y-field
beam_splitter
/NXbeam_path/BEAM_SPLITTER-group
beam_stop
/NXinstrument/BEAM_STOP-group
beamline
/NXsnsevent/ENTRY/instrument/beamline-field
/NXsnshisto/ENTRY/instrument/beamline-field
beamline_distance
/NXelectrostatic_kicker/beamline_distance-field
/NXmagnetic_kicker/beamline_distance-field
/NXquadrupole_magnet/beamline_distance-field
/NXseparator/beamline_distance-field
/NXsolenoid_magnet/beamline_distance-field
/NXspin_rotator/beamline_distance-field
bend_angle_x
/NXguide/bend_angle_x-field
/NXmirror/bend_angle_x-field
bend_angle_y
/NXguide/bend_angle_y-field
/NXmirror/bend_angle_y-field
bending_magnet
/NXinstrument/BENDING_MAGNET-group
bending_radius
/NXbending_magnet/bending_radius-field
bias_voltage
/NXstage_lab/bias_voltage-field
bibtex
/NXcite/bibtex-field
binning
/NXem_ebsd/ENTRY/experiment/indexing/binning-group
bit_depth_readout
/NXdetector/bit_depth_readout-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/bit_depth_readout-field
bitdepth
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/bitdepth-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window/bitdepth-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles/bitdepth-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window/bitdepth-field
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window/bitdepth-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top/bitdepth-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window/bitdepth-field
/NXcs_filter_boolean_mask/bitdepth-field
/NXem_ebsd/ENTRY/correlation/PROCESS/bitdepth-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/bitdepth-field
blade_geometry
/NXaperture/BLADE_GEOMETRY-group
blade_spacing
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blade_thickness
/NXcollimator/blade_thickness-field
blaze_wavelength
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/NXtransmission/ENTRY/instrument/spectrometer/GRATING/blaze_wavelength-field
block
/NXregion/block-field
boundaries
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/NXcg_grid/boundaries-field
/NXms/ENTRY/ROI_SET/boundary/boundaries-field
/NXms_score_results/ENTRY/ROI_SET/boundary/boundaries-field
boundary
/NXms/ENTRY/ROI_SET/boundary-group
/NXms_score_results/ENTRY/ROI_SET/boundary-group
boundary_conditions
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/boundary_conditions-field
/NXcg_grid/boundary_conditions-field
/NXms/ENTRY/ROI_SET/boundary/boundary_conditions-field
/NXms_score_results/ENTRY/ROI_SET/boundary/boundary_conditions-field
bounding_box
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/NXcg_grid/bounding_box-group
/NXcg_polygon_set/bounding_box-group
/NXcg_triangle_set/bounding_box-group
/NXreflections/bounding_box-field
bragg_angle
/NXcrystal/bragg_angle-field
bright_field
/NXtomophase/entry/instrument/bright_field-group
brightness
/NXibeam_column/ion_source/brightness-field
buffer_chamber
/NXapm/ENTRY/atom_probe/buffer_chamber-group
/NXapm/ENTRY/atom_probe/control_software/buffer_chamber-group
bunch_distance
/NXsource/bunch_distance-field
bunch_length
/NXsource/bunch_length-field
bunch_pattern
/NXsource/bunch_pattern-group
c_1
/NXaberration_model_ceos/c_1-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1-group
c_1_0
/NXaberration_model/c_1_0-field
/NXaberration_model_nion/c_1_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0-group
c_1_2_a
/NXaberration_model/c_1_2_a-field
/NXaberration_model_nion/c_1_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a-group
c_1_2_b
/NXaberration_model/c_1_2_b-field
/NXaberration_model_nion/c_1_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b-group
c_2_1_a
/NXaberration_model/c_2_1_a-field
/NXaberration_model_nion/c_2_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a-group
c_2_1_b
/NXaberration_model/c_2_1_b-field
/NXaberration_model_nion/c_2_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b-group
c_2_3_a
/NXaberration_model/c_2_3_a-field
/NXaberration_model_nion/c_2_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a-group
c_2_3_b
/NXaberration_model/c_2_3_b-field
/NXaberration_model_nion/c_2_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b-group
c_3
/NXaberration_model_ceos/c_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3-group
c_3_0
/NXaberration_model/c_3_0-field
/NXaberration_model_nion/c_3_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0-group
c_3_2_a
/NXaberration_model/c_3_2_a-field
/NXaberration_model_nion/c_3_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a-group
c_3_2_b
/NXaberration_model/c_3_2_b-field
/NXaberration_model_nion/c_3_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b-group
c_3_4_a
/NXaberration_model/c_3_4_a-field
/NXaberration_model_nion/c_3_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a-group
c_3_4_b
/NXaberration_model/c_3_4_b-field
/NXaberration_model_nion/c_3_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b-group
c_4_1_a
/NXaberration_model_nion/c_4_1_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a-group
c_4_1_b
/NXaberration_model_nion/c_4_1_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b-group
c_4_3_a
/NXaberration_model_nion/c_4_3_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a-group
c_4_3_b
/NXaberration_model_nion/c_4_3_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b-group
c_4_5_a
/NXaberration_model_nion/c_4_5_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a-group
c_4_5_b
/NXaberration_model_nion/c_4_5_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b-group
c_5
/NXaberration_model_ceos/c_5-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5-group
c_5_0
/NXaberration_model/c_5_0-field
/NXaberration_model_nion/c_5_0-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0-group
c_5_2_a
/NXaberration_model_nion/c_5_2_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a-group
c_5_2_b
/NXaberration_model_nion/c_5_2_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b-group
c_5_4_a
/NXaberration_model_nion/c_5_4_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a-group
c_5_4_b
/NXaberration_model_nion/c_5_4_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b-group
c_5_6_a
/NXaberration_model_nion/c_5_6_a-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a-group
c_5_6_b
/NXaberration_model_nion/c_5_6_b-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b-group
calibrated_axis
/NXcalibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/angular_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/energy_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/momentum_calibration/calibrated_axis-field
/NXmpes/ENTRY/PROCESS/spatial_calibration/calibrated_axis-field
calibrated_tof
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/calibrated_tof-field
calibration
/NXem_ebsd/ENTRY/experiment/calibration-group
/NXopt/ENTRY/INSTRUMENT/calibration-group
calibration_data_link
/NXopt/ENTRY/INSTRUMENT/calibration/calibration_data_link-field
calibration_date
/NXdetector/calibration_date-field
calibration_method
/NXdetector/calibration_method-group
calibration_status
/NXopt/ENTRY/INSTRUMENT/calibration_status-field
calibration_style
/NXscanbox_em/calibration_style-field
calibration_time
/NXopt/ENTRY/INSTRUMENT/calibration/calibration_time-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/calibration_time-field
cameca_to_nexus
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus-group
camera_length
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/camera_length-field
/NXoptical_system_em/camera_length-field
candidates
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter/candidates-field
cap_surface_area
/NXcg_cylinder_set/cap_surface_area-field
capabilities
/NXapm/ENTRY/atom_probe/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/capabilities-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
/NXem/ENTRY/em_lab/FABRICATION/capabilities-field
/NXem/ENTRY/em_lab/stage_lab/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/capabilities-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/capabilities-field
capability
/NXfabrication/capability-field
capillary
/NXinstrument/CAPILLARY-group
cardinality
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/cardinality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/cardinality-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/cardinality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/cardinality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/cardinality-field
/NXcg_cylinder_set/cardinality-field
/NXcg_ellipsoid_set/cardinality-field
/NXcg_grid/cardinality-field
/NXcg_hexahedron_set/cardinality-field
/NXcg_parallelogram_set/cardinality-field
/NXcg_point_set/cardinality-field
/NXcg_polygon_set/cardinality-field
/NXcg_polyhedron_set/cardinality-field
/NXcg_polyline_set/cardinality-field
/NXcg_sphere_set/cardinality-field
/NXcg_tetrahedron_set/cardinality-field
/NXcg_triangle_set/cardinality-field
/NXcg_unit_normal_set/cardinality-field
/NXgraph_node_set/cardinality-field
/NXms_feature_set/cardinality-field
/NXms_score_results/ENTRY/ROI_SET/grid/cardinality-field
/NXsimilarity_grouping/cardinality-field
categorical_label
/NXclustering/categorical_label-field
/NXsimilarity_grouping/categorical_label-field
cdeform_field
/NXdistortion/cdeform_field-field
cell_dimensions
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/cell_dimensions-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/cell_dimensions-field
/NXcg_grid/cell_dimensions-field
/NXms_score_results/ENTRY/ROI_SET/grid/cell_dimensions-field
cell_size
/NXms_score_config/ENTRY/initial_microstructure/cell_size-field
center
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/center-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/center-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/center-field
/NXcg_cylinder_set/center-field
/NXcg_ellipsoid_set/center-field
/NXcg_hexahedron_set/center-field
/NXcg_parallelogram_set/center-field
/NXcg_polygon_set/center-field
/NXcg_polyhedron_set/center-field
/NXcg_sphere_set/center-field
/NXcg_tetrahedron_set/center-field
/NXcg_triangle_set/center-field
/NXscanbox_em/center-field
center_energy
/NXenergydispersion/center_energy-field
central_stop_diameter
/NXfresnel_zone_plate/central_stop_diameter-field
central_stop_material
/NXfresnel_zone_plate/central_stop_material-field
central_stop_thickness
/NXfresnel_zone_plate/central_stop_thickness-field
ceos
/NXcorrector_cs/ZEMLIN_TABLEAU/PROCESS/ceos-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos-group
cg_cylinder_set
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET-group
/NXcg_roi_set/CG_CYLINDER_SET-group
/NXspatial_filter/CG_CYLINDER_SET-group
cg_ellipsoid_set
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET-group
/NXcg_roi_set/CG_ELLIPSOID_SET-group
/NXspatial_filter/CG_ELLIPSOID_SET-group
cg_geodesic_mesh
/NXem_ebsd/ENTRY/simulation/CG_GEODESIC_MESH-group
cg_grid
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID-group
cg_half_edge_data_structure
/NXcg_triangulated_surface_mesh/CG_HALF_EDGE_DATA_STRUCTURE-group
cg_hexahedron_set
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET-group
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cg_sphere_set
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cg_triangle_set
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chamber
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clad_material
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cladding
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cleaning_step
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clear_aperture
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cluster_statistics
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clustering_composition_space
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clustering_real_space
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coating
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coating_diameter
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coating_material
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collection
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comment
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company
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component
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composition
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composition_product
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composition_profiling
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computation_method
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concentration
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control
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convention
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conventions
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coordinate_system
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coprecipitation_analysis
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core
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core_index_of_refraction
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core_material
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core_sample_indices
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corrector_cs
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correlation
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crate
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critical_energy
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cryocoolant
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cryostat_temperature
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crystal
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cs_gpu
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csg
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cue_timestamp_zero
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cumulated
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cumulated_normalized
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/NXsource/current-field
current_sensor
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current_set
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current_set_feature_to_cluster
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current_to_next_link
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current_to_next_link_type
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current_working_directory
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curvature
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curvature_horizontal
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curvature_radius_face
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curvature_vertical
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cut_angle
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cw
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cw_power
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cylinder_orientation
/NXxraylens/cylinder_orientation-group
cylinders
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cylindrical
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cylindrical_geometry
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cylindrical_orientation_angle
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d
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d_4
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d_spacing
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dac
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dark_field
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daslogs
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data
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data_counts
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data_errors
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data_file
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data_identifier
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data_offset
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data_origin
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data_scaling_factor
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data_size
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data_software
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data_stride
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data_type
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data_x_time_of_flight
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data_x_y
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data_y_time_of_flight
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dataset
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/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset-group
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset-group
dataset_name
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/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/dataset_name-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/dataset_name-field
dataset_name_distances
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_edge_distances/dataset_name_distances-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances/dataset_name_distances-field
dataset_name_facet_indices
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_indices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_facet_indices-field
dataset_name_facet_normals
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_facet_normals-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_normals-field
dataset_name_facet_vertices
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_facet_vertices-field
dataset_name_mass_to_charge
/NXapm_input_reconstruction/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_mass_to_charge-field
dataset_name_reconstruction
/NXapm_input_reconstruction/dataset_name_reconstruction-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/dataset_name_reconstruction-field
dataset_name_vertices
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/dataset_name_vertices-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/dataset_name_vertices-field
date
/NXcanSAS/ENTRY/PROCESS/date-field
/NXdispersive_material/ENTRY/date-field
/NXnote/date-field
/NXprocess/date-field
/NXsnsevent/ENTRY/SNSHistoTool/date-field
/NXsnshisto/ENTRY/SNSHistoTool/date-field
/NXtomoproc/entry/reconstruction/date-field
/NXxasproc/ENTRY/XAS_data_reduction/date-field
dbscan
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dbscan-group
dbscanid
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID-group
dead_time
/NXdetector/dead_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/dead_time-field
decorating_iontypes_filter
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/decorating_iontypes_filter-group
decorator_multiplicity
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/decorator_multiplicity-field
definition
/NXapm/ENTRY/definition-field
/NXapm_composition_space_results/ENTRY/definition-field
/NXapm_paraprobe_config_clusterer/ENTRY/definition-field
/NXapm_paraprobe_config_distancer/ENTRY/definition-field
/NXapm_paraprobe_config_intersector/ENTRY/definition-field
/NXapm_paraprobe_config_nanochem/ENTRY/definition-field
/NXapm_paraprobe_config_ranger/ENTRY/definition-field
/NXapm_paraprobe_config_selector/ENTRY/definition-field
/NXapm_paraprobe_config_spatstat/ENTRY/definition-field
/NXapm_paraprobe_config_surfacer/ENTRY/definition-field
/NXapm_paraprobe_config_tessellator/ENTRY/definition-field
/NXapm_paraprobe_config_transcoder/ENTRY/definition-field
/NXapm_paraprobe_results_clusterer/ENTRY/definition-field
/NXapm_paraprobe_results_distancer/ENTRY/definition-field
/NXapm_paraprobe_results_intersector/ENTRY/definition-field
/NXapm_paraprobe_results_nanochem/ENTRY/definition-field
/NXapm_paraprobe_results_ranger/ENTRY/definition-field
/NXapm_paraprobe_results_selector/ENTRY/definition-field
/NXapm_paraprobe_results_spatstat/ENTRY/definition-field
/NXapm_paraprobe_results_surfacer/ENTRY/definition-field
/NXapm_paraprobe_results_tessellator/ENTRY/definition-field
/NXapm_paraprobe_results_transcoder/ENTRY/definition-field
/NXarchive/entry/definition-field
/NXarpes/ENTRY/definition-field
/NXcanSAS/ENTRY/definition-field
/NXcxi_ptycho/entry_1/definition-field
/NXdirecttof/entry/definition-field
/NXdispersive_material/ENTRY/definition-field
/NXellipsometry/ENTRY/definition-field
/NXem/ENTRY/definition-field
/NXem_ebsd/ENTRY/definition-field
/NXentry/definition-field
/NXfluo/entry/definition-field
/NXindirecttof/entry/definition-field
/NXiqproc/ENTRY/definition-field
/NXiv_temp/ENTRY/definition-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/definition-field
/NXlab_sample_mounting/ENTRY/definition-field
/NXlauetof/entry/definition-field
/NXmonopd/entry/definition-field
/NXmpes/ENTRY/definition-field
/NXms/ENTRY/definition-field
/NXms_score_config/ENTRY/definition-field
/NXms_score_results/ENTRY/definition-field
/NXmx/ENTRY/definition-field
/NXopt/ENTRY/definition-field
/NXrefscan/entry/definition-field
/NXreftof/entry/definition-field
/NXsas/ENTRY/definition-field
/NXsastof/ENTRY/definition-field
/NXscan/ENTRY/definition-field
/NXsensor_scan/ENTRY/definition-field
/NXsnsevent/ENTRY/definition-field
/NXsnshisto/ENTRY/definition-field
/NXspe/ENTRY/definition-field
/NXsqom/ENTRY/definition-field
/NXstxm/ENTRY/definition-field
/NXsubentry/definition-field
/NXtas/entry/definition-field
/NXtofnpd/entry/definition-field
/NXtofraw/entry/definition-field
/NXtofsingle/entry/definition-field
/NXtomo/entry/definition-field
/NXtomophase/entry/definition-field
/NXtomoproc/entry/definition-field
/NXtransmission/ENTRY/definition-field
/NXxas/ENTRY/definition-field
/NXxasproc/ENTRY/definition-field
/NXxbase/entry/definition-field
/NXxeuler/entry/definition-field
/NXxkappa/entry/definition-field
/NXxlaue/entry/definition-field
/NXxlaueplate/entry/definition-field
/NXxnb/entry/definition-field
/NXxpcs/entry/definition-field
/NXxrot/entry/definition-field
definition_local
/NXentry/definition_local-field
/NXsubentry/definition_local-field
deflection_angle
/NXbeam_splitter/deflection_angle-field
/NXgrating/deflection_angle-field
deflector
/NXcollectioncolumn/DEFLECTOR-group
/NXelectronanalyser/DEFLECTOR-group
/NXenergydispersion/DEFLECTOR-group
/NXspindispersion/DEFLECTOR-group
defocus
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/defocus-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/defocus-field
/NXoptical_system_em/defocus-field
deformation_gradient
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/deformation_gradient-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/deformation_gradient-group
deformed_grain_identifier
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/deformed_grain_identifier-field
defragment_cell_cache
/NXms_score_config/ENTRY/numerics/defragment_cell_cache-field
defragment_x
/NXms_score_config/ENTRY/numerics/defragment_x-field
delay
/NXdisk_chopper/delay-field
delay_difference
/NXxpcs/entry/data/delay_difference-field
delocalization
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION-group
delta_time
/NXaberration/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/delta_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/delta_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/delta_time-field
density
/NXcontainer/density-field
/NXcrystal/density-field
/NXem/ENTRY/sample/density-field
/NXfilter/density-field
/NXsample/density-field
/NXsample_component/density-field
depends_on
/NXaperture/depends_on-field
/NXattenuator/depends_on-field
/NXbeam/depends_on-field
/NXbeam_path/SOURCE/depends_on-field
/NXbeam_path/depends_on-field
/NXbeam_path/window_NUMBER/depends_on-field
/NXbeam_stop/depends_on-field
/NXbending_magnet/depends_on-field
/NXcapillary/depends_on-field
/NXcollectioncolumn/depends_on-field
/NXcollimator/depends_on-field
/NXcrystal/depends_on-field
/NXdeflector/depends_on-field
/NXdetector/depends_on-field
/NXdetector_module/depends_on-field
/NXdisk_chopper/depends_on-field
/NXelectronanalyser/depends_on-field
/NXenvironment/depends_on-field
/NXfermi_chopper/depends_on-field
/NXfilter/depends_on-field
/NXflipper/depends_on-field
/NXfresnel_zone_plate/depends_on-field
/NXgrating/depends_on-field
/NXguide/depends_on-field
/NXinsertion_device/depends_on-field
/NXlens_em/depends_on-field
/NXmanipulator/depends_on-field
/NXmirror/depends_on-field
/NXmoderator/depends_on-field
/NXmonitor/depends_on-field
/NXmonochromator/depends_on-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/depends_on-field
/NXmx/ENTRY/SAMPLE/depends_on-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/depends_on-field
/NXpinhole/depends_on-field
/NXpolarizer/depends_on-field
/NXpositioner/depends_on-field
/NXquadric/depends_on-field
/NXregistration/depends_on-field
/NXsample/depends_on-field
/NXsensor/depends_on-field
/NXslit/depends_on-field
/NXsource/depends_on-field
/NXspindispersion/depends_on-field
/NXvelocity_selector/depends_on-field
/NXxraylens/depends_on-field
depolarization
/NXopt/ENTRY/derived_parameters/depolarization-field
depth
/NXgrating/depth-field
derived_parameters
/NXopt/ENTRY/derived_parameters-group
description
/NXaperture/description-field
/NXaperture_em/description-field
/NXapm/ENTRY/atom_probe/REFLECTRON/description-field
/NXapm/ENTRY/atom_probe/analysis_chamber/description-field
/NXapm/ENTRY/atom_probe/buffer_chamber/description-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/description-field
/NXapm/ENTRY/sample/description-field
/NXapm/ENTRY/specimen/description-field
/NXapm_composition_space_results/ENTRY/description-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXarchive/entry/instrument/description-field
/NXarchive/entry/sample/description-field
/NXbeam_stop/description-field
/NXcalibration/description-field
/NXcanSAS/ENTRY/PROCESS/description-field
/NXchamber/description-field
/NXcite/description-field
/NXcontainer/description-field
/NXcorrector_cs/ZEMLIN_TABLEAU/description-field
/NXcorrector_cs/description-field
/NXcs_profiling_event/description-field
/NXdeflector/description-field
/NXdetector/description-field
/NXdispersion_repeated_parameter/description-field
/NXdispersion_single_parameter/description-field
/NXdistortion/description-field
/NXebeam_column/electron_source/description-field
/NXelectronanalyser/description-field
/NXelectrostatic_kicker/description-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/description-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/description-field
/NXem/ENTRY/em_lab/stage_lab/description-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/description-field
/NXem/ENTRY/sample/description-field
/NXem_ebsd/ENTRY/correlation/PROCESS/description-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/description-field
/NXenvironment/description-field
/NXfiber/description-field
/NXfilter/description-field
/NXgeometry/description-field
/NXguide/description-field
/NXibeam_column/ion_source/description-field
/NXlens_em/description-field
/NXlog/description-field
/NXmagnetic_kicker/description-field
/NXmanipulator/description-field
/NXmirror/description-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/description-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/description-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/description-field
/NXnote/description-field
/NXpid/description-field
/NXpositioner/description-field
/NXquadrupole_magnet/description-field
/NXreflectron/description-field
/NXregistration/description-field
/NXsample/description-field
/NXsample_component/description-field
/NXseparator/description-field
/NXsnsevent/ENTRY/DASlogs/LOG/description-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/description-field
/NXsnsevent/ENTRY/SNSHistoTool/description-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsnshisto/ENTRY/DASlogs/LOG/description-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/description-field
/NXsnshisto/ENTRY/SNSHistoTool/description-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/description-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/description-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/description-field
/NXsolenoid_magnet/description-field
/NXspin_rotator/description-field
/NXstage_lab/description-field
/NXxpcs/entry/instrument/DETECTOR/description-field
descriptor
/NXem_ebsd/ENTRY/correlation/region_of_interest/descriptor-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/descriptor-field
design
/NXapm/ENTRY/atom_probe/getter_pump/design-field
/NXapm/ENTRY/atom_probe/roughening_pump/design-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/design-field
/NXem/ENTRY/em_lab/stage_lab/design-field
/NXpump/design-field
/NXstage_lab/design-field
det_module
/NXreflections/det_module-field
details
/NXcanSAS/ENTRY/SAMPLE/details-field
detection_angle
/NXopt/ENTRY/INSTRUMENT/detection_angle-field
detection_gas_path
/NXdetector/detection_gas_path-field
detection_rate
/NXapm/ENTRY/atom_probe/specimen_monitoring/detection_rate-field
detector
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR-group
/NXelectronanalyser/DETECTOR-group
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/DETECTOR-group
/NXem/ENTRY/em_lab/DETECTOR-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/DETECTOR-group
/NXinstrument/DETECTOR-group
/NXlauetof/entry/instrument/detector-group
/NXmonopd/entry/INSTRUMENT/DETECTOR-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR-group
/NXrefscan/entry/instrument/DETECTOR-group
/NXreftof/entry/instrument/detector-group
/NXsas/ENTRY/INSTRUMENT/DETECTOR-group
/NXsastof/ENTRY/instrument/detector-group
/NXscan/ENTRY/INSTRUMENT/DETECTOR-group
/NXsnsevent/ENTRY/instrument/DETECTOR-group
/NXsnshisto/ENTRY/instrument/DETECTOR-group
/NXstxm/ENTRY/INSTRUMENT/DETECTOR-group
/NXtas/entry/INSTRUMENT/DETECTOR-group
/NXtofnpd/entry/INSTRUMENT/detector-group
/NXtofraw/entry/instrument/detector-group
/NXtofsingle/entry/INSTRUMENT/detector-group
/NXtomo/entry/instrument/detector-group
/NXtransmission/ENTRY/instrument/DETECTOR-group
/NXxbase/entry/instrument/detector-group
/NXxeuler/entry/instrument/detector-group
/NXxkappa/entry/instrument/detector-group
/NXxlaueplate/entry/instrument/detector-group
/NXxnb/entry/instrument/detector-group
/NXxpcs/entry/instrument/DETECTOR-group
/NXxrot/entry/instrument/detector-group
detector_1
/NXcxi_ptycho/entry_1/instrument_1/detector_1-group
detector_faces
/NXoff_geometry/detector_faces-field
detector_group
/NXinstrument/DETECTOR_GROUP-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP-group
detector_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/detector_identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/detector_identifier-field
/NXimage_set/PROCESS/detector_identifier-field
/NXspectrum_set/PROCESS/detector_identifier-field
detector_module
/NXdetector/DETECTOR_MODULE-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE-group
detector_number
/NXcylindrical_geometry/detector_number-field
/NXdetector/detector_number-field
/NXtofnpd/entry/INSTRUMENT/detector/detector_number-field
/NXtofnpd/entry/data/detector_number-link
/NXtofraw/entry/data/detector_number-link
/NXtofraw/entry/instrument/detector/detector_number-field
detector_readout_time
/NXdetector/detector_readout_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/detector_readout_time-field
detector_reference_frame
/NXem_ebsd/ENTRY/conventions/detector_reference_frame-group
/NXem_ebsd_conventions/detector_reference_frame-group
detector_type
/NXelectron_detector/detector_type-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/detector_type-field
detector_voltage
/NXelectron_detector/detector_voltage-field
diameter
/NXdetector/diameter-field
/NXenergydispersion/diameter-field
/NXpinhole/diameter-field
/NXwaveplate/diameter-field
/NXxlaueplate/entry/instrument/detector/diameter-field
dielectric_function
/NXdispersion_table/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/dielectric_function-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/dielectric_function-field
diffraction_order
/NXgrating/diffraction_order-field
diffractometer
/NXinstrument/DIFFRACTOMETER-group
dimensionality
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/dimensionality-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/dimensionality-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/dimensionality-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/dimensionality-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/dimensionality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/dimensionality-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/dimensionality-field
/NXcg_alpha_complex/dimensionality-field
/NXcg_cylinder_set/dimensionality-field
/NXcg_ellipsoid_set/dimensionality-field
/NXcg_face_list_data_structure/dimensionality-field
/NXcg_grid/dimensionality-field
/NXcg_half_edge_data_structure/dimensionality-field
/NXcg_hexahedron_set/dimensionality-field
/NXcg_parallelogram_set/dimensionality-field
/NXcg_point_set/dimensionality-field
/NXcg_polygon_set/dimensionality-field
/NXcg_polyhedron_set/dimensionality-field
/NXcg_polyline_set/dimensionality-field
/NXcg_sphere_set/dimensionality-field
/NXcg_tetrahedron_set/dimensionality-field
/NXcg_triangle_set/dimensionality-field
/NXcg_unit_normal_set/dimensionality-field
/NXgraph_node_set/dimensionality-field
/NXisocontour/dimensionality-field
/NXms_feature_set/dimensionality-field
/NXms_score_results/ENTRY/ROI_SET/grid/dimensionality-field
direction
/NXbeam/TRANSFORMATIONS/DIRECTION-field
/NXshape/direction-field
direction_model
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/direction_model-field
directionality
/NXgraph_edge_set/directionality-field
disk_chopper
/NXbeam_path/DISK_CHOPPER-group
/NXdirecttof/entry/INSTRUMENT/disk_chopper-group
/NXinstrument/DISK_CHOPPER-group
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER-group
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER-group
dislocation_density
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_ensemble/dislocation_density-field
dispersion
/NXfiber/dispersion-field
dispersion_function
/NXdispersion/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION-group
dispersion_repeated_parameter
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER-group
dispersion_single_parameter
/NXdispersion_function/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER-group
dispersion_table
/NXdispersion/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE-group
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE-group
dispersion_type
/NXdispersive_material/ENTRY/dispersion_type-field
/NXfiber/dispersion_type-field
dispersion_x
/NXdispersive_material/ENTRY/dispersion_x-group
dispersion_y
/NXdispersive_material/ENTRY/dispersion_y-group
dispersion_z
/NXdispersive_material/ENTRY/dispersion_z-group
dispersoid_drag_model
/NXms_score_config/ENTRY/dispersoid_drag_model-group
distance
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/distance-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/knn/distance-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/rdf/distance-field
/NXattenuator/distance-field
/NXbeam/distance-field
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/distance-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/distance-field
/NXdetector/distance-field
/NXdisk_chopper/distance-field
/NXfermi_chopper/distance-field
/NXindirecttof/entry/INSTRUMENT/analyser/distance-field
/NXlauetof/entry/instrument/detector/distance-field
/NXmoderator/distance-field
/NXmonitor/distance-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/distance-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXreftof/entry/instrument/chopper/distance-field
/NXreftof/entry/instrument/detector/distance-field
/NXsample/distance-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/distance-field
/NXsastof/ENTRY/instrument/detector/distance-field
/NXsnsevent/ENTRY/MONITOR/distance-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/distance-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnsevent/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnsevent/ENTRY/instrument/moderator/distance-field
/NXsnshisto/ENTRY/MONITOR/distance-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/ATTENUATOR/distance-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/distance-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation/distance-field
/NXsnshisto/ENTRY/instrument/DISK_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER/distance-field
/NXsnshisto/ENTRY/instrument/moderator/distance-field
/NXsource/distance-field
/NXspe/ENTRY/data/distance-field
/NXtofnpd/entry/INSTRUMENT/detector/distance-field
/NXtofnpd/entry/MONITOR/distance-field
/NXtofraw/entry/MONITOR/distance-field
/NXtofraw/entry/instrument/detector/distance-field
/NXtofsingle/entry/INSTRUMENT/detector/distance-field
/NXtofsingle/entry/MONITOR/distance-field
/NXtomo/entry/instrument/detector/distance-field
/NXtomophase/entry/instrument/sample/distance-field
/NXxbase/entry/instrument/detector/distance-field
/NXxbase/entry/sample/distance-field
/NXxpcs/entry/instrument/DETECTOR/distance-field
distance_derived
/NXmx/ENTRY/INSTRUMENT/DETECTOR/distance_derived-field
distance_to_detector
/NXbeam_stop/distance_to_detector-field
distances
/NXtranslation/distances-field
distancing_model
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/distancing_model-field
distribution
/NXmonochromator/distribution-group
/NXsource/distribution-group
/NXxlaue/entry/instrument/source/distribution-group
divergence
/NXbeam_path/SOURCE/divergence-field
divergence_x
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divergence_x_minus
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divergence_x_plus
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divergence_y
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divergence_y_minus
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divergence_y_plus
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doi
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domain_identifier
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domain_size
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downsampled
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dql
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dqw
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drain_current
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dspacing
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duration
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duty_cycle
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dynamic_phi_list
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dynamic_q_list
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dynamic_roi_map
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ebeam_column
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ebeam_deflector
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ebsd
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edge_contact
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edge_distance
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edge_handling_method
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edge_identifier
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edge_identifier_offset
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/NXcg_face_list_data_structure/edge_identifier_offset-field
edge_length
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/edge_length-field
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edge_normal
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/NXcg_polyhedron_set/edge_normal-group
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edge_of_the_dataset
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edge_threshold
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edges
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edges_are_unique
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eels
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ef
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efficiency
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ei
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elapsed_time
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electric_field
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electrical_conductivity
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electron_source
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electronanalyser
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element_whitelist
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ellipsometer_type
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em_ebsd_crystal_structure_model
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email
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/NXms_score_results/ENTRY/USER/email-field
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/NXsensor_scan/ENTRY/USER/email-field
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/NXuser/email-field
embedding_medium
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emittance_x
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emittance_y
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emitter_material
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emitter_type
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/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/emitter_type-field
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en
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/NXtas/entry/SAMPLE/en-field
end_time
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/NXtomo/entry/end_time-field
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end_time_estimated
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endnote
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energies
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energy
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/NXdirecttof/entry/INSTRUMENT/fermi_chopper/energy-field
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/NXxasproc/ENTRY/DATA/energy-field
energy_calibration
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energy_dispersion
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energy_error
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energy_errors
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energy_identifier
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energy_interval
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energy_max
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energy_min
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energy_resolution
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energy_scan_mode
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energy_transfer
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energy_unit
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energydispersion
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entering
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entrance_slit
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entrance_slit_shape
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entrance_slit_size
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entry
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/NXapm_paraprobe_config_clusterer/ENTRY-group
/NXapm_paraprobe_config_distancer/ENTRY-group
/NXapm_paraprobe_config_intersector/ENTRY-group
/NXapm_paraprobe_config_nanochem/ENTRY-group
/NXapm_paraprobe_config_ranger/ENTRY-group
/NXapm_paraprobe_config_selector/ENTRY-group
/NXapm_paraprobe_config_spatstat/ENTRY-group
/NXapm_paraprobe_config_surfacer/ENTRY-group
/NXapm_paraprobe_config_tessellator/ENTRY-group
/NXapm_paraprobe_config_transcoder/ENTRY-group
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error
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errors
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estimated_field_at_the_apex
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euler
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euler_angle_convention
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evaporation_id_filter
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evaporation_id_included
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even_layer_density
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even_layer_material
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event_data
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event_data_em
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/NXevent_data_em_set/EVENT_DATA_EM-group
event_id
/NXevent_data/event_id-field
event_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/event_identifier-field
/NXevent_data_em/event_identifier-field
event_index
/NXevent_data/event_index-field
/NXsnsevent/ENTRY/EVENT_DATA/event_index-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_index-field
event_pixel_id
/NXsnsevent/ENTRY/EVENT_DATA/event_pixel_id-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_pixel_id-field
event_time_of_flight
/NXsnsevent/ENTRY/EVENT_DATA/event_time_of_flight-link
/NXsnsevent/ENTRY/instrument/DETECTOR/event_time_of_flight-field
event_time_offset
/NXevent_data/event_time_offset-field
event_time_zero
/NXevent_data/event_time_zero-field
event_type
/NXem/ENTRY/measurement/EVENT_DATA_EM/event_type-field
/NXevent_data_em/event_type-field
evolution
/NXms/ENTRY/ROI_SET/snapshot_set/evolution-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution-group
excitation_wavelength
/NXbeam_path/SOURCE/excitation_wavelength-field
exit_slit
/NXmonochromator/exit_slit-group
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/exit_slit-group
experiment
/NXem_ebsd/ENTRY/experiment-group
experiment_description
/NXapm/ENTRY/experiment_description-field
/NXarchive/entry/experiment_description-field
/NXellipsometry/ENTRY/experiment_description-field
/NXem/ENTRY/experiment_description-field
/NXentry/experiment_description-field
/NXopt/ENTRY/experiment_description-field
/NXsensor_scan/ENTRY/experiment_description-field
/NXsubentry/experiment_description-field
/NXtransmission/ENTRY/experiment_description-field
experiment_documentation
/NXapm/ENTRY/experiment_documentation-group
/NXem/ENTRY/experiment_documentation-group
/NXentry/experiment_documentation-group
/NXsubentry/experiment_documentation-group
experiment_identifier
/NXapm/ENTRY/experiment_identifier-field
/NXarchive/entry/experiment_identifier-field
/NXem/ENTRY/experiment_identifier-field
/NXentry/experiment_identifier-field
/NXopt/ENTRY/experiment_identifier-field
/NXsensor_scan/ENTRY/experiment_identifier-field
/NXsnsevent/ENTRY/experiment_identifier-field
/NXsnshisto/ENTRY/experiment_identifier-field
/NXsubentry/experiment_identifier-field
/NXtransmission/ENTRY/experiment_identifier-field
experiment_or_simulation
/NXms/ENTRY/experiment_or_simulation-field
/NXms_score_results/ENTRY/experiment_or_simulation-field
experiment_type
/NXellipsometry/ENTRY/experiment_type-field
/NXopt/ENTRY/experiment_type-field
experiments
/NXreflections/experiments-field
exposure_time
/NXcorrector_cs/ZEMLIN_TABLEAU/exposure_time-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/exposure_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/exposure_time-field
extent
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/extent-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/extent-field
/NXbeam/extent-field
/NXcg_grid/extent-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/extent-field
/NXms_score_results/ENTRY/ROI_SET/grid/extent-field
/NXxpcs/entry/instrument/incident_beam/extent-field
external
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external-group
external_adc
/NXsample/external_ADC-group
external_dac
/NXsample/external_DAC-field
external_field_brief
/NXsensor/external_field_brief-field
external_field_full
/NXsensor/external_field_full-group
external_material
/NXguide/external_material-field
/NXmirror/external_material-field
extinction_ratio
/NXpolarizer_opt/extinction_ratio-field
extractor_current
/NXcollectioncolumn/extractor_current-field
extractor_voltage
/NXcollectioncolumn/extractor_voltage-field
fabrication
/NXaperture_em/FABRICATION-group
/NXapm/ENTRY/atom_probe/FABRICATION-group
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION-group
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION-group
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION-group
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION-group
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION-group
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION-group
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXchamber/FABRICATION-group
/NXcorrector_cs/FABRICATION-group
/NXcs_cpu/FABRICATION-group
/NXcs_gpu/FABRICATION-group
/NXcs_io_obj/FABRICATION-group
/NXdetector/FABRICATION-group
/NXebeam_column/FABRICATION-group
/NXebeam_column/electron_source/FABRICATION-group
/NXem/ENTRY/em_lab/DETECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION-group
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/FABRICATION-group
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR/FABRICATION-group
/NXem/ENTRY/em_lab/stage_lab/FABRICATION-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION-group
/NXfresnel_zone_plate/fabrication-field
/NXibeam_column/FABRICATION-group
/NXlens_em/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION-group
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION-group
/NXpulser_apm/FABRICATION-group
/NXpulser_apm/SOURCE/FABRICATION-group
/NXpump/FABRICATION-group
/NXreflectron/FABRICATION-group
/NXscanbox_em/FABRICATION-group
/NXstage_lab/FABRICATION-group
face_area
/NXcg_hexahedron_set/face_area-field
/NXcg_polyhedron_set/face_area-field
/NXcg_tetrahedron_set/face_area-field
face_half_edge
/NXcg_half_edge_data_structure/face_half_edge-field
face_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/face_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/face_identifier-field
/NXcg_face_list_data_structure/face_identifier-field
face_identifier_offset
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/face_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/face_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/face_identifier_offset-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/face_identifier_offset-field
/NXcg_face_list_data_structure/face_identifier_offset-field
/NXcg_half_edge_data_structure/face_identifier_offset-field
face_normal
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal-group
/NXcg_hexahedron_set/face_normal-group
/NXcg_parallelogram_set/face_normal-group
/NXcg_polygon_set/face_normal-group
/NXcg_polyhedron_set/face_normal-group
/NXcg_tetrahedron_set/face_normal-group
/NXcg_triangle_set/face_normal-group
face_normals
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/face_normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/face_normals-field
faces
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/faces-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/faces-field
/NXcg_face_list_data_structure/faces-field
/NXoff_geometry/faces-field
faces_are_unique
/NXcg_face_list_data_structure/faces_are_unique-field
facility_user_id
/NXarchive/entry/user/facility_user_id-field
/NXsnsevent/ENTRY/USER/facility_user_id-field
/NXsnshisto/ENTRY/USER/facility_user_id-field
/NXuser/facility_user_id-field
fast_axes
/NXelectronanalyser/fast_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/fast_axes-field
fast_pixel_direction
/NXdetector_module/fast_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/fast_pixel_direction-field
fax_number
/NXuser/fax_number-field
feature
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE-group
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE-group
feature_identifier
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/feature_identifier-field
/NXsimilarity_grouping/statistics/feature_identifier-field
feature_member_count
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/feature_member_count-field
/NXsimilarity_grouping/statistics/feature_member_count-field
feature_mesh
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh-group
feature_type
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/feature_type-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/feature_type-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type-field
feature_type_dict_keyword
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type_dict_keyword-field
feature_type_dict_value
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/feature_type_dict_value-field
features
/NXentry/features-field
fermi_chopper
/NXdirecttof/entry/INSTRUMENT/fermi_chopper-group
/NXinstrument/FERMI_CHOPPER-group
/NXsnshisto/ENTRY/instrument/FERMI_CHOPPER-group
/NXspe/ENTRY/INSTRUMENT/FERMI_CHOPPER-group
fiber
/NXbeam_path/FIBER-group
field_aperture
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/field_aperture-group
field_of_view
/NXapm/ENTRY/atom_probe/field_of_view-field
/NXoptical_system_em/field_of_view-field
fieldname_errors
/NXdata/FIELDNAME_errors-field
fieldname_offset
/NXdata/FIELDNAME_offset-field
fieldname_scaling_factor
/NXdata/FIELDNAME_scaling_factor-field
figure_data
/NXgrating/figure_data-group
/NXmirror/figure_data-group
figure_of_merit
/NXspindispersion/figure_of_merit-field
file_name
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/external/file_name-field
/NXnote/file_name-field
filename
/NXapm_composition_space_results/ENTRY/dataset/filename-field
/NXapm_composition_space_results/ENTRY/iontypes/filename-field
/NXapm_input_ranging/filename-field
/NXapm_input_reconstruction/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/dataset/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dataset/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS/filename-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/filename-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/edge_of_the_dataset/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/dataset/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/filename-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes/filename-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/dataset/filename-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontypes/filename-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/dataset/filename-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances/filename-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontypes/filename-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances/filename-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/filename-field
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/dataset/filename-field
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes/filename-field
/NXms_score_config/ENTRY/initial_microstructure/ebsd/filename-field
filenames
/NXiqproc/ENTRY/reduction/input/filenames-field
/NXsqom/ENTRY/reduction/input/filenames-field
filter
/NXinstrument/FILTER-group
filter_number
/NXbeam_path/filter_NUMBER-group
final_beam_divergence
/NXbeam/final_beam_divergence-field
final_energy
/NXbeam/final_energy-field
final_polarization
/NXbeam/final_polarization-field
final_polarization_stokes
/NXbeam/final_polarization_stokes-field
final_wavelength
/NXbeam/final_wavelength-field
final_wavelength_spread
/NXbeam/final_wavelength_spread-field
firmware
/NXopt/ENTRY/INSTRUMENT/firmware-group
fit_function
/NXcalibration/fit_function-field
fixed_energy
/NXspe/ENTRY/NXSPE_info/fixed_energy-field
fixed_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element/fixed_revolutions-field
fixed_slit
/NXbeam_path/MONOCHROMATOR/SLIT/fixed_slit-field
flags
/NXreflections/flags-field
flatfield
/NXdetector/flatfield-field
/NXdetector_channel/flatfield-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield-field
flatfield_applied
/NXdetector/flatfield_applied-field
/NXdetector_channel/flatfield_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_applied-field
flatfield_error
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_error-field
flatfield_errors
/NXdetector/flatfield_errors-field
/NXdetector_channel/flatfield_errors-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/flatfield_errors-field
flight_path_length
/NXapm/ENTRY/atom_probe/flight_path_length-field
flip_current
/NXflipper/flip_current-field
flip_turns
/NXflipper/flip_turns-field
flipper
/NXinstrument/FLIPPER-group
fluorescence
/NXfluo/entry/INSTRUMENT/fluorescence-group
flux
/NXbeam/flux-field
/NXmx/ENTRY/INSTRUMENT/BEAM/flux-field
/NXsource/flux-field
flux_integrated
/NXmx/ENTRY/INSTRUMENT/BEAM/flux_integrated-field
flyback_time
/NXscanbox_em/flyback_time-field
focal_length
/NXlens_opt/focal_length-field
focal_size
/NXcapillary/focal_size-field
focus_parameters
/NXfresnel_zone_plate/focus_parameters-field
focus_type
/NXxraylens/focus_type-field
focussing_probes
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/focussing_probes-group
force
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force-field
force_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/force_control-field
formula
/NXdispersion_function/formula-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/formula-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/formula-field
frame_average
/NXxpcs/entry/data/frame_average-field
frame_start_number
/NXdetector/frame_start_number-field
/NXxbase/entry/instrument/detector/frame_start_number-field
frame_sum
/NXxpcs/entry/data/frame_sum-field
frame_time
/NXdetector/frame_time-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/frame_time-field
/NXxpcs/entry/instrument/DETECTOR/frame_time-field
frequency
/NXcollimator/frequency-field
/NXsnsevent/ENTRY/instrument/SNS/frequency-field
/NXsnshisto/ENTRY/instrument/SNS/frequency-field
/NXsource/frequency-field
frequency_log
/NXcollimator/frequency_log-group
frequency_resolution
/NXbeam_path/DISK_CHOPPER/frequency_resolution-field
g2
/NXxpcs/entry/data/g2-field
g2_derr
/NXxpcs/entry/data/g2_derr-field
g2_err_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func-field
g2_err_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_err_from_two_time_corr_func_partials-field
g2_from_two_time_corr_func
/NXxpcs/entry/twotime/g2_from_two_time_corr_func-field
g2_from_two_time_corr_func_partials
/NXxpcs/entry/twotime/g2_from_two_time_corr_func_partials-field
g2_unnormalized
/NXxpcs/entry/data/G2_unnormalized-field
gain
/NXcapillary/gain-group
/NXtransmission/ENTRY/instrument/DETECTOR/gain-field
gain_setting
/NXdetector/gain_setting-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/gain_setting-field
gap
/NXinsertion_device/gap-field
gas
/NXxraylens/gas-field
gas_pressure
/NXdetector/gas_pressure-field
/NXmpes/ENTRY/SAMPLE/gas_pressure-field
/NXxraylens/gas_pressure-field
gbcd
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/gbcd-group
geometry
/NXaperture/GEOMETRY-group
/NXbeam_path/ATTENUATOR/GEOMETRY-group
/NXbeam_stop/GEOMETRY-group
/NXbending_magnet/GEOMETRY-group
/NXcollimator/GEOMETRY-group
/NXcrystal/GEOMETRY-group
/NXcsg/geometry-field
/NXdetector/GEOMETRY-group
/NXdisk_chopper/GEOMETRY-group
/NXfermi_chopper/GEOMETRY-group
/NXfilter/GEOMETRY-group
/NXguide/GEOMETRY-group
/NXinsertion_device/GEOMETRY-group
/NXmirror/GEOMETRY-group
/NXmoderator/GEOMETRY-group
/NXmonitor/GEOMETRY-group
/NXmonochromator/geometry-group
/NXms_feature_set/interfaces/geometry-group
/NXms_feature_set/lines/geometry-group
/NXms_feature_set/points/geometry-group
/NXms_feature_set/volumes/geometry-group
/NXorientation/GEOMETRY-group
/NXsample/geometry-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY-group
/NXsastof/ENTRY/instrument/collimator/geometry-group
/NXsensor/geometry-group
/NXsource/geometry-group
/NXtranslation/geometry-group
/NXvelocity_selector/geometry-group
geometry_1
/NXcxi_ptycho/sample_1/geometry_1-group
getter_pump
/NXapm/ENTRY/atom_probe/getter_pump-group
gnomonic_projection_reference_frame
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame-group
/NXem_ebsd_conventions/gnomonic_projection_reference_frame-group
gradient_guide_magnitude
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/gradient_guide_magnitude-field
gradient_guide_projection
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/gradient_guide_projection-field
grain_boundary_mobility_model
/NXms_score_config/ENTRY/grain_boundary_mobility_model-group
grain_diameter
/NXapm/ENTRY/sample/grain_diameter-field
/NXms_score_config/ENTRY/initial_microstructure/grain_diameter-field
grain_diameter_error
/NXapm/ENTRY/sample/grain_diameter_error-field
grain_ensemble
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_ensemble-group
grain_euler
/NXms_score_config/ENTRY/initial_microstructure/grain_euler-field
grain_identifier
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid/grain_identifier-field
grain_size
/NXms_score_config/ENTRY/initial_microstructure/grain_size-field
grain_size_distribution
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_size_distribution-group
grating
/NXbeam_path/GRATING-group
/NXbeam_path/MONOCHROMATOR/GRATING-group
/NXmonochromator/GRATING-group
/NXtransmission/ENTRY/instrument/spectrometer/GRATING-group
grating_wavelength_max
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_max-field
grating_wavelength_min
/NXbeam_path/MONOCHROMATOR/GRATING/grating_wavelength_min-field
grid
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid-group
/NXcg_marching_cubes/grid-group
/NXdelocalization/grid-field
/NXisocontour/grid-group
/NXms/ENTRY/ROI_SET/grid-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid-group
/NXms_score_results/ENTRY/ROI_SET/grid-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid-group
gridresolutions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/gridresolutions-field
grinding_machine
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine-group
grinding_step
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP-group
grooves
/NXbeam_path/GRATING/grooves-field
group_index
/NXdetector_group/group_index-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_index-field
group_name_iontypes
/NXapm_input_ranging/group_name_iontypes-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontypes/group_name_iontypes-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes/group_name_iontypes-field
group_names
/NXdetector_group/group_names-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_names-field
group_parent
/NXdetector_group/group_parent-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR_GROUP/group_parent-field
group_type
/NXdetector_group/group_type-field
groupname_geometry_prefix
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/FEATURE/groupname_geometry_prefix-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/FEATURE/groupname_geometry_prefix-field
guide
/NXinstrument/GUIDE-group
guide_current
/NXflipper/guide_current-field
guide_turns
/NXflipper/guide_turns-field
h
/NXreflections/h-field
hagb_enthalpy
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/hagb_enthalpy-field
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/hagb_enthalpy-field
hagb_pre_factor
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/hagb_pre_factor-field
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/hagb_pre_factor-field
half_axes_radii
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/half_axes_radii-field
/NXcg_ellipsoid_set/half_axes_radii-field
half_axes_radius
/NXcg_ellipsoid_set/half_axes_radius-field
half_edge_identifier_offset
/NXcg_half_edge_data_structure/half_edge_identifier_offset-field
half_edge_incident_face
/NXcg_half_edge_data_structure/half_edge_incident_face-field
half_edge_next
/NXcg_half_edge_data_structure/half_edge_next-field
half_edge_prev
/NXcg_half_edge_data_structure/half_edge_prev-field
half_edge_twin
/NXcg_half_edge_data_structure/half_edge_twin-field
half_edge_vertex_origin
/NXcg_half_edge_data_structure/half_edge_vertex_origin-field
halo_region
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/halo_region-field
harmonic
/NXinsertion_device/harmonic-field
has_cell_edge_detection
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_edge_detection-field
has_cell_geometry
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_geometry-field
has_cell_neighbors
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_neighbors-field
has_cell_volume
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/has_cell_volume-field
has_closure
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_closure-field
has_current_to_next_links
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_current_to_next_links-field
has_exterior_facets
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_exterior_facets-field
has_interior_tetrahedra
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/has_interior_tetrahedra-field
has_next_to_current_links
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/has_next_to_current_links-field
has_object
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object-field
has_object_auto_proxigram
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram-field
has_object_auto_proxigram_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_auto_proxigram_edge_contact-field
has_object_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_edge_contact-field
has_object_geometry
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_geometry-field
has_object_ions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_ions-field
has_object_obb
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_obb-field
has_object_properties
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_object_properties-field
has_proxy
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy-field
has_proxy_edge_contact
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_edge_contact-field
has_proxy_geometry
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_geometry-field
has_proxy_ions
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_ions-field
has_proxy_obb
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_obb-field
has_proxy_properties
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_proxy_properties-field
has_scalar_fields
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/has_scalar_fields-field
has_triangle_soup
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/has_triangle_soup-field
hdbscan
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan-group
heat_treatment_quenching_rate
/NXapm/ENTRY/sample/heat_treatment_quenching_rate-field
heat_treatment_quenching_rate_error
/NXapm/ENTRY/sample/heat_treatment_quenching_rate_error-field
heat_treatment_temperature
/NXapm/ENTRY/sample/heat_treatment_temperature-field
heat_treatment_temperature_error
/NXapm/ENTRY/sample/heat_treatment_temperature_error-field
heater_power
/NXmanipulator/heater_power-field
height
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/height-field
/NXcg_cylinder_set/height-field
/NXcg_hexahedron_set/height-field
/NXfermi_chopper/height-field
/NXvelocity_selector/height-field
hexahedra
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/hexahedra-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/hexahedra-group
/NXcg_hexahedron_set/hexahedra-group
hexahedron
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron-group
/NXcg_hexahedron_set/hexahedron-group
hexahedron_half_edge
/NXcg_hexahedron_set/hexahedron_half_edge-group
high_throughput_method
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/dbscan/high_throughput_method-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hdbscan/high_throughput_method-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics/high_throughput_method-field
high_trip_value
/NXsensor/high_trip_value-field
histogram_min_incr_max
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/knn/histogram_min_incr_max-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/rdf/histogram_min_incr_max-field
hit_multiplicity
/NXapm/ENTRY/atom_probe/hit_multiplicity-group
/NXapm/ENTRY/atom_probe/hit_multiplicity/hit_multiplicity-field
hit_multiplicity_filter
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/hit_multiplicity_filter-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/hit_multiplicity_filter-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/hit_multiplicity_filter-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/hit_multiplicity_filter-group
hit_positions
/NXapm/ENTRY/atom_probe/ion_impact_positions/hit_positions-field
hit_quality_filtering
/NXapm/ENTRY/atom_probe/hit_quality_filtering-group
hit_rate
/NXem_ebsd/ENTRY/experiment/indexing/hit_rate-field
holder
/NXsnsevent/ENTRY/sample/holder-field
/NXsnshisto/ENTRY/sample/holder-field
i
/NXcanSAS/ENTRY/DATA/I-field
ibeam_column
/NXem/ENTRY/em_lab/IBEAM_COLUMN-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN-group
ibeam_deflector
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ibeam_deflector-group
id
/NXreflections/id-field
identifier
/NXapm/ENTRY/atom_probe/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/identifier-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/identifier-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXcg_cylinder_set/identifier-field
/NXcg_ellipsoid_set/identifier-field
/NXcg_grid/identifier-field
/NXcg_hexahedron_set/identifier-field
/NXcg_parallelogram_set/identifier-field
/NXcg_point_set/identifier-field
/NXcg_polygon_set/identifier-field
/NXcg_polyhedron_set/identifier-field
/NXcg_polyline_set/identifier-field
/NXcg_sphere_set/identifier-field
/NXcg_tetrahedron_set/identifier-field
/NXcg_triangle_set/identifier-field
/NXcs_filter_boolean_mask/identifier-field
/NXem/ENTRY/em_lab/DETECTOR/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR/FABRICATION/identifier-field
/NXem/ENTRY/em_lab/stage_lab/FABRICATION/identifier-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/identifier-field
/NXfabrication/identifier-field
/NXgraph_edge_set/identifier-field
/NXgraph_node_set/identifier-field
/NXion/identifier-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/identifier-field
/NXlab_sample_mounting/ENTRY/mounting_machine/identifier-field
/NXms_feature_set/identifier-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_CPU/FABRICATION/identifier-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_GPU/FABRICATION/identifier-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/FABRICATION/identifier-field
/NXorientation_set/identifier-field
/NXsnsevent/ENTRY/sample/identifier-field
/NXsnshisto/ENTRY/sample/identifier-field
/NXtransmission/ENTRY/acquisition_program/identifier-field
identifier_offset
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/identifier_offset-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/identifier_offset-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/identifier_offset-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_HEXAHEDRON_SET/identifier_offset-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/identifier_offset-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/identifier_offset-field
/NXcg_cylinder_set/identifier_offset-field
/NXcg_ellipsoid_set/identifier_offset-field
/NXcg_grid/identifier_offset-field
/NXcg_hexahedron_set/identifier_offset-field
/NXcg_parallelogram_set/identifier_offset-field
/NXcg_point_set/identifier_offset-field
/NXcg_polygon_set/identifier_offset-field
/NXcg_polyhedron_set/identifier_offset-field
/NXcg_polyline_set/identifier_offset-field
/NXcg_sphere_set/identifier_offset-field
/NXcg_tetrahedron_set/identifier_offset-field
/NXcg_triangle_set/identifier_offset-field
/NXclustering/identifier_offset-field
/NXgraph_edge_set/identifier_offset-field
/NXgraph_node_set/identifier_offset-field
/NXms/ENTRY/ROI_SET/snapshot_set/identifier_offset-field
/NXms_feature_set/identifier_offset-field
/NXms_score_results/ENTRY/ROI_SET/grid/identifier_offset-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/identifier_offset-field
/NXms_snapshot_set/identifier_offset-field
/NXorientation_set/identifier_offset-field
/NXsimilarity_grouping/identifier_offset-field
identifier_type
/NXion/identifier_type-field
idev
/NXcanSAS/ENTRY/DATA/Idev-field
image_key
/NXdetector/image_key-field
/NXtomo/entry/data/image_key-link
/NXtomo/entry/instrument/detector/image_key-field
image_set
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET-group
/NXevent_data_em/IMAGE_SET-group
image_set_em_kikuchi
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI-group
implementation
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/marching_cubes/implementation-field
/NXcg_marching_cubes/implementation-field
incidence_vector
/NXpulser_apm/SOURCE/BEAM/incidence_vector-group
incident_angle
/NXbeam_splitter/incident_angle-field
/NXguide/incident_angle-field
/NXmirror/incident_angle-field
incident_beam
/NXxpcs/entry/instrument/incident_beam-group
incident_beam_divergence
/NXbeam/incident_beam_divergence-field
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_divergence-field
incident_beam_energy
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_beam_energy-field
incident_beam_size
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_beam_size-field
incident_energy
/NXbeam/incident_energy-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy-field
/NXxpcs/entry/instrument/incident_beam/incident_energy-field
incident_energy_spread
/NXcxi_ptycho/entry_1/instrument_1/beam_1/incident_energy_spread-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_energy_spread-field
/NXxpcs/entry/instrument/incident_beam/incident_energy_spread-field
incident_polarisation_stokes
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarisation_stokes-field
incident_polarization
/NXbeam/incident_polarization-field
/NXmpes/ENTRY/INSTRUMENT/BEAM/incident_polarization-field
incident_polarization_stokes
/NXbeam/incident_polarization_stokes-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_polarization_stokes-field
incident_polarization_type
/NXxpcs/entry/instrument/incident_beam/incident_polarization_type-field
incident_wavelength
/NXbeam/incident_wavelength-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength-field
incident_wavelength_spectrum
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spectrum-group
incident_wavelength_spread
/NXbeam/incident_wavelength_spread-field
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/incident_wavelength_spread-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_spread-field
incident_wavelength_weight
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weight-field
incident_wavelength_weights
/NXbeam/incident_wavelength_weights-field
/NXmx/ENTRY/INSTRUMENT/BEAM/incident_wavelength_weights-field
incoming_beam
/NXxas/ENTRY/INSTRUMENT/incoming_beam-group
incubation_time_model
/NXms_score_config/ENTRY/nucleation_model/incubation_time_model-field
independent_controllers
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/independent_controllers-field
index_of_refraction
/NXlens_opt/substrate/index_of_refraction-field
/NXpolarizer_opt/substrate/index_of_refraction-field
index_of_refraction_coating
/NXbeam_splitter/coating/index_of_refraction_coating-field
/NXlens_opt/COATING/index_of_refraction_coating-field
/NXpolarizer_opt/COATING/index_of_refraction_coating-field
/NXwaveplate/coating/index_of_refraction_coating-field
index_of_refration_substrate
/NXbeam_splitter/substrate/index_of_refration_substrate-field
/NXwaveplate/substrate/index_of_refration_substrate-field
indexing
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing-group
/NXem_ebsd/ENTRY/experiment/indexing-group
/NXspectrum_set_em_xray/indexing-group
infection_direction
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/infection_direction-field
initial_cell_cache
/NXms_score_config/ENTRY/numerics/initial_cell_cache-field
initial_interface
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/initial_interface-group
initial_microstructure
/NXms_score_config/ENTRY/initial_microstructure-group
initial_radius
/NXapm/ENTRY/atom_probe/specimen_monitoring/initial_radius-field
initialization
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/initialization-field
inner_half_angle
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/inner_half_angle-field
input
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/input-field
/NXdetector/input-field
/NXiqproc/ENTRY/reduction/input-group
/NXsqom/ENTRY/reduction/input-group
insertion_device
/NXinstrument/INSERTION_DEVICE-group
instrument
/NXarchive/entry/instrument-group
/NXarpes/ENTRY/INSTRUMENT-group
/NXcanSAS/ENTRY/INSTRUMENT-group
/NXdirecttof/entry/INSTRUMENT-group
/NXellipsometry/ENTRY/INSTRUMENT-group
/NXentry/INSTRUMENT-group
/NXevent_data_em/INSTRUMENT-group
/NXfluo/entry/INSTRUMENT-group
/NXindirecttof/entry/INSTRUMENT-group
/NXiqproc/ENTRY/instrument-group
/NXiv_temp/ENTRY/INSTRUMENT-group
/NXlauetof/entry/instrument-group
/NXmonopd/entry/INSTRUMENT-group
/NXmpes/ENTRY/INSTRUMENT-group
/NXmx/ENTRY/INSTRUMENT-group
/NXopt/ENTRY/INSTRUMENT-group
/NXrefscan/entry/instrument-group
/NXreftof/entry/instrument-group
/NXsas/ENTRY/INSTRUMENT-group
/NXsastof/ENTRY/instrument-group
/NXscan/ENTRY/INSTRUMENT-group
/NXsensor_scan/ENTRY/INSTRUMENT-group
/NXsnsevent/ENTRY/instrument-group
/NXsnshisto/ENTRY/instrument-group
/NXspe/ENTRY/INSTRUMENT-group
/NXsqom/ENTRY/instrument-group
/NXstxm/ENTRY/INSTRUMENT-group
/NXsubentry/INSTRUMENT-group
/NXtas/entry/INSTRUMENT-group
/NXtofnpd/entry/INSTRUMENT-group
/NXtofraw/entry/instrument-group
/NXtofsingle/entry/INSTRUMENT-group
/NXtomo/entry/instrument-group
/NXtomophase/entry/instrument-group
/NXtomoproc/entry/INSTRUMENT-group
/NXtransmission/ENTRY/instrument-group
/NXxas/ENTRY/INSTRUMENT-group
/NXxbase/entry/instrument-group
/NXxeuler/entry/instrument-group
/NXxkappa/entry/instrument-group
/NXxlaue/entry/instrument-group
/NXxlaueplate/entry/instrument-group
/NXxnb/entry/instrument-group
/NXxpcs/entry/instrument-group
/NXxrot/entry/instrument-group
instrument_1
/NXcxi_ptycho/entry_1/instrument_1-group
instrument_calibration
/NXapm/ENTRY/atom_probe/instrument_calibration-group
instrument_name
/NXapm/ENTRY/atom_probe/instrument_name-field
/NXem/ENTRY/em_lab/instrument_name-field
int_prf
/NXreflections/int_prf-field
int_prf_errors
/NXreflections/int_prf_errors-field
int_prf_var
/NXreflections/int_prf_var-field
int_sum
/NXreflections/int_sum-field
int_sum_errors
/NXreflections/int_sum_errors-field
int_sum_var
/NXreflections/int_sum_var-field
integral
/NXmonitor/integral-field
/NXmonopd/entry/MONITOR/integral-field
/NXreftof/entry/control/integral-field
/NXsas/ENTRY/MONITOR/integral-field
/NXtomophase/entry/control/integral-field
/NXxbase/entry/control/integral-field
integral_counts
/NXtofraw/entry/MONITOR/integral_counts-field
integral_log
/NXmonitor/integral_log-group
integration_radius
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/volume_statistics/integration_radius-field
intensity
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/intensity-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/intensity-field
/NXpeak/intensity-field
interaction_vol_em
/NXevent_data_em/INTERACTION_VOL_EM-group
interface_meshing
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing-group
interface_model
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess/interface_model-field
interface_modelling
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling-group
interfaces
/NXms_feature_set/interfaces-group
interfacial_excess
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/interfacial_excess-group
interior_angle
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/interior_angle-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/interior_angle-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/interior_angle-field
/NXcg_polygon_set/interior_angle-field
/NXcg_triangle_set/interior_angle-field
interior_atmosphere
/NXgrating/interior_atmosphere-field
/NXguide/interior_atmosphere-field
/NXmirror/interior_atmosphere-field
interior_cells
/NXcg_alpha_complex/interior_cells-group
interior_tetrahedra
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intersection_detection_method
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intersection_volume
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ion
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/NXapm/ENTRY/sample/CHEMICAL_COMPOSITION/ION-group
/NXapm_composition_space_results/ENTRY/voxelization/ION-group
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/composition/ION-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/composition/ION-group
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/NXchemical_composition/ION-group
/NXspectrum_set_em_xray/indexing/PEAK/ION-group
ion_detector
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ion_energy_profile
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ion_filtering
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ion_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/ion_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/ion_identifier-field
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ion_impact_positions
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ion_multiplicity
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ion_query_isotope_vector
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ion_query_isotope_vector_source
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ion_query_isotope_vector_target
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ion_query_type_source
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ion_query_type_target
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ion_source
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_source-group
/NXibeam_column/ion_source-group
ion_to_edge_distances
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/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/ion_to_edge_distances-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_edge_distances-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/ion_to_edge_distances-group
ion_to_feature_distances
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/ion_to_feature_distances-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances-group
ion_type
/NXion/ion_type-field
ion_type_filter
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iontype_filter
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/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontype_filter-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontype_filter-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontype_filter-group
iontypes
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/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/iontypes-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/check_existent_ranging/iontypes-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontypes-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/iontypes-group
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/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS/iontypes-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/iontypes-field
iontypes_randomized
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/iontypes_randomized-field
ipf_rgb_color_model
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/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model-group
ipf_rgb_map
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map-group
is_a
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/NXgraph_node_set/is_a-field
is_axis_aligned
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/NXcg_parallelogram_set/is_axis_aligned-field
is_box
/NXcg_hexahedron_set/is_box-field
is_centrosymmetric
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is_chiral
/NXem_ebsd_crystal_structure_model/is_chiral-field
is_closed
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/NXcg_polyline_set/is_closed-field
/NXcg_sphere_set/is_closed-field
is_core
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is_cylindrical
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is_deformed
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is_noise
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is_polycrystalline
/NXapm/ENTRY/specimen/is_polycrystalline-field
is_recrystallized
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is_specific
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is_watertight
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iso_surface
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iso_surface_analysis
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isosurfacing
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isotope
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isotope_matrix
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isotope_vector
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/isotope_vector-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/composition/ION/isotope_vector-field
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/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/charged_ION/isotope_vector-field
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/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/probe/isotope_vector-field
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/NXion/isotope_vector-field
isotope_vector_matrix
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isotope_whitelist
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/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/isotope_whitelist-field
/NXdelocalization/isotope_whitelist-field
isotopic_decomposition_rule
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isovalue
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/NXisocontour/isovalue-field
iteration
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/iteration-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/iteration-field
/NXms_snapshot/iteration-field
iupac_line_names
/NXspectrum_set_em_xray/indexing/PEAK/ION/iupac_line_names-field
job_pyiron_identifier
/NXapm_composition_space_results/ENTRY/job_pyiron_identifier-field
jones_quality_factor
/NXopt/ENTRY/derived_parameters/Jones_quality_factor-field
k
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/NXreflections/k-field
k_d_value
/NXpid/K_d_value-field
k_i_value
/NXpid/K_i_value-field
k_p_value
/NXpid/K_p_value-field
kappa
/NXxkappa/entry/name/kappa-link
/NXxkappa/entry/sample/kappa-field
kernel_mu
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_mu-field
kernel_sigma
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_sigma-field
kernel_size
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_size-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/kernel_size-field
kernel_variance
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/kernel_variance-field
ki_over_kf_scaling
/NXspe/ENTRY/NXSPE_info/ki_over_kf_scaling-field
kikuchi
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi-group
kinetics
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution/kinetics-group
knn
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/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/knn-group
l
/NXreflections/l-field
label
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/NXgraph_edge_set/label-field
/NXgraph_node_set/label-field
/NXpeak/label-field
lagb_enthalpy
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lagb_pre_factor
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lagb_to_hagb_cut
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_cut-field
lagb_to_hagb_exponent
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_exponent-field
lagb_to_hagb_transition
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters/lagb_to_hagb_transition-field
lambda
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/lambda-field
last_fill
/NXsource/last_fill-field
last_process
/NXcalibration/last_process-field
/NXdistortion/last_process-field
/NXregistration/last_process-field
lateral_surface_area
/NXcg_cylinder_set/lateral_surface_area-field
lattice_type
/NXslip_system_set/lattice_type-field
laue_group
/NXem_ebsd_crystal_structure_model/laue_group-field
layer_structure
/NXopt/ENTRY/SAMPLE/layer_structure-field
layer_thickness
/NXgrating/layer_thickness-field
/NXmirror/layer_thickness-field
layout
/NXdetector/layout-field
length
/NXcanSAS/ENTRY/INSTRUMENT/COLLIMATOR/length-field
/NXcg_hexahedron_set/length-field
/NXcg_parallelogram_set/length-field
/NXcg_polyline_set/length-field
/NXfiber/length-field
/NXinsertion_device/length-field
/NXvelocity_selector/length-field
lens_diameter
/NXlens_opt/lens_diameter-field
lens_em
/NXcollectioncolumn/LENS_EM-group
/NXcorrector_cs/LENS_EM-group
/NXebeam_column/LENS_EM-group
/NXelectronanalyser/LENS_EM-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM-group
/NXenergydispersion/LENS_EM-group
/NXibeam_column/LENS_EM-group
/NXspindispersion/LENS_EM-group
lens_geometry
/NXxraylens/lens_geometry-field
lens_length
/NXxraylens/lens_length-field
lens_material
/NXxraylens/lens_material-field
lens_mode
/NXarpes/ENTRY/INSTRUMENT/analyser/lens_mode-field
lens_opt
/NXbeam_path/LENS_OPT-group
lens_thickness
/NXxraylens/lens_thickness-field
lifespan
/NXbeam_path/SOURCE/lifespan-field
light_source
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/light_source-group
line_time
/NXscanbox_em/line_time-field
linear_range_min_incr_max
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/evaporation_id_filter/linear_range_min_incr_max-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/evaporation_id_filter/linear_range_min_incr_max-field
/NXsubsampling_filter/linear_range_min_incr_max-field
lines
/NXms_feature_set/lines-group
load_lock_chamber
/NXapm/ENTRY/atom_probe/control_software/load_lock_chamber-group
/NXapm/ENTRY/atom_probe/load_lock_chamber-group
local_electrode
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local_name
/NXdetector/local_name-field
/NXem/ENTRY/em_lab/DETECTOR/local_name-field
location
/NXapm/ENTRY/atom_probe/location-field
/NXem/ENTRY/em_lab/location-field
log
/NXsnsevent/ENTRY/DASlogs/LOG-group
/NXsnshisto/ENTRY/DASlogs/LOG-group
low_trip_value
/NXsensor/low_trip_value-field
lower_cap_radius
/NXcg_cylinder_set/lower_cap_radius-field
lp
/NXreflections/lp-field
lubricant
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/lubricant-field
m_value
/NXfilter/m_value-field
/NXguide/m_value-field
/NXmirror/m_value-field
magnetic_field
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/NXbending_magnet/magnetic_field-field
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/magnetic_field-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/magnetic_field-group
/NXsample/magnetic_field-field
/NXsample/magnetic_field-group
magnetic_field_env
/NXsample/magnetic_field_env-group
magnetic_field_log
/NXsample/magnetic_field_log-group
magnetic_wavelength
/NXinsertion_device/magnetic_wavelength-field
magnification
/NXcollectioncolumn/magnification-field
/NXcorrector_cs/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/magnification-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/magnification-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/magnification-field
/NXoptical_system_em/magnification-field
magnitude
/NXaberration/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/magnitude-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/magnitude-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/magnitude-field
manipulator
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR-group
manufacturer
/NXcapillary/manufacturer-field
/NXtransmission/ENTRY/instrument/manufacturer-group
manufacturer_model
/NXdeflector/manufacturer_model-field
manufacturer_name
/NXapm/ENTRY/atom_probe/ion_detector/manufacturer_name-field
/NXdeflector/manufacturer_name-field
/NXlens_em/manufacturer_name-field
marching_cubes
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/marching_cubes-group
mark
/NXdelocalization/mark-field
mask
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/mask-field
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window/mask-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles/mask-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window/mask-field
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window/mask-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top/mask-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window/mask-field
/NXcs_filter_boolean_mask/mask-field
mask_material
/NXfresnel_zone_plate/mask_material-field
mask_thickness
/NXfresnel_zone_plate/mask_thickness-field
masks
/NXxpcs/entry/instrument/masks-group
mass
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass-field
/NXsample/mass-field
/NXsample_component/mass-field
mass_spectrum
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum-group
mass_to_charge
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion/mass_to_charge-field
mass_to_charge_conversion
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/mass_to_charge_conversion-group
mass_to_charge_distribution
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution-group
mass_to_charge_interval
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_interval-field
mass_to_charge_range
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/ION/mass_to_charge_range-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/charged_ION/mass_to_charge_range-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/mass_to_charge_range-field
/NXion/mass_to_charge_range-field
mass_to_charge_state_ratio
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/mass_to_charge_state_ratio-field
mass_vector
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/mass_vector-field
match
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/match-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/match-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter/match-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter/match-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter/match-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter/match-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule/match-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/isotopic_decomposition_rule/match-field
/NXmatch_filter/match-field
material
/NXaperture/material-field
/NXbeam_path/window_NUMBER/material-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/material-field
material_phase
/NXdispersive_material/ENTRY/sample/material_phase-field
material_phase_comment
/NXdispersive_material/ENTRY/sample/material_phase_comment-field
material_properties
/NXms_score_config/ENTRY/material_properties-group
max_delta_x
/NXms_score_config/ENTRY/numerics/max_delta_x-field
max_eps
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics/max_eps-field
max_frequency
/NXbeam_path/DISK_CHOPPER/max_frequency-field
max_gap
/NXbeam_path/MONOCHROMATOR/SLIT/max_gap-field
max_iteration
/NXms_score_config/ENTRY/stop_criteria/max_iteration-field
max_physical_capacity
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
/NXcs_io_obj/max_physical_capacity-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/max_physical_capacity-field
max_resident_memory_snapshot
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
/NXcs_profiling_event/max_resident_memory_snapshot-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_resident_memory_snapshot-field
max_revolutions
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element/max_revolutions-field
max_time
/NXms_score_config/ENTRY/stop_criteria/max_time-field
max_virtual_memory_snapshot
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
/NXcs_profiling_event/max_virtual_memory_snapshot-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/max_virtual_memory_snapshot-field
max_x
/NXms_score_config/ENTRY/stop_criteria/max_x-field
maximum_charge
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_charge-field
maximum_incident_angle
/NXcapillary/maximum_incident_angle-field
maximum_number_of_atoms_per_molecular_ion
/NXapm/ENTRY/atom_probe/ranging/maximum_number_of_atoms_per_molecular_ion-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/maximum_number_of_atoms_per_molecular_ion-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/maximum_number_of_atoms_per_molecular_ion-field
maximum_number_of_isotopes
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/maximum_number_of_isotopes-field
maximum_value
/NXlog/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/LOG/maximum_value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/maximum_value-field
measure_time
/NXbeam_path/SOURCE/measure_time-field
measured_data
/NXopt/ENTRY/data_collection/measured_data-field
/NXtransmission/ENTRY/instrument/measured_data-field
measured_data_errors
/NXopt/ENTRY/data_collection/measured_data_errors-field
measurement
/NXem/ENTRY/measurement-group
/NXsensor/measurement-field
measurement_sensors
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/measurement_sensors-field
medium
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/medium-field
medium_refractive_indices
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/medium_refractive_indices-field
melting_temperature
/NXms_score_config/ENTRY/material_properties/melting_temperature-field
mesh_curr_post_dcom_step
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP-group
mesh_curr_pre_dcom_step
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP-group
method
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/feature_mesh/patch_identifier_filter/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/iontype_filter/method-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/hit_multiplicity_filter/method-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/iontype_filter/method-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/hit_multiplicity_filter/method-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/iontype_filter/method-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating/method-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/atomic_decomposition_rule/method-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/isotopic_decomposition_rule/method-field
/NXem/ENTRY/sample/method-field
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/NXdispersion_function/model_name-field
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/NXsnshisto/ENTRY/instrument/moderator-group
modf
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/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/module_offset-field
molecular_ion_search
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momentum_calibration
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momentum_resolution
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monitor
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/NXcxi_ptycho/entry_1/instrument_1/MONITOR-group
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/NXentry/MONITOR-group
/NXfluo/entry/MONITOR-group
/NXmonopd/entry/MONITOR-group
/NXsas/ENTRY/MONITOR-group
/NXscan/ENTRY/MONITOR-group
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/NXsnshisto/ENTRY/MONITOR-group
/NXsubentry/MONITOR-group
/NXtas/entry/MONITOR-group
/NXtofnpd/entry/MONITOR-group
/NXtofraw/entry/MONITOR-group
/NXtofsingle/entry/MONITOR-group
/NXxas/ENTRY/MONITOR-group
monochromator
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/NXinstrument/MONOCHROMATOR-group
/NXrefscan/entry/instrument/monochromator-group
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/NXstxm/ENTRY/INSTRUMENT/monochromator-group
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/NXxas/ENTRY/INSTRUMENT/monochromator-group
/NXxbase/entry/instrument/monochromator-group
mosaic_horizontal
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mosaic_vertical
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mounting_machine
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mounting_method
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ms_feature_set
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ms_snapshot
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/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT-group
/NXms_snapshot_set/MS_SNAPSHOT-group
multiple_outputs
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n_phases_per_scan_point
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naive_point_cloud_density_map
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name
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/NXaperture_em/name-field
/NXapm/ENTRY/USER/name-field
/NXapm/ENTRY/atom_probe/REFLECTRON/name-field
/NXapm/ENTRY/atom_probe/analysis_chamber/name-field
/NXapm/ENTRY/atom_probe/buffer_chamber/name-field
/NXapm/ENTRY/atom_probe/ion_detector/name-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/name-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/name-field
/NXapm/ENTRY/atom_probe/local_electrode/name-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/name-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/name-field
/NXapm/ENTRY/sample/CHEMICAL_COMPOSITION/ION/name-field
/NXapm/ENTRY/specimen/name-field
/NXapm_composition_space_results/ENTRY/USER/name-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_CPU/name-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_GPU/name-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/name-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/name-field
/NXapm_composition_space_results/ENTRY/voxelization/ION/name-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/name-field
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/NXtofraw/entry/SAMPLE/name-field
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/NXtofsingle/entry/SAMPLE/name-field
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/NXtransmission/ENTRY/SAMPLE/name-field
/NXtransmission/ENTRY/operator/name-field
/NXuser/name-field
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/NXxas/ENTRY/SAMPLE/name-field
/NXxasproc/ENTRY/SAMPLE/name-field
/NXxbase/entry/instrument/source/name-field
/NXxbase/entry/sample/name-field
/NXxeuler/entry/name-group
/NXxkappa/entry/name-group
/NXxnb/entry/name-group
/NXxrot/entry/name-group
name_spectrum
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natural_abundance_product
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/natural_abundance_product-field
natural_abundance_product_vector
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/natural_abundance_product_vector-field
nature
/NXsnsevent/ENTRY/sample/nature-field
/NXsnshisto/ENTRY/sample/nature-field
/NXtofraw/entry/SAMPLE/nature-field
/NXtofsingle/entry/SAMPLE/nature-field
next_set
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set-group
next_set_feature_to_cluster
/NXapm_paraprobe_results_intersector/ENTRY/PROCESS/VOLUME_VOLUME_SPATIAL_CORRELATION/coprecipitation_analysis/next_set_feature_to_cluster-field
next_to_current_link
/NXapm_paraprobe_results_intersector/ENTRY/PROCESS/VOLUME_VOLUME_SPATIAL_CORRELATION/next_to_current_link-field
next_to_current_link_type
/NXapm_paraprobe_results_intersector/ENTRY/PROCESS/VOLUME_VOLUME_SPATIAL_CORRELATION/next_to_current_link_type-field
nion
/NXcorrector_cs/ZEMLIN_TABLEAU/PROCESS/nion-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion-group
node_pair
/NXgraph_edge_set/node_pair-field
nodes
/NXgraph_root/nodes-group
noise
/NXclustering/noise-field
/NXsimilarity_grouping/statistics/noise-field
nominal
/NXmonitor/nominal-field
normalization
/NXapm/ENTRY/sample/CHEMICAL_COMPOSITION/normalization-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/normalization-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/normalization-field
normals
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/normals-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/vertex_normal/normals-field
/NXcg_unit_normal_set/normals-field
note
/NXaperture/NOTE-group
/NXcanSAS/ENTRY/PROCESS/NOTE-group
/NXenvironment/NOTE-group
/NXprocess/NOTE-group
/NXxpcs/entry/NOTE-group
notes
/NXentry/notes-group
/NXsnsevent/ENTRY/notes-field
/NXsnshisto/ENTRY/notes-field
/NXsource/notes-group
/NXsubentry/notes-group
nth
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/knn/nth-field
nucleation_model
/NXms_score_config/ENTRY/nucleation_model-group
nucleus_euler
/NXms_score_config/ENTRY/nucleation_model/nucleus_euler-field
nuclid_list
/NXapm/ENTRY/atom_probe/ranging/peak_identification/ION/nuclid_list-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/composition/ION/nuclid_list-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/composition/ION/nuclid_list-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/ION/nuclid_list-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/check_existent_ranging/charged_ION/nuclid_list-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/nuclid_list-field
/NXion/nuclid_list-field
num
/NXvelocity_selector/num-field
number
/NXfermi_chopper/number-field
number_of_atoms
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/number_of_atoms-field
number_of_boundaries
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/number_of_boundaries-field
/NXcg_grid/number_of_boundaries-field
/NXms/ENTRY/ROI_SET/boundary/number_of_boundaries-field
/NXms_score_results/ENTRY/ROI_SET/boundary/number_of_boundaries-field
number_of_bunches
/NXsource/number_of_bunches-field
number_of_categorical_labels
/NXclustering/number_of_categorical_labels-field
/NXsimilarity_grouping/number_of_categorical_labels-field
number_of_cluster
/NXclustering/number_of_cluster-field
number_of_core
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/number_of_core-field
number_of_cycles
/NXdetector/number_of_cycles-field
number_of_disjoint_nuclids
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/number_of_disjoint_nuclids-field
number_of_domains
/NXms_score_config/ENTRY/solitary_unit_model/number_of_domains-field
number_of_edges
/NXcg_face_list_data_structure/number_of_edges-field
/NXcg_polyhedron_set/number_of_edges-field
/NXgraph_edge_set/number_of_edges-field
number_of_faces
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/number_of_faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/number_of_faces-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/number_of_faces-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/number_of_faces-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/number_of_faces-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/number_of_faces-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/number_of_faces-field
/NXcg_face_list_data_structure/number_of_faces-field
/NXcg_half_edge_data_structure/number_of_faces-field
/NXcg_polyhedron_set/number_of_faces-field
number_of_feature_types
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/number_of_feature_types-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/number_of_feature_types-field
number_of_features
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/number_of_features-field
/NXsimilarity_grouping/statistics/number_of_features-field
number_of_files
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/number_of_files-field
number_of_gpus
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_composition_space_results/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_selector/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/number_of_gpus-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_gpus-field
/NXcs_profiling/number_of_gpus-field
/NXcs_profiling_event/number_of_gpus-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_gpus-field
/NXms_score_results/ENTRY/performance/number_of_gpus-field
number_of_half_edges
/NXcg_half_edge_data_structure/number_of_half_edges-field
number_of_ion_types
/NXapm/ENTRY/atom_probe/ranging/number_of_ion_types-field
number_of_ions
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window/number_of_ions-field
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window/number_of_ions-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/number_of_ions-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window/number_of_ions-field
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window/number_of_ions-field
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window/number_of_ions-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window/number_of_ions-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window/number_of_ions-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top/number_of_ions-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window/number_of_ions-field
number_of_iterations
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/number_of_iterations-field
number_of_lenses
/NXxraylens/number_of_lenses-field
number_of_noise
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics/number_of_noise-field
number_of_nuclids
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/molecular_ion_search/number_of_nuclids-field
number_of_numeric_labels
/NXclustering/number_of_numeric_labels-field
/NXsimilarity_grouping/number_of_numeric_labels-field
number_of_objects
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CS_FILTER_BOOLEAN_MASK/number_of_objects-field
/NXcs_filter_boolean_mask/number_of_objects-field
number_of_parameters
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/PARAMETER/number_of_parameters-field
number_of_parent_identifier
/NXms_feature_set/number_of_parent_identifier-field
number_of_planes
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/number_of_planes-field
/NXem_ebsd_crystal_structure_model/number_of_planes-field
number_of_points
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid/number_of_points-field
number_of_processes
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_composition_space_results/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_config_clusterer/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_distancer/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_intersector/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_nanochem/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_ranger/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_selector/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_spatstat/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_surfacer/ENTRY/number_of_processes-field
/NXapm_paraprobe_config_tessellator/ENTRY/number_of_processes-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_selector/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/number_of_processes-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_processes-field
/NXcs_profiling/number_of_processes-field
/NXcs_profiling_event/number_of_processes-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_processes-field
/NXms_score_results/ENTRY/performance/number_of_processes-field
number_of_threads
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_composition_space_results/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_selector/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/number_of_threads-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/number_of_threads-field
/NXcs_profiling/number_of_threads-field
/NXcs_profiling_event/number_of_threads-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/number_of_threads-field
/NXms_score_results/ENTRY/performance/number_of_threads-field
number_of_total_vertices
/NXcg_polygon_set/number_of_total_vertices-field
/NXcg_polyline_set/number_of_total_vertices-field
number_of_triangles
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles/number_of_triangles-field
number_of_unassigned_members
/NXsimilarity_grouping/statistics/number_of_unassigned_members-field
number_of_unique_vertices
/NXcg_triangle_set/number_of_unique_vertices-field
number_of_vertices
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/number_of_vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/number_of_vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/number_of_vertices-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/number_of_vertices-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/number_of_vertices-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/number_of_vertices-field
/NXcg_face_list_data_structure/number_of_vertices-field
/NXcg_half_edge_data_structure/number_of_vertices-field
/NXcg_polyline_set/number_of_vertices-field
number_sections
/NXguide/number_sections-field
numeric_label
/NXclustering/numeric_label-field
numerical_aperture
/NXfiber/numerical_aperture-field
numerical_label
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/numerical_label-field
/NXsimilarity_grouping/numerical_label-field
numerics
/NXms_score_config/ENTRY/numerics-group
nxspe_info
/NXspe/ENTRY/NXSPE_info-group
obb
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb-group
objectid
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID-group
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objects
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/NXclustering/objects-field
/NXdelocalization/objects-field
/NXorientation_set/objects-field
objects_close_to_edge
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objects_far_from_edge
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observed_frame
/NXreflections/observed_frame-field
observed_frame_errors
/NXreflections/observed_frame_errors-field
observed_frame_var
/NXreflections/observed_frame_var-field
observed_phi
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observed_phi_errors
/NXreflections/observed_phi_errors-field
observed_phi_var
/NXreflections/observed_phi_var-field
observed_px_x
/NXreflections/observed_px_x-field
observed_px_x_errors
/NXreflections/observed_px_x_errors-field
observed_px_x_var
/NXreflections/observed_px_x_var-field
observed_px_y
/NXreflections/observed_px_y-field
observed_px_y_errors
/NXreflections/observed_px_y_errors-field
observed_px_y_var
/NXreflections/observed_px_y_var-field
observed_x
/NXreflections/observed_x-field
observed_x_errors
/NXreflections/observed_x_errors-field
observed_x_var
/NXreflections/observed_x_var-field
observed_y
/NXreflections/observed_y-field
observed_y_errors
/NXreflections/observed_y_errors-field
observed_y_var
/NXreflections/observed_y_var-field
odd_layer_density
/NXmirror/odd_layer_density-field
odd_layer_material
/NXmirror/odd_layer_material-field
odf
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off_geometry
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/NXbeam_stop/OFF_GEOMETRY-group
/NXbending_magnet/OFF_GEOMETRY-group
/NXcollimator/OFF_GEOMETRY-group
/NXcrystal/OFF_GEOMETRY-group
/NXdisk_chopper/OFF_GEOMETRY-group
/NXfermi_chopper/OFF_GEOMETRY-group
/NXfilter/OFF_GEOMETRY-group
/NXgrating/OFF_GEOMETRY-group
/NXguide/OFF_GEOMETRY-group
/NXinsertion_device/OFF_GEOMETRY-group
/NXmirror/OFF_GEOMETRY-group
/NXmoderator/OFF_GEOMETRY-group
/NXmonitor/OFF_GEOMETRY-group
/NXmonochromator/OFF_GEOMETRY-group
/NXsample/OFF_GEOMETRY-group
/NXsensor/OFF_GEOMETRY-group
/NXsolid_geometry/OFF_GEOMETRY-group
/NXsource/OFF_GEOMETRY-group
/NXvelocity_selector/OFF_GEOMETRY-group
/NXxraylens/OFF_GEOMETRY-group
offset
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/NXcalibration/offset-field
/NXcg_alpha_complex/offset-field
/NXdata/offset-field
offset_values
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on_the_fly_indexing
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operating_system
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/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/operating_system-field
/NXcs_computer/operating_system-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/operating_system-field
operation
/NXcsg/operation-field
operation_mode
/NXapm/ENTRY/operation_mode-field
operator
/NXtransmission/ENTRY/operator-group
optical_loss
/NXbeam_splitter/optical_loss-field
optical_system_em
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM-group
optics
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/optics-group
orcid
/NXapm/ENTRY/USER/orcid-field
/NXapm_composition_space_results/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_selector/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/orcid-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/orcid-field
/NXem/ENTRY/USER/orcid-field
/NXem_ebsd/ENTRY/USER/orcid-field
/NXmpes/ENTRY/USER/orcid-field
/NXms/ENTRY/USER/orcid-field
/NXms_score_results/ENTRY/USER/orcid-field
/NXopt/ENTRY/USER/orcid-field
/NXsensor_scan/ENTRY/USER/orcid-field
/NXuser/ORCID-field
orcid_platform
/NXapm/ENTRY/USER/orcid_platform-field
/NXapm_composition_space_results/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_selector/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/orcid_platform-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/orcid_platform-field
/NXem/ENTRY/USER/orcid_platform-field
/NXem_ebsd/ENTRY/USER/orcid_platform-field
/NXms/ENTRY/USER/orcid_platform-field
/NXms_score_results/ENTRY/USER/orcid_platform-field
order_no
/NXcrystal/order_no-field
orientation
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_ELLIPSOID_SET/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/face_normal/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/face_normal/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/face_normal/orientation-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/vertex_normal/orientation-field
/NXcg_ellipsoid_set/orientation-field
/NXcg_hexahedron_set/orientation-group
/NXcg_parallelogram_set/orientation-group
/NXcg_unit_normal_set/orientation-field
/NXcontainer/orientation-group
/NXem_ebsd/ENTRY/experiment/indexing/orientation-field
/NXgeometry/ORIENTATION-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/volume_statistics/orientation-field
/NXorientation_set/orientation-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation-group
orientation_angle
/NXbeam_path/window_NUMBER/orientation_angle-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/orientation_angle-field
orientation_matrix
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/NXfilter/orientation_matrix-field
/NXlauetof/entry/sample/orientation_matrix-field
/NXsample/orientation_matrix-field
/NXsample_component/orientation_matrix-field
/NXtas/entry/SAMPLE/orientation_matrix-field
/NXxbase/entry/sample/orientation_matrix-field
orientation_model
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orientation_parameterization
/NXem_ebsd/ENTRY/experiment/indexing/orientation_parameterization-field
orientation_parameterization_sign_convention
/NXem_ebsd/ENTRY/conventions/rotation_conventions/orientation_parameterization_sign_convention-field
/NXem_ebsd_conventions/rotation_conventions/orientation_parameterization_sign_convention-field
/NXms/ENTRY/conventions/rotation_conventions/orientation_parameterization_sign_convention-field
/NXms_score_results/ENTRY/conventions/rotation_conventions/orientation_parameterization_sign_convention-field
origin
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/origin-field
/NXcg_grid/origin-field
/NXem_ebsd/ENTRY/conventions/detector_reference_frame/origin-field
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame/origin-field
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/origin-field
/NXem_ebsd/ENTRY/conventions/sample_reference_frame/origin-field
/NXem_ebsd/ENTRY/experiment/acquisition/origin-field
/NXem_ebsd/ENTRY/experiment/calibration/origin-field
/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/origin-field
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/NXem_ebsd_conventions/gnomonic_projection_reference_frame/origin-field
/NXem_ebsd_conventions/processing_reference_frame/origin-field
/NXem_ebsd_conventions/sample_reference_frame/origin-field
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/NXms/ENTRY/conventions/sample_reference_frame/origin-field
/NXms_score_results/ENTRY/ROI_SET/grid/origin-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/origin-field
/NXms_score_results/ENTRY/conventions/sample_reference_frame/origin-field
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/NXsnsevent/ENTRY/instrument/CRYSTAL/origin-group
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original_axis
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original_centre
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original_points
/NXdistortion/original_points-field
other_material
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/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/other_material-field
other_shape
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/NXpolarizer_opt/SHAPE/other_shape-field
other_type
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/NXlens_opt/other_type-field
/NXwaveplate/other_type-field
outer_diameter
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outer_half_angle
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outermost_zone_width
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output
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/NXsqom/ENTRY/reduction/output-group
overlaps
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packing_fraction
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pair_separation
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parallelogram
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parallelograms
/NXcg_parallelogram_set/parallelograms-group
parameter
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/parameter-group
/NXapm/ENTRY/atom_probe/reconstruction/parameter-field
/NXem_ebsd/ENTRY/experiment/indexing/parameter-group
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/PARAMETER-group
parameter_type
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/PARAMETER/parameter_type-field
parameter_type_name
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/PARAMETER/parameter_type_name-field
parameter_units
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER/parameter_units-field
/NXdispersion_repeated_parameter/parameter_units-field
parameterization
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/NXorientation_set/parameterization-field
parameters
/NXentry/PARAMETERS-group
/NXquadric/parameters-field
/NXsubentry/PARAMETERS-group
/NXtomoproc/entry/reconstruction/parameters-group
/NXxasproc/ENTRY/XAS_data_reduction/parameters-group
parent
/NXregion/parent-field
parent_identifier
/NXms_feature_set/parent_identifier-field
parent_mask
/NXregion/parent_mask-field
partiality
/NXreflections/partiality-field
pass_energy
/NXarpes/ENTRY/INSTRUMENT/analyser/pass_energy-field
/NXenergydispersion/pass_energy-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/pass_energy-field
patch_identifier_filter
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path
/NXem_ebsd/ENTRY/experiment/acquisition/path-field
/NXem_ebsd/ENTRY/experiment/calibration/path-field
/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/path-field
path_length
/NXsample/path_length-field
path_length_window
/NXsample/path_length_window-field
pattern_centre
/NXem_ebsd/ENTRY/conventions/pattern_centre-group
/NXem_ebsd_conventions/pattern_centre-group
pattern_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/pattern_identifier-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/pattern_identifier-field
/NXimage_set_em_kikuchi/stack/pattern_identifier-field
peak
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK-group
/NXspectrum_set_em_xray/indexing/PEAK-group
peak_identification
/NXapm/ENTRY/atom_probe/ranging/peak_identification-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification-group
peak_model
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PEAK/peak_model-field
/NXpeak/peak_model-field
peak_power
/NXbeam_path/SOURCE/peak_power-field
peak_search_and_deconvolution
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution-group
peaks
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/peaks-field
performance
/NXapm_composition_space_results/ENTRY/performance-group
/NXapm_paraprobe_config_distancer/ENTRY/performance-group
/NXapm_paraprobe_config_intersector/ENTRY/performance-group
/NXapm_paraprobe_config_nanochem/ENTRY/performance-group
/NXapm_paraprobe_config_ranger/ENTRY/performance-group
/NXapm_paraprobe_config_spatstat/ENTRY/performance-group
/NXapm_paraprobe_config_surfacer/ENTRY/performance-group
/NXapm_paraprobe_config_tessellator/ENTRY/performance-group
/NXapm_paraprobe_config_transcoder/ENTRY/performance-group
/NXapm_paraprobe_results_clusterer/ENTRY/performance-group
/NXapm_paraprobe_results_distancer/ENTRY/performance-group
/NXapm_paraprobe_results_intersector/ENTRY/performance-group
/NXapm_paraprobe_results_nanochem/ENTRY/performance-group
/NXapm_paraprobe_results_ranger/ENTRY/performance-group
/NXapm_paraprobe_results_selector/ENTRY/performance-group
/NXapm_paraprobe_results_spatstat/ENTRY/performance-group
/NXapm_paraprobe_results_surfacer/ENTRY/performance-group
/NXapm_paraprobe_results_tessellator/ENTRY/performance-group
/NXapm_paraprobe_results_transcoder/ENTRY/performance-group
/NXms_score_config/ENTRY/performance-group
/NXms_score_results/ENTRY/performance-group
period
/NXgrating/period-field
/NXsource/period-field
phase
/NXdisk_chopper/phase-field
/NXinsertion_device/phase-field
phase_identifier
/NXem_ebsd/ENTRY/correlation/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/phase_identifier-field
/NXem_ebsd/ENTRY/correlation/PROCESS/phase_identifier-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/phase_identifier-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/phase_identifier-field
/NXem_ebsd/ENTRY/experiment/indexing/phase_identifier-field
/NXem_ebsd_crystal_structure_model/phase_identifier-field
phase_matching
/NXem_ebsd/ENTRY/experiment/indexing/phase_matching-field
phase_matching_descriptor
/NXem_ebsd/ENTRY/experiment/indexing/phase_matching_descriptor-field
phase_name
/NXem_ebsd/ENTRY/correlation/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/phase_name-field
/NXem_ebsd/ENTRY/correlation/PROCESS/phase_name-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/phase_name-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/phase_name-field
/NXem_ebsd_crystal_structure_model/phase_name-field
phi
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/delocalization/isosurfacing/phi-field
/NXxeuler/entry/name/phi-link
/NXxeuler/entry/sample/phi-field
/NXxkappa/entry/name/phi-link
/NXxkappa/entry/sample/phi-field
pid
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/PID-group
pinhole
/NXbeam_path/PINHOLE-group
pinhole_position
/NXapm/ENTRY/atom_probe/pulser/SOURCE/BEAM/pinhole_position-group
/NXpulser_apm/SOURCE/BEAM/pinhole_position-group
pitch
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/pitch-field
/NXcanSAS/ENTRY/SAMPLE/pitch-field
pixel_id
/NXsnsevent/ENTRY/instrument/DETECTOR/pixel_id-field
/NXsnshisto/ENTRY/DATA/pixel_id-link
/NXsnshisto/ENTRY/instrument/DETECTOR/pixel_id-field
pixel_mask
/NXdetector/pixel_mask-field
/NXdetector_channel/pixel_mask-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask-field
pixel_mask_applied
/NXdetector/pixel_mask_applied-field
/NXdetector_channel/pixel_mask_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/pixel_mask_applied-field
pixel_time
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/pixel_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/ebeam_deflector/pixel_time-field
/NXscanbox_em/pixel_time-field
plane_miller
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/plane_miller-field
/NXem_ebsd_crystal_structure_model/plane_miller-field
plot
/NXdispersive_material/ENTRY/dispersion_x/plot-group
/NXdispersive_material/ENTRY/dispersion_y/plot-group
/NXdispersive_material/ENTRY/dispersion_z/plot-group
/NXopt/ENTRY/plot-group
point_group
/NXem_ebsd_crystal_structure_model/point_group-field
/NXsample/point_group-field
/NXsample_component/point_group-field
point_normal_form
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/initial_interface/point_normal_form-field
point_set
/NXcg_alpha_complex/point_set-group
/NXms/ENTRY/ROI_SET/point_set-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/point_set-group
point_set_wrapping
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING-group
point_to_triangle
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle-group
point_to_triangle_set
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set-group
points
/NXms_feature_set/points-group
poison_depth
/NXmoderator/poison_depth-field
poison_material
/NXmoderator/poison_material-field
polar
/NXspe/ENTRY/data/polar-field
polar_angle
/NXcrystal/polar_angle-field
/NXdetector/polar_angle-field
/NXindirecttof/entry/INSTRUMENT/analyser/polar_angle-field
/NXlauetof/entry/instrument/detector/polar_angle-field
/NXmonopd/entry/DATA/polar_angle-link
/NXmonopd/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXreflections/polar_angle-field
/NXrefscan/entry/data/polar_angle-link
/NXrefscan/entry/instrument/DETECTOR/polar_angle-field
/NXreftof/entry/instrument/detector/polar_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/polar_angle-field
/NXsastof/ENTRY/instrument/detector/polar_angle-field
/NXsnsevent/ENTRY/instrument/DETECTOR/polar_angle-field
/NXsnshisto/ENTRY/instrument/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/DETECTOR/polar_angle-field
/NXtas/entry/INSTRUMENT/analyser/polar_angle-field
/NXtas/entry/SAMPLE/polar_angle-field
/NXtofnpd/entry/INSTRUMENT/detector/polar_angle-field
/NXtofraw/entry/instrument/detector/polar_angle-field
/NXtofsingle/entry/INSTRUMENT/detector/polar_angle-field
/NXxeuler/entry/instrument/detector/polar_angle-field
/NXxeuler/entry/name/polar_angle-link
/NXxkappa/entry/instrument/detector/polar_angle-field
/NXxkappa/entry/name/polar_angle-link
/NXxnb/entry/instrument/detector/polar_angle-field
/NXxnb/entry/name/polar_angle-link
/NXxrot/entry/instrument/detector/polar_angle-field
polar_width
/NXspe/ENTRY/data/polar_width-field
polarizer
/NXinstrument/POLARIZER-group
/NXsnsevent/ENTRY/instrument/POLARIZER-group
/NXsnshisto/ENTRY/instrument/POLARIZER-group
/NXtransmission/ENTRY/instrument/polarizer-field
polarizer_angle
/NXpolarizer_opt/polarizer_angle-field
polarizer_opt
/NXbeam_path/POLARIZER_OPT-group
polarizing
/NXbeam_splitter/polarizing-field
poles
/NXinsertion_device/poles-field
polygons
/NXcg_polygon_set/polygons-group
polyhedra
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/polyhedra-group
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra-group
/NXcg_polyhedron_set/polyhedra-group
polyhedron
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron-group
/NXcg_polyhedron_set/polyhedron-group
polyhedron_half_edge
/NXcg_polyhedron_set/polyhedron_half_edge-group
polyhedron_set
/NXms/ENTRY/ROI_SET/polyhedron_set-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/polyhedron_set-group
polylines
/NXcg_polyline_set/polylines-field
position
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/position-field
/NXcg_grid/position-field
/NXcg_half_edge_data_structure/position-field
/NXcg_point_set/position-field
/NXem/ENTRY/em_lab/stage_lab/position-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/position-field
/NXenvironment/position-group
/NXpeak/position-field
/NXstage_lab/position-field
position_x
/NXxpcs/entry/sample/position_x-group
position_y
/NXxpcs/entry/sample/position_y-group
position_z
/NXxpcs/entry/sample/position_z-group
positioner
/NXaperture/POSITIONER-group
/NXinstrument/POSITIONER-group
/NXmanipulator/POSITIONER-group
/NXsample/POSITIONER-group
/NXsnsevent/ENTRY/DASlogs/POSITIONER-group
/NXsnshisto/ENTRY/DASlogs/POSITIONER-group
/NXstage_lab/POSITIONER-group
power
/NXapm/ENTRY/atom_probe/pulser/SOURCE/power-field
/NXinsertion_device/power-field
/NXpulser_apm/SOURCE/power-field
/NXsource/power-field
power_loss
/NXfiber/power_loss-field
pre_factor
/NXms_score_config/ENTRY/dispersoid_drag_model/zener_smith_parameter/pre_factor-field
pre_sample_flightpath
/NXentry/pre_sample_flightpath-field
/NXsubentry/pre_sample_flightpath-field
/NXtofnpd/entry/pre_sample_flightpath-field
/NXtofraw/entry/pre_sample_flightpath-field
/NXtofsingle/entry/pre_sample_flightpath-field
predicted_frame
/NXreflections/predicted_frame-field
predicted_phi
/NXreflections/predicted_phi-field
predicted_px_x
/NXreflections/predicted_px_x-field
predicted_px_y
/NXreflections/predicted_px_y-field
predicted_x
/NXreflections/predicted_x-field
predicted_y
/NXreflections/predicted_y-field
preparation_date
/NXapm/ENTRY/specimen/preparation_date-field
/NXarchive/entry/sample/preparation_date-field
/NXem/ENTRY/sample/preparation_date-field
/NXmpes/ENTRY/SAMPLE/preparation_date-field
/NXopt/ENTRY/SAMPLE/preparation_date-field
/NXsample/preparation_date-field
preparation_description
/NXmpes/ENTRY/SAMPLE/preparation_description-group
preprocessing_kernel_width
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/preprocessing_kernel_width-field
preprocessing_method
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing/preprocessing_method-field
preset
/NXfluo/entry/MONITOR/preset-field
/NXlauetof/entry/control/preset-field
/NXmonitor/preset-field
/NXmonopd/entry/MONITOR/preset-field
/NXrefscan/entry/control/preset-field
/NXreftof/entry/control/preset-field
/NXsas/ENTRY/MONITOR/preset-field
/NXsastof/ENTRY/control/preset-field
/NXtas/entry/MONITOR/preset-field
/NXtofnpd/entry/MONITOR/preset-field
/NXtofraw/entry/MONITOR/preset-field
/NXtofsingle/entry/MONITOR/preset-field
/NXxas/ENTRY/MONITOR/preset-field
/NXxbase/entry/control/preset-field
pressure
/NXapm/ENTRY/atom_probe/analysis_chamber/pressure-field
/NXapm/ENTRY/atom_probe/buffer_chamber/pressure-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/pressure-field
/NXarchive/entry/sample/pressure-field
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/pressure-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/pressure-group
/NXsample/pressure-field
prf_cc
/NXreflections/prf_cc-field
probability_mass
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/knn/probability_mass-field
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/rdf/probability_mass-field
probe
/NXarchive/entry/instrument/SOURCE/probe-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/probe-field
/NXebeam_column/electron_source/probe-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/probe-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_source/probe-group
/NXfluo/entry/INSTRUMENT/SOURCE/probe-field
/NXibeam_column/ion_source/probe-group
/NXiqproc/ENTRY/instrument/SOURCE/probe-field
/NXmonopd/entry/INSTRUMENT/SOURCE/probe-field
/NXmpes/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXrefscan/entry/instrument/SOURCE/probe-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXsastof/ENTRY/instrument/source/probe-field
/NXsnsevent/ENTRY/instrument/SNS/probe-field
/NXsnshisto/ENTRY/instrument/SNS/probe-field
/NXsource/probe-field
/NXsqom/ENTRY/instrument/SOURCE/probe-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXtas/entry/INSTRUMENT/SOURCE/probe-field
/NXtomo/entry/instrument/SOURCE/probe-field
/NXtomophase/entry/instrument/SOURCE/probe-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/probe-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/probe-field
/NXxbase/entry/instrument/source/probe-field
procedure
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/window_correction/procedure-field
process
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/triangle_soup/PROCESS-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS-group
/NXapm_paraprobe_config_transcoder/ENTRY/PROCESS-group
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS-group
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS-group
/NXapm_paraprobe_results_intersector/ENTRY/PROCESS-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS-group
/NXapm_paraprobe_results_selector/ENTRY/PROCESS-group
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS-group
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS-group
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS-group
/NXcanSAS/ENTRY/PROCESS-group
/NXcorrector_cs/ZEMLIN_TABLEAU/PROCESS-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS-group
/NXem_ebsd/ENTRY/correlation/PROCESS-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS-group
/NXentry/PROCESS-group
/NXimage_set/PROCESS-group
/NXimage_set_em_adf/PROCESS-group
/NXimage_set_em_kikuchi/PROCESS-group
/NXinteraction_vol_em/PROCESS-group
/NXmpes/ENTRY/PROCESS-group
/NXsensor_scan/ENTRY/PROCESS-group
/NXspectrum_set/PROCESS-group
/NXspectrum_set_em_eels/PROCESS-group
/NXspectrum_set_em_xray/PROCESS-group
/NXsubentry/PROCESS-group
/NXxpcs/PROCESS-group
process_identifier
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/process_identifier-field
processing_reference_frame
/NXem_ebsd/ENTRY/conventions/processing_reference_frame-group
/NXem_ebsd_conventions/processing_reference_frame-group
/NXms/ENTRY/conventions/processing_reference_frame-group
/NXms_score_results/ENTRY/conventions/processing_reference_frame-group
profile
/NXmx/ENTRY/INSTRUMENT/BEAM/profile-field
program
/NXapm/ENTRY/PROGRAM-group
/NXapm/ENTRY/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/control_software/PROGRAM-group
/NXapm/ENTRY/atom_probe/control_software/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/hit_multiplicity/PROGRAM-group
/NXapm/ENTRY/atom_probe/hit_multiplicity/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ion_filtering/PROGRAM-group
/NXapm/ENTRY/atom_probe/ion_filtering/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ion_impact_positions/PROGRAM-group
/NXapm/ENTRY/atom_probe/ion_impact_positions/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/PROGRAM-group
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ranging/PROGRAM-group
/NXapm/ENTRY/atom_probe/ranging/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ranging/background_quantification/PROGRAM-group
/NXapm/ENTRY/atom_probe/ranging/background_quantification/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/PROGRAM-group
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_identification/PROGRAM-group
/NXapm/ENTRY/atom_probe/ranging/peak_identification/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PROGRAM-group
/NXapm/ENTRY/atom_probe/ranging/peak_search_and_deconvolution/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/reconstruction/PROGRAM-group
/NXapm/ENTRY/atom_probe/reconstruction/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/PROGRAM-group
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/PROGRAM/program-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/PROGRAM-group
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/PROGRAM/program-field
/NXapm_composition_space_results/ENTRY/PROGRAM-group
/NXapm_composition_space_results/ENTRY/PROGRAM/program-field
/NXapm_paraprobe_config_clusterer/ENTRY/program-field
/NXapm_paraprobe_config_distancer/ENTRY/program-field
/NXapm_paraprobe_config_intersector/ENTRY/program-field
/NXapm_paraprobe_config_nanochem/ENTRY/program-field
/NXapm_paraprobe_config_ranger/ENTRY/program-field
/NXapm_paraprobe_config_selector/ENTRY/program-field
/NXapm_paraprobe_config_spatstat/ENTRY/program-field
/NXapm_paraprobe_config_surfacer/ENTRY/program-field
/NXapm_paraprobe_config_tessellator/ENTRY/program-field
/NXapm_paraprobe_config_transcoder/ENTRY/program-field
/NXapm_paraprobe_results_clusterer/ENTRY/program-field
/NXapm_paraprobe_results_distancer/ENTRY/program-field
/NXapm_paraprobe_results_intersector/ENTRY/program-field
/NXapm_paraprobe_results_nanochem/ENTRY/program-field
/NXapm_paraprobe_results_ranger/ENTRY/program-field
/NXapm_paraprobe_results_selector/ENTRY/program-field
/NXapm_paraprobe_results_spatstat/ENTRY/program-field
/NXapm_paraprobe_results_surfacer/ENTRY/program-field
/NXapm_paraprobe_results_tessellator/ENTRY/program-field
/NXapm_paraprobe_results_transcoder/ENTRY/program-field
/NXarchive/entry/program-field
/NXcg_marching_cubes/program-field
/NXcs_prng/program-field
/NXdispersive_material/ENTRY/program-field
/NXellipsometry/ENTRY/INSTRUMENT/software/program-field
/NXem/ENTRY/PROGRAM-group
/NXem/ENTRY/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/PROGRAM/program-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/PROGRAM-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/PROGRAM/program-field
/NXem_ebsd/ENTRY/PROGRAM-group
/NXem_ebsd/ENTRY/PROGRAM/program-field
/NXem_ebsd/ENTRY/correlation/PROCESS/PROGRAM-group
/NXem_ebsd/ENTRY/correlation/PROCESS/PROGRAM/program-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/PROGRAM-group
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/PROGRAM/program-field
/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/PROGRAM-group
/NXem_ebsd/ENTRY/experiment/indexing/on_the_fly_indexing/PROGRAM/program-field
/NXem_ebsd/ENTRY/simulation/PROGRAM-group
/NXem_ebsd/ENTRY/simulation/PROGRAM/program-field
/NXenvironment/program-field
/NXimage_set/PROCESS/PROGRAM-group
/NXimage_set_em_adf/PROCESS/program-field
/NXiqproc/ENTRY/reduction/program-field
/NXms/ENTRY/PROGRAM-group
/NXms_score_config/ENTRY/PROGRAM-group
/NXms_score_results/ENTRY/PROGRAM-group
/NXopt/ENTRY/INSTRUMENT/software/program-field
/NXopt/ENTRY/data_collection/data_software/program-field
/NXopt/ENTRY/derived_parameters/ANALYSIS_program/program-field
/NXprocess/program-field
/NXprogram/program-field
/NXsensor_scan/ENTRY/PROCESS/program-field
/NXspectrum_set/PROCESS/PROGRAM-group
/NXspectrum_set_em_eels/PROCESS/program-field
/NXspectrum_set_em_xray/PROCESS/program-field
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/program-field
/NXspectrum_set_em_xray/indexing/program-field
/NXsqom/ENTRY/reduction/program-field
/NXtomoproc/entry/reconstruction/program-field
/NXxasproc/ENTRY/XAS_data_reduction/program-field
program_name
/NXentry/program_name-field
/NXms/ENTRY/PROGRAM/program_name-field
/NXms_score_config/ENTRY/PROGRAM/program_name-field
/NXms_score_results/ENTRY/PROGRAM/program_name-field
/NXspe/ENTRY/program_name-field
/NXsubentry/program_name-field
projection
/NXcollectioncolumn/projection-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/projection-field
projection_direction
/NXem_ebsd/ENTRY/correlation/PROCESS/projection_direction-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/projection_direction-field
protocol_name
/NXapm/ENTRY/atom_probe/reconstruction/protocol_name-field
proton_charge
/NXsnsevent/ENTRY/proton_charge-field
/NXsnshisto/ENTRY/proton_charge-field
proxies
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies-group
proxies_close_to_edge
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge-group
proxies_far_from_edge
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge-group
psi
/NXspe/ENTRY/NXSPE_info/psi-field
pulse_energy
/NXapm/ENTRY/atom_probe/pulser/SOURCE/pulse_energy-field
/NXpulser_apm/SOURCE/pulse_energy-field
pulse_fraction
/NXapm/ENTRY/atom_probe/pulser/pulse_fraction-field
/NXpulser_apm/pulse_fraction-field
pulse_frequency
/NXapm/ENTRY/atom_probe/pulser/pulse_frequency-field
/NXpulser_apm/pulse_frequency-field
pulse_height
/NXevent_data/pulse_height-field
pulse_id
/NXapm/ENTRY/atom_probe/hit_multiplicity/pulse_id-field
pulse_mode
/NXapm/ENTRY/atom_probe/pulser/pulse_mode-field
/NXpulser_apm/pulse_mode-field
pulse_number
/NXpulser_apm/pulse_number-field
pulse_shape
/NXmoderator/pulse_shape-group
/NXsource/pulse_shape-group
pulse_time
/NXsnsevent/ENTRY/EVENT_DATA/pulse_time-link
/NXsnsevent/ENTRY/instrument/DETECTOR/pulse_time-field
pulse_width
/NXsource/pulse_width-field
pulsed_voltage
/NXapm/ENTRY/atom_probe/pulser/pulsed_voltage-field
/NXpulser_apm/pulsed_voltage-field
pulser
/NXapm/ENTRY/atom_probe/pulser-group
pulses_since_last_ion
/NXapm/ENTRY/atom_probe/hit_multiplicity/pulses_since_last_ion-field
pump
/NXem/ENTRY/em_lab/PUMP-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/PUMP-group
pv_sensor
/NXpid/pv_sensor-group
q
/NXcanSAS/ENTRY/DATA/Q-field
qdev
/NXcanSAS/ENTRY/DATA/Qdev-field
qh
/NXtas/entry/DATA/qh-link
/NXtas/entry/SAMPLE/qh-field
qk
/NXtas/entry/DATA/qk-link
/NXtas/entry/SAMPLE/qk-field
ql
/NXtas/entry/DATA/ql-link
/NXtas/entry/SAMPLE/ql-field
qmean
/NXcanSAS/ENTRY/DATA/Qmean-field
quadric
/NXsolid_geometry/QUADRIC-group
qx
/NXiqproc/ENTRY/DATA/qx-field
/NXsqom/ENTRY/DATA/qx-field
qy
/NXiqproc/ENTRY/DATA/qy-field
/NXsqom/ENTRY/DATA/qy-field
qz
/NXsqom/ENTRY/DATA/qz-field
r_5
/NXaberration_model_ceos/r_5-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5-group
r_slit
/NXfermi_chopper/r_slit-field
radiation
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/radiation-field
radii
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/CG_CYLINDER_SET/radii-field
/NXcg_cylinder_set/radii-field
/NXcg_sphere_set/radii-field
radius
/NXcg_sphere_set/radius-field
/NXdisk_chopper/radius-field
/NXfermi_chopper/radius-field
/NXms_score_config/ENTRY/dispersoid_drag_model/zener_smith_parameter/radius-field
/NXvelocity_selector/radius-field
random_number_generator
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/random_number_generator-group
randomize_ion_types
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/randomize_ion_types-field
range
/NXmonitor/range-field
range_increment
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_increment-field
range_minmax
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/range_minmax-field
ranging
/NXapm/ENTRY/atom_probe/ranging-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging-group
ratio
/NXdisk_chopper/ratio-field
raw
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/DETECTOR/DATA/raw-field
raw_file
/NXtomoproc/entry/reconstruction/parameters/raw_file-field
/NXxasproc/ENTRY/XAS_data_reduction/parameters/raw_file-field
raw_frames
/NXsnsevent/ENTRY/raw_frames-field
/NXsnshisto/ENTRY/raw_frames-field
raw_time_of_flight
/NXdetector/raw_time_of_flight-field
raw_tof
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/raw_tof-field
raw_value
/NXlog/raw_value-field
/NXpositioner/raw_value-field
rdeform_field
/NXdistortion/rdeform_field-field
rdf
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics/rdf-group
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/rdf-group
read_bfield_current
/NXseparator/read_Bfield_current-group
/NXspin_rotator/read_Bfield_current-group
read_bfield_voltage
/NXseparator/read_Bfield_voltage-group
/NXspin_rotator/read_Bfield_voltage-group
read_current
/NXelectrostatic_kicker/read_current-group
/NXmagnetic_kicker/read_current-group
/NXquadrupole_magnet/read_current-group
/NXsolenoid_magnet/read_current-group
read_efield_current
/NXseparator/read_Efield_current-group
/NXspin_rotator/read_Efield_current-group
read_efield_voltage
/NXseparator/read_Efield_voltage-group
/NXspin_rotator/read_Efield_voltage-group
read_voltage
/NXelectrostatic_kicker/read_voltage-group
/NXmagnetic_kicker/read_voltage-group
/NXquadrupole_magnet/read_voltage-group
/NXsolenoid_magnet/read_voltage-group
real_time
/NXdetector/real_time-field
realloc_cell_cache
/NXms_score_config/ENTRY/numerics/realloc_cell_cache-field
reconstructed_positions
/NXapm/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/reconstruction/reconstructed_positions-field
reconstruction
/NXapm/ENTRY/atom_probe/reconstruction-group
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/reconstruction-group
/NXtomoproc/entry/reconstruction-group
recover_evaporation_id
/NXapm_paraprobe_config_clusterer/ENTRY/cameca_to_nexus/recover_evaporation_id-field
recrystallization_front
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front-group
recrystallization_kinetics
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_kinetics-group
recrystallized_grain_identifier
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/recrystallized_grain_identifier-field
recrystallized_kinetics
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallized_kinetics-group
recrystallized_volume_fraction
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/recrystallized_volume_fraction-field
rediscretization
/NXms_score_config/ENTRY/solitary_unit_model/rediscretization-field
reduction
/NXiqproc/ENTRY/reduction-group
/NXsqom/ENTRY/reduction-group
ref_attenuator
/NXtransmission/ENTRY/instrument/ref_attenuator-group
reference_burgers_magnitude
/NXms_score_config/ENTRY/material_properties/reference_burgers_magnitude-field
reference_data_link
/NXbeam_path/window_NUMBER/reference_data_link-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/window_correction/reference_data_link-field
/NXopt/ENTRY/data_collection/reference_data_link-field
reference_frame_type
/NXem_ebsd/ENTRY/conventions/detector_reference_frame/reference_frame_type-field
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame/reference_frame_type-field
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/reference_frame_type-field
/NXem_ebsd/ENTRY/conventions/sample_reference_frame/reference_frame_type-field
/NXem_ebsd_conventions/detector_reference_frame/reference_frame_type-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/reference_frame_type-field
/NXem_ebsd_conventions/processing_reference_frame/reference_frame_type-field
/NXem_ebsd_conventions/sample_reference_frame/reference_frame_type-field
/NXms/ENTRY/conventions/processing_reference_frame/reference_frame_type-field
/NXms/ENTRY/conventions/sample_reference_frame/reference_frame_type-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/reference_frame_type-field
/NXms_score_results/ENTRY/conventions/sample_reference_frame/reference_frame_type-field
reference_measurement
/NXcontainer/reference_measurement-link
reference_plane
/NXbeam/TRANSFORMATIONS/reference_plane-field
reference_shear_modulus
/NXms_score_config/ENTRY/material_properties/reference_shear_modulus-field
references
/NXdispersive_material/ENTRY/REFERENCES-group
reflectance
/NXbeam_splitter/reflectance-field
/NXlens_opt/reflectance-field
/NXwaveplate/reflectance-field
reflection
/NXcrystal/reflection-field
/NXpolarizer/reflection-field
/NXpolarizer_opt/reflection-field
reflection_id
/NXreflections/reflection_id-field
reflectivity
/NXcrystal/reflectivity-group
/NXguide/reflectivity-group
/NXmirror/reflectivity-group
/NXopt/ENTRY/derived_parameters/reflectivity-field
reflectron
/NXapm/ENTRY/atom_probe/REFLECTRON-group
refractive_index
/NXdispersion_table/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/refractive_index-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/refractive_index-field
region_of_interest
/NXem_ebsd/ENTRY/correlation/region_of_interest-group
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest-group
region_origin
/NXarpes/ENTRY/INSTRUMENT/analyser/region_origin-field
region_size
/NXarpes/ENTRY/INSTRUMENT/analyser/region_size-field
relation
/NXgraph_root/relation-group
relative_intensity
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/relative_intensity-field
/NXem_ebsd_crystal_structure_model/relative_intensity-field
relative_molecular_mass
/NXcontainer/relative_molecular_mass-field
/NXsample/relative_molecular_mass-field
/NXsample_component/relative_molecular_mass-field
relay
/NXcircuit_board/relay-field
release_date
/NXarchive/entry/release_date-field
removal
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/removal-field
representation
/NXdispersion_function/representation-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/representation-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/representation-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/representation-field
requested_pixel_time
/NXscanbox_em/requested_pixel_time-field
response_time
/NXtransmission/ENTRY/instrument/DETECTOR/response_time-field
results_path
/NXapm_composition_space_results/ENTRY/results_path-field
/NXapm_paraprobe_config_distancer/ENTRY/results_path-field
/NXapm_paraprobe_config_intersector/ENTRY/results_path-field
/NXapm_paraprobe_config_nanochem/ENTRY/results_path-field
/NXapm_paraprobe_config_ranger/ENTRY/results_path-field
/NXapm_paraprobe_config_spatstat/ENTRY/results_path-field
/NXapm_paraprobe_config_surfacer/ENTRY/results_path-field
/NXapm_paraprobe_config_tessellator/ENTRY/results_path-field
/NXapm_paraprobe_config_transcoder/ENTRY/results_path-field
/NXapm_paraprobe_results_clusterer/ENTRY/results_path-field
/NXapm_paraprobe_results_distancer/ENTRY/results_path-field
/NXapm_paraprobe_results_intersector/ENTRY/results_path-field
/NXapm_paraprobe_results_nanochem/ENTRY/results_path-field
/NXapm_paraprobe_results_ranger/ENTRY/results_path-field
/NXapm_paraprobe_results_spatstat/ENTRY/results_path-field
/NXapm_paraprobe_results_surfacer/ENTRY/results_path-field
/NXapm_paraprobe_results_tessellator/ENTRY/results_path-field
/NXapm_paraprobe_results_transcoder/ENTRY/results_path-field
/NXms_score_config/ENTRY/results_path-field
/NXms_score_results/ENTRY/results_path-field
retardance
/NXwaveplate/retardance-field
revision
/NXarchive/entry/revision-field
/NXentry/revision-field
/NXsubentry/revision-field
revolutions
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element/revolutions-field
roi
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/ROI-group
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi-group
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi-group
roi_cylinder_height
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_height-field
roi_cylinder_radius
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/composition_profiling/roi_cylinder_radius-field
roi_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/roi_identifier-field
roi_selection
/NXapm_paraprobe_config_selector/ENTRY/roi_selection-group
roi_set
/NXms/ENTRY/ROI_SET-group
/NXms_score_results/ENTRY/ROI_SET-group
role
/NXapm/ENTRY/USER/role-field
/NXapm_composition_space_results/ENTRY/USER/role-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/role-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/role-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/role-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/role-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/role-field
/NXapm_paraprobe_results_selector/ENTRY/USER/role-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/role-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/role-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/role-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/role-field
/NXarchive/entry/user/role-field
/NXem/ENTRY/USER/role-field
/NXem_ebsd/ENTRY/USER/role-field
/NXms/ENTRY/USER/role-field
/NXms_score_results/ENTRY/USER/role-field
/NXsnsevent/ENTRY/USER/role-field
/NXsnshisto/ENTRY/USER/role-field
/NXuser/role-field
roll
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/roll-field
/NXcanSAS/ENTRY/SAMPLE/roll-field
rollett_holm_parameters
/NXms_score_config/ENTRY/grain_boundary_mobility_model/rollett_holm_parameters-group
rotating_element
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/rotating_element-group
rotating_element_type
/NXellipsometry/ENTRY/INSTRUMENT/rotating_element_type-field
rotation
/NXem/ENTRY/em_lab/stage_lab/rotation-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/rotation-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation-field
/NXscanbox_em/rotation-field
/NXstage_lab/rotation-field
rotation_angle
/NXmonopd/entry/SAMPLE/rotation_angle-field
/NXrefscan/entry/data/rotation_angle-link
/NXrefscan/entry/sample/rotation_angle-field
/NXreftof/entry/sample/rotation_angle-field
/NXsample/rotation_angle-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/rotation_angle-field
/NXsastof/ENTRY/instrument/detector/rotation_angle-field
/NXscan/ENTRY/DATA/rotation_angle-link
/NXscan/ENTRY/SAMPLE/rotation_angle-field
/NXspe/ENTRY/SAMPLE/rotation_angle-field
/NXstxm/ENTRY/SAMPLE/rotation_angle-field
/NXtas/entry/INSTRUMENT/analyser/rotation_angle-field
/NXtas/entry/INSTRUMENT/monochromator/rotation_angle-field
/NXtas/entry/SAMPLE/rotation_angle-field
/NXtomo/entry/data/rotation_angle-link
/NXtomo/entry/sample/rotation_angle-field
/NXtomophase/entry/data/rotation_angle-link
/NXtomophase/entry/sample/rotation_angle-field
/NXxeuler/entry/name/rotation_angle-link
/NXxeuler/entry/sample/rotation_angle-field
/NXxkappa/entry/name/rotation_angle-link
/NXxkappa/entry/sample/rotation_angle-field
/NXxnb/entry/name/rotation_angle-link
/NXxnb/entry/sample/rotation_angle-field
/NXxrot/entry/name/rotation_angle-link
/NXxrot/entry/sample/rotation_angle-field
rotation_angle_step
/NXxrot/entry/sample/rotation_angle_step-field
rotation_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/rotation_control-field
rotation_convention
/NXem_ebsd/ENTRY/conventions/rotation_conventions/rotation_convention-field
/NXem_ebsd_conventions/rotation_conventions/rotation_convention-field
/NXms/ENTRY/conventions/rotation_conventions/rotation_convention-field
/NXms_score_results/ENTRY/conventions/rotation_conventions/rotation_convention-field
rotation_conventions
/NXem_ebsd/ENTRY/conventions/rotation_conventions-group
/NXem_ebsd_conventions/rotation_conventions-group
/NXms/ENTRY/conventions/rotation_conventions-group
/NXms_score_results/ENTRY/conventions/rotation_conventions-group
rotation_speed
/NXdirecttof/entry/INSTRUMENT/disk_chopper/rotation_speed-field
/NXdirecttof/entry/INSTRUMENT/fermi_chopper/rotation_speed-field
/NXdisk_chopper/rotation_speed-field
/NXfermi_chopper/rotation_speed-field
/NXvelocity_selector/rotation_speed-field
roughening_pump
/NXapm/ENTRY/atom_probe/roughening_pump-group
run
/NXcanSAS/ENTRY/run-field
run_control
/NXsensor/run_control-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/run_control-field
run_cycle
/NXarchive/entry/run_cycle-field
/NXentry/run_cycle-field
/NXsubentry/run_cycle-field
run_number
/NXapm/ENTRY/run_number-field
/NXsnsevent/ENTRY/run_number-field
/NXsnshisto/ENTRY/run_number-field
/NXtofraw/entry/run_number-field
s_3
/NXaberration_model_ceos/s_3-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3-group
s_5
/NXaberration_model_ceos/s_5-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5-group
sacrifice_isotopic_uniqueness
/NXapm_paraprobe_results_transcoder/ENTRY/atom_probe/ranging/peak_identification/ION/charge_model/sacrifice_isotopic_uniqueness-field
sample
/NXapm/ENTRY/sample-group
/NXarchive/entry/sample-group
/NXarpes/ENTRY/SAMPLE-group
/NXcanSAS/ENTRY/SAMPLE-group
/NXdispersive_material/ENTRY/sample-group
/NXellipsometry/ENTRY/SAMPLE-group
/NXem/ENTRY/sample-group
/NXentry/SAMPLE-group
/NXfluo/entry/SAMPLE-group
/NXiqproc/ENTRY/SAMPLE-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/SAMPLE-group
/NXlab_sample_mounting/ENTRY/SAMPLE-group
/NXlauetof/entry/sample-group
/NXmonopd/entry/SAMPLE-group
/NXmpes/ENTRY/SAMPLE-group
/NXmx/ENTRY/SAMPLE-group
/NXopt/ENTRY/SAMPLE-group
/NXrefscan/entry/sample-group
/NXreftof/entry/sample-group
/NXsas/ENTRY/SAMPLE-group
/NXsastof/ENTRY/sample-group
/NXscan/ENTRY/SAMPLE-group
/NXsensor_scan/ENTRY/SAMPLE-group
/NXsnsevent/ENTRY/sample-group
/NXsnshisto/ENTRY/sample-group
/NXspe/ENTRY/SAMPLE-group
/NXsqom/ENTRY/SAMPLE-group
/NXstxm/ENTRY/SAMPLE-group
/NXsubentry/SAMPLE-group
/NXtas/entry/SAMPLE-group
/NXtofnpd/entry/SAMPLE-group
/NXtofraw/entry/SAMPLE-group
/NXtofsingle/entry/SAMPLE-group
/NXtomo/entry/sample-group
/NXtomophase/entry/instrument/sample-group
/NXtomophase/entry/sample-group
/NXtomoproc/entry/SAMPLE-group
/NXtransmission/ENTRY/SAMPLE-group
/NXxas/ENTRY/SAMPLE-group
/NXxasproc/ENTRY/SAMPLE-group
/NXxbase/entry/sample-group
/NXxeuler/entry/sample-group
/NXxkappa/entry/sample-group
/NXxnb/entry/sample-group
/NXxpcs/entry/sample-group
/NXxrot/entry/sample-group
sample_1
/NXcxi_ptycho/sample_1-group
sample_attenuator
/NXtransmission/ENTRY/instrument/sample_attenuator-group
sample_bias
/NXmanipulator/sample_bias-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_bias-field
sample_component
/NXsample/SAMPLE_COMPONENT-group
/NXsample/sample_component-field
sample_history
/NXapm/ENTRY/specimen/sample_history-field
/NXem/ENTRY/sample/sample_history-field
/NXmpes/ENTRY/SAMPLE/sample_history-group
/NXopt/ENTRY/SAMPLE/sample_history-field
sample_id
/NXarchive/entry/sample/sample_id-field
sample_name
/NXopt/ENTRY/SAMPLE/sample_name-field
sample_orientation
/NXopt/ENTRY/SAMPLE/sample_orientation-field
/NXsample/sample_orientation-field
/NXsample_component/sample_orientation-field
sample_reference_frame
/NXem_ebsd/ENTRY/conventions/sample_reference_frame-group
/NXem_ebsd_conventions/sample_reference_frame-group
/NXms/ENTRY/conventions/sample_reference_frame-group
/NXms_score_results/ENTRY/conventions/sample_reference_frame-group
sample_stage
/NXopt/ENTRY/INSTRUMENT/sample_stage-group
sample_temperature
/NXmanipulator/sample_temperature-field
/NXmpes/ENTRY/INSTRUMENT/MANIPULATOR/sample_temperature-field
sample_type
/NXopt/ENTRY/SAMPLE/sample_type-field
sample_x
/NXstxm/ENTRY/DATA/sample_x-field
/NXstxm/ENTRY/INSTRUMENT/sample_x-group
sample_y
/NXstxm/ENTRY/DATA/sample_y-field
/NXstxm/ENTRY/INSTRUMENT/sample_y-group
sample_z
/NXstxm/ENTRY/INSTRUMENT/sample_z-group
sampled_fraction
/NXmonitor/sampled_fraction-field
saturation_value
/NXdetector/saturation_value-field
/NXdetector_channel/saturation_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/saturation_value-field
scalar_field_gradient
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient-group
scalar_field_magnitude
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude-group
scale
/NXregion/scale-field
scaling
/NXcalibration/scaling-field
scaling_factor
/NXdata/scaling_factor-field
scan_number
/NXxpcs/entry/scan_number-field
scan_point_identifier
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/scan_point_identifier-field
/NXimage_set_em_kikuchi/stack/scan_point_identifier-field
scan_point_positions
/NXem_ebsd/ENTRY/experiment/indexing/scan_point_positions-field
scattering_angle
/NXspindispersion/scattering_angle-field
scattering_cross_section
/NXattenuator/scattering_cross_section-field
scattering_energy
/NXspindispersion/scattering_energy-field
scattering_length_density
/NXsample/scattering_length_density-field
/NXsample_component/scattering_length_density-field
scattering_vector
/NXcrystal/scattering_vector-field
scheme
/NXcollectioncolumn/scheme-field
/NXenergydispersion/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/COLLECTIONCOLUMN/scheme-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/ENERGYDISPERSION/scheme-field
sdd
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/SDD-field
sebald_gottstein_parameters
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters-group
seblock
/NXspe/ENTRY/SAMPLE/seblock-field
seed
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/random_number_generator/seed-field
/NXcs_prng/seed-field
segment_columns
/NXcrystal/segment_columns-field
segment_gap
/NXcrystal/segment_gap-field
segment_height
/NXcrystal/segment_height-field
segment_rows
/NXcrystal/segment_rows-field
segment_thickness
/NXcrystal/segment_thickness-field
segment_width
/NXcrystal/segment_width-field
semi_convergence_angle
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/semi_convergence_angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/semi_convergence_angle-field
/NXoptical_system_em/semi_convergence_angle-field
sensor
/NXebeam_column/SENSOR-group
/NXenvironment/SENSOR-group
/NXibeam_column/SENSOR-group
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR-group
sensor_material
/NXdetector/sensor_material-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_material-field
sensor_size
/NXarpes/ENTRY/INSTRUMENT/analyser/sensor_size-field
sensor_thickness
/NXdetector/sensor_thickness-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/sensor_thickness-field
sensor_type
/NXfilter/sensor_type-group
sequence_index
/NXapm/ENTRY/atom_probe/hit_multiplicity/sequence_index-field
/NXapm/ENTRY/atom_probe/hit_quality_filtering/sequence_index-field
/NXapm/ENTRY/atom_probe/ion_filtering/sequence_index-field
/NXapm/ENTRY/atom_probe/ion_impact_positions/sequence_index-field
/NXapm/ENTRY/atom_probe/mass_to_charge_conversion/sequence_index-field
/NXapm/ENTRY/atom_probe/ranging/sequence_index-field
/NXapm/ENTRY/atom_probe/reconstruction/sequence_index-field
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/sequence_index-field
/NXapm_composition_space_results/ENTRY/clustering_composition_space/sequence_index-field
/NXapm_composition_space_results/ENTRY/clustering_real_space/sequence_index-field
/NXapm_composition_space_results/ENTRY/voxelization/sequence_index-field
/NXem_ebsd/ENTRY/correlation/sequence_index-field
/NXem_ebsd/ENTRY/experiment/acquisition/sequence_index-field
/NXem_ebsd/ENTRY/experiment/calibration/sequence_index-field
/NXem_ebsd/ENTRY/experiment/indexing/background_correction/sequence_index-field
/NXem_ebsd/ENTRY/experiment/indexing/binning/sequence_index-field
/NXem_ebsd/ENTRY/experiment/indexing/parameter/sequence_index-field
/NXem_ebsd/ENTRY/experiment/indexing/sequence_index-field
/NXem_ebsd/ENTRY/simulation/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/CLEANING_STEP/sequence_index-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/sequence_index-field
/NXnote/sequence_index-field
/NXprocess/sequence_index-field
sequence_number
/NXdetector/sequence_number-field
/NXtomophase/entry/instrument/bright_field/sequence_number-field
/NXtomophase/entry/instrument/dark_field/sequence_number-field
/NXtomophase/entry/instrument/sample/sequence_number-field
serial_number
/NXapm/ENTRY/atom_probe/ion_detector/serial_number-field
/NXdetector/serial_number-field
set_bfield_current
/NXseparator/set_Bfield_current-field
/NXspin_rotator/set_Bfield_current-field
set_current
/NXelectrostatic_kicker/set_current-field
/NXmagnetic_kicker/set_current-field
/NXquadrupole_magnet/set_current-field
/NXsolenoid_magnet/set_current-field
set_efield_voltage
/NXseparator/set_Efield_voltage-field
/NXspin_rotator/set_Efield_voltage-field
set_identifier
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/current_set/set_identifier-field
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/next_set/set_identifier-field
set_voltage
/NXelectrostatic_kicker/set_voltage-field
/NXmagnetic_kicker/set_voltage-field
setpoint
/NXpid/setpoint-field
sgl
/NXtas/entry/SAMPLE/sgl-field
sgu
/NXtas/entry/SAMPLE/sgu-field
shadowfactor
/NXcanSAS/ENTRY/DATA/ShadowFactor-field
shank_angle
/NXapm/ENTRY/atom_probe/specimen_monitoring/shank_angle-field
shape
/NXaperture/shape-field
/NXattenuator/shape-group
/NXbeam_splitter/SHAPE-group
/NXbeam_splitter/SHAPE/shape-field
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/shape-field
/NXcg_hexahedron_set/shape-field
/NXcg_parallelogram_set/shape-field
/NXcg_polygon_set/shape-field
/NXcontainer/shape-group
/NXcrystal/shape-group
/NXgeometry/SHAPE-group
/NXgrating/shape-group
/NXmirror/shape-group
/NXpolarizer_opt/SHAPE-group
/NXpolarizer_opt/SHAPE/shape-field
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE-group
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/shape-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape-group
/NXsastof/ENTRY/instrument/collimator/geometry/shape/shape-field
/NXshape/shape-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/shape-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/shape-field
shermann_function
/NXspindispersion/shermann_function-field
short_name
/NXenvironment/short_name-field
/NXsensor/short_name-field
short_title
/NXem/ENTRY/sample/short_title-field
/NXsample/short_title-field
sigma_x
/NXsource/sigma_x-field
sigma_y
/NXsource/sigma_y-field
sign_valid
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/sign_valid-group
signal_amplitude
/NXapm/ENTRY/atom_probe/ion_detector/signal_amplitude-field
signed_distance
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder/ROI/signed_distance-field
simulation
/NXem_ebsd/ENTRY/simulation-group
situation
/NXarchive/entry/sample/situation-field
/NXmpes/ENTRY/SAMPLE/situation-field
/NXsample/situation-field
size
/NXaperture/size-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/size-field
/NXbeam_splitter/SHAPE/size-field
/NXbeam_stop/size-field
/NXclustering/size-field
/NXpolarizer_opt/SHAPE/size-field
/NXsas/ENTRY/INSTRUMENT/COLLIMATOR/GEOMETRY/SHAPE/size-field
/NXsastof/ENTRY/instrument/collimator/geometry/shape/size-field
/NXshape/size-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/shape/size-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/shape/size-field
sketch
/NXbeam_splitter/SHAPE/sketch-group
/NXpolarizer_opt/SHAPE/sketch-group
slit
/NXbeam_path/MONOCHROMATOR/SLIT-group
/NXbeam_path/SLIT-group
/NXfermi_chopper/slit-field
/NXtransmission/ENTRY/instrument/DETECTOR/slit-group
slit_angle
/NXdisk_chopper/slit_angle-field
slit_edges
/NXdisk_chopper/slit_edges-field
slit_height
/NXdisk_chopper/slit_height-field
slit_length
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/slit_length-field
slits
/NXdisk_chopper/slits-field
slot
/NXdetector/slot-field
slow_axes
/NXelectronanalyser/slow_axes-field
/NXmpes/ENTRY/INSTRUMENT/ELECTRONANALYSER/slow_axes-field
slow_pixel_direction
/NXdetector_module/slow_pixel_direction-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/DETECTOR_MODULE/slow_pixel_direction-field
snapshot_set
/NXms/ENTRY/ROI_SET/snapshot_set-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set-group
snapshot_x
/NXms_score_config/ENTRY/numerics/snapshot_x-field
sns
/NXsnsevent/ENTRY/instrument/SNS-group
/NXsnshisto/ENTRY/instrument/SNS-group
snsbanking_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSbanking_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSbanking_file_name-field
snsdetector_calibration_id
/NXsnsevent/ENTRY/instrument/SNSdetector_calibration_id-field
/NXsnshisto/ENTRY/instrument/SNSdetector_calibration_id-field
snsgeometry_file_name
/NXsnsevent/ENTRY/instrument/SNSgeometry_file_name-field
/NXsnshisto/ENTRY/instrument/SNSgeometry_file_name-field
snshistotool
/NXsnsevent/ENTRY/SNSHistoTool-group
/NXsnshisto/ENTRY/SNSHistoTool-group
snsmapping_file_name
/NXsnsevent/ENTRY/SNSHistoTool/SNSmapping_file_name-field
/NXsnshisto/ENTRY/SNSHistoTool/SNSmapping_file_name-field
snstranslation_service
/NXsnsevent/ENTRY/instrument/SNStranslation_service-field
/NXsnshisto/ENTRY/instrument/SNStranslation_service-field
social_media_name
/NXapm/ENTRY/USER/social_media_name-field
/NXapm_composition_space_results/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_selector/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/social_media_name-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/social_media_name-field
/NXem/ENTRY/USER/social_media_name-field
/NXem_ebsd/ENTRY/USER/social_media_name-field
/NXms/ENTRY/USER/social_media_name-field
/NXms_score_results/ENTRY/USER/social_media_name-field
social_media_platform
/NXapm/ENTRY/USER/social_media_platform-field
/NXapm_composition_space_results/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_selector/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/social_media_platform-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/social_media_platform-field
/NXem/ENTRY/USER/social_media_platform-field
/NXem_ebsd/ENTRY/USER/social_media_platform-field
/NXms/ENTRY/USER/social_media_platform-field
/NXms_score_results/ENTRY/USER/social_media_platform-field
soft_limit_max
/NXpositioner/soft_limit_max-field
soft_limit_min
/NXpositioner/soft_limit_min-field
software
/NXellipsometry/ENTRY/INSTRUMENT/software-group
/NXopt/ENTRY/INSTRUMENT/software-group
solid_angle
/NXdetector/solid_angle-field
solitary_unit_model
/NXms_score_config/ENTRY/solitary_unit_model-group
soller_angle
/NXcollimator/soller_angle-field
source
/NXapm/ENTRY/atom_probe/pulser/SOURCE-group
/NXarchive/entry/instrument/SOURCE-group
/NXarpes/ENTRY/INSTRUMENT/SOURCE-group
/NXbeam_path/SOURCE-group
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/PROCESS/source-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/PROCESS/source-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/PROCESS/source-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/PROCESS/source-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/PROCESS/source-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/PROCESS/source-field
/NXfluo/entry/INSTRUMENT/SOURCE-group
/NXimage_set/PROCESS/source-field
/NXimage_set_em_adf/PROCESS/source-field
/NXinstrument/SOURCE-group
/NXiqproc/ENTRY/instrument/SOURCE-group
/NXmonopd/entry/INSTRUMENT/SOURCE-group
/NXmpes/ENTRY/INSTRUMENT/SOURCE-group
/NXmx/ENTRY/SOURCE-group
/NXpulser_apm/SOURCE-group
/NXrefscan/entry/instrument/SOURCE-group
/NXsas/ENTRY/INSTRUMENT/SOURCE-group
/NXsastof/ENTRY/instrument/source-group
/NXspectrum_set/PROCESS/source-field
/NXspectrum_set_em_eels/PROCESS/source-field
/NXspectrum_set_em_xray/PROCESS/source-field
/NXsqom/ENTRY/instrument/SOURCE-group
/NXstxm/ENTRY/INSTRUMENT/SOURCE-group
/NXtas/entry/INSTRUMENT/SOURCE-group
/NXtomo/entry/instrument/SOURCE-group
/NXtomophase/entry/instrument/SOURCE-group
/NXtomoproc/entry/INSTRUMENT/SOURCE-group
/NXtransmission/ENTRY/instrument/SOURCE-group
/NXxas/ENTRY/INSTRUMENT/SOURCE-group
/NXxbase/entry/instrument/source-group
/NXxlaue/entry/instrument/source-group
source_1
/NXcxi_ptycho/entry_1/instrument_1/source_1-group
source_distance_x
/NXbending_magnet/source_distance_x-field
source_distance_y
/NXbending_magnet/source_distance_y-field
source_type
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/light_source/source_type-field
space_group
/NXcrystal/space_group-field
/NXem_ebsd/ENTRY/correlation/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/space_group-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/space_group-field
/NXem_ebsd_crystal_structure_model/space_group-field
/NXsample/space_group-field
/NXsample_component/space_group-field
spatial_calibration
/NXmpes/ENTRY/PROCESS/spatial_calibration-group
spatial_distribution_model
/NXms_score_config/ENTRY/nucleation_model/spatial_distribution_model-field
spatial_filter
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter-group
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter-group
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter-group
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter-group
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter-group
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter-group
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter-group
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter-group
spatial_resolution
/NXelectronanalyser/spatial_resolution-field
spatial_statistics
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics-group
special_enthalpy
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/special_enthalpy-field
special_pre_factor
/NXms_score_config/ENTRY/grain_boundary_mobility_model/sebald_gottstein_parameters/special_pre_factor-field
specimen
/NXapm/ENTRY/specimen-group
/NXms/ENTRY/specimen-group
/NXms_score_results/ENTRY/specimen-group
specimen_monitoring
/NXapm/ENTRY/atom_probe/specimen_monitoring-group
spectral_range
/NXfiber/spectral_range-field
spectral_resolution
/NXbeam_path/MONOCHROMATOR/spectral_resolution-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/spectral_resolution-field
/NXtransmission/ENTRY/instrument/spectrometer/spectral_resolution-field
spectrometer
/NXellipsometry/ENTRY/INSTRUMENT/BEAM_PATH/spectrometer-group
/NXtransmission/ENTRY/instrument/spectrometer-group
spectrum
/NXbeam_path/GRATING/spectrum-field
/NXbeam_path/MONOCHROMATOR/spectrum-field
/NXbending_magnet/spectrum-group
/NXinsertion_device/spectrum-group
/NXtransmission/ENTRY/instrument/SOURCE/spectrum-field
spectrum_set
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET-group
/NXevent_data_em/SPECTRUM_SET-group
spindispersion
/NXelectronanalyser/SPINDISPERSION-group
splitting_ratio
/NXbeam_splitter/splitting_ratio-field
spot_position
/NXapm/ENTRY/atom_probe/pulser/SOURCE/BEAM/spot_position-group
/NXpulser_apm/SOURCE/BEAM/spot_position-group
spwidth
/NXvelocity_selector/spwidth-field
stack
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/stack-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack-group
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack-group
/NXimage_set/stack-group
/NXimage_set_em_adf/stack-group
/NXimage_set_em_kikuchi/stack-group
/NXspectrum_set/stack-group
/NXspectrum_set_em_eels/stack-group
/NXspectrum_set_em_xray/stack-group
stage_lab
/NXapm/ENTRY/atom_probe/stage_lab-group
/NXebeam_column/STAGE_LAB-group
/NXem/ENTRY/em_lab/stage_lab-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB-group
stage_type
/NXopt/ENTRY/INSTRUMENT/sample_stage/stage_type-field
standing_voltage
/NXapm/ENTRY/atom_probe/pulser/standing_voltage-field
/NXpulser_apm/standing_voltage-field
start
/NXregion/start-field
start_time
/NXapm/ENTRY/start_time-field
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_composition_space_results/ENTRY/performance/start_time-field
/NXapm_composition_space_results/ENTRY/start_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_clusterer/ENTRY/start_time-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_distancer/ENTRY/start_time-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_intersector/ENTRY/start_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_nanochem/ENTRY/start_time-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_ranger/ENTRY/start_time-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_selector/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_selector/ENTRY/start_time-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_spatstat/ENTRY/start_time-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_surfacer/ENTRY/start_time-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_tessellator/ENTRY/start_time-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/start_time-field
/NXapm_paraprobe_results_transcoder/ENTRY/start_time-field
/NXarchive/entry/start_time-field
/NXarpes/ENTRY/start_time-field
/NXcs_profiling/start_time-field
/NXcs_profiling_event/start_time-field
/NXcxi_ptycho/entry_1/start_time-field
/NXdetector/start_time-field
/NXdirecttof/entry/start_time-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/start_time-field
/NXem/ENTRY/start_time-field
/NXem_ebsd/ENTRY/start_time-field
/NXentry/start_time-field
/NXevent_data_em/start_time-field
/NXfluo/entry/start_time-field
/NXindirecttof/entry/start_time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/start_time-field
/NXlab_sample_mounting/ENTRY/start_time-field
/NXmonitor/start_time-field
/NXmonopd/entry/start_time-field
/NXmpes/ENTRY/start_time-field
/NXms/ENTRY/start_time-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_PROFILING_EVENT/start_time-field
/NXms_score_results/ENTRY/performance/start_time-field
/NXms_score_results/ENTRY/start_time-field
/NXmx/ENTRY/start_time-field
/NXopt/ENTRY/start_time-field
/NXrefscan/entry/start_time-field
/NXreftof/entry/start_time-field
/NXsas/ENTRY/start_time-field
/NXsastof/ENTRY/start_time-field
/NXscan/ENTRY/start_time-field
/NXsensor_scan/ENTRY/start_time-field
/NXsnsevent/ENTRY/start_time-field
/NXsnshisto/ENTRY/start_time-field
/NXstxm/ENTRY/start_time-field
/NXsubentry/start_time-field
/NXtas/entry/start_time-field
/NXtofnpd/entry/start_time-field
/NXtofraw/entry/start_time-field
/NXtofsingle/entry/start_time-field
/NXtomo/entry/start_time-field
/NXtomophase/entry/start_time-field
/NXtransmission/ENTRY/start_time-field
/NXxas/ENTRY/start_time-field
/NXxbase/entry/start_time-field
/NXxpcs/entry/start_time-field
static_q_list
/NXxpcs/entry/instrument/masks/static_q_list-field
static_roi_map
/NXxpcs/entry/instrument/masks/static_roi_map-field
statistics
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/statistics-group
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/statistics-group
/NXregion/statistics-group
/NXsimilarity_grouping/statistics-group
status
/NXapm/ENTRY/atom_probe/status-field
/NXapm_composition_space_results/ENTRY/status-field
/NXapm_paraprobe_results_clusterer/ENTRY/status-field
/NXapm_paraprobe_results_distancer/ENTRY/status-field
/NXapm_paraprobe_results_nanochem/ENTRY/status-field
/NXapm_paraprobe_results_ranger/ENTRY/status-field
/NXapm_paraprobe_results_selector/ENTRY/status-field
/NXapm_paraprobe_results_spatstat/ENTRY/status-field
/NXapm_paraprobe_results_surfacer/ENTRY/status-field
/NXapm_paraprobe_results_tessellator/ENTRY/status-field
/NXapm_paraprobe_results_transcoder/ENTRY/status-field
/NXattenuator/status-field
/NXbeam_stop/status-field
/NXem_ebsd/ENTRY/experiment/indexing/status-field
/NXfilter/status-field
/NXms_score_results/ENTRY/status-field
stepsize
/NXms_score_config/ENTRY/initial_microstructure/ebsd/stepsize-field
stop_criteria
/NXms_score_config/ENTRY/stop_criteria-group
stop_time
/NXdetector/stop_time-field
store_atomic_mass_sum
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_atomic_mass_sum-field
store_charge_state
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_charge_state-field
store_disjoint_isotopes
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_disjoint_isotopes-field
store_natural_abundance_product
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/molecular_ion_search/store_natural_abundance_product-field
stored_energy_recovery_model
/NXms_score_config/ENTRY/stored_energy_recovery_model-group
strain
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/strain-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/strain-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/strain-group
stress
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/stress-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/stress-group
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/stress-group
stress_field
/NXarchive/entry/sample/stress_field-field
/NXsample/stress_field-field
stride
/NXregion/stride-field
stxm_scan_type
/NXstxm/ENTRY/DATA/stxm_scan_type-field
subentry
/NXentry/SUBENTRY-group
substrate
/NXbeam_splitter/substrate-group
/NXlens_opt/substrate-group
/NXopt/ENTRY/SAMPLE/substrate-field
/NXpolarizer_opt/substrate-group
/NXwaveplate/substrate-group
substrate_density
/NXgrating/substrate_density-field
/NXmirror/substrate_density-field
substrate_material
/NXbeam_splitter/substrate/substrate_material-field
/NXfilter/substrate_material-field
/NXgrating/substrate_material-field
/NXguide/substrate_material-field
/NXlens_opt/substrate/substrate_material-field
/NXmirror/substrate_material-field
/NXpolarizer_opt/substrate/substrate_material-field
/NXwaveplate/substrate/substrate_material-field
substrate_roughness
/NXfilter/substrate_roughness-field
/NXgrating/substrate_roughness-field
/NXguide/substrate_roughness-field
/NXmirror/substrate_roughness-field
substrate_thickness
/NXbeam_splitter/substrate/substrate_thickness-field
/NXfilter/substrate_thickness-field
/NXgrating/substrate_thickness-field
/NXguide/substrate_thickness-field
/NXlens_opt/substrate/substrate_thickness-field
/NXmirror/substrate_thickness-field
/NXpolarizer_opt/substrate/substrate_thickness-field
/NXwaveplate/substrate/substrate_thickness-field
summary
/NXem/ENTRY/measurement/EVENT_DATA_EM/SPECTRUM_SET/summary-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary-group
/NXspectrum_set/summary-group
/NXspectrum_set_em_eels/summary-group
/NXspectrum_set_em_xray/indexing/ELEMENTNAME/summary-group
/NXspectrum_set_em_xray/summary-group
support_membrane_material
/NXfresnel_zone_plate/support_membrane_material-field
support_membrane_thickness
/NXfresnel_zone_plate/support_membrane_thickness-field
surface
/NXguide/reflectivity/surface-field
surface_area
/NXcg_cylinder_set/surface_area-field
/NXcg_ellipsoid_set/surface_area-field
/NXcg_hexahedron_set/surface_area-field
/NXcg_parallelogram_set/surface_area-field
/NXcg_polyhedron_set/surface_area-field
/NXcg_sphere_set/surface_area-field
/NXcg_tetrahedron_set/surface_area-field
surface_energy_density
/NXms_score_config/ENTRY/dispersoid_drag_model/zener_smith_parameter/surface_energy_density-field
surface_meshing
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/surface_meshing-group
surface_type
/NXquadric/surface_type-field
symmetric
/NXxraylens/symmetric-field
symmetry
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/symmetry-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/symmetry-field
/NXcg_grid/symmetry-field
/NXdistortion/symmetry-field
/NXms_score_results/ENTRY/ROI_SET/grid/symmetry-field
t
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/T-field
table
/NXvelocity_selector/table-field
taper
/NXinsertion_device/taper-field
target
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallized_kinetics/target-field
/NXspindispersion/target-field
target_dcom_radius
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_dcom_radius-field
target_edge_length
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_edge_length-field
target_material
/NXsource/target_material-field
target_preparation
/NXspindispersion/target_preparation-field
target_preparation_date
/NXspindispersion/target_preparation_date-field
target_smoothing_step
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/interface_meshing/target_smoothing_step-field
target_value
/NXpositioner/target_value-field
targets
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/targets-field
tdev
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM/Tdev-field
technology
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
/NXcs_io_obj/technology-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_IO_SYS/CS_IO_OBJ/technology-field
telephone_number
/NXapm/ENTRY/USER/telephone_number-field
/NXapm_composition_space_results/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_clusterer/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_distancer/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_intersector/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_nanochem/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_ranger/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_selector/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_spatstat/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_surfacer/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_tessellator/ENTRY/USER/telephone_number-field
/NXapm_paraprobe_results_transcoder/ENTRY/USER/telephone_number-field
/NXem/ENTRY/USER/telephone_number-field
/NXem_ebsd/ENTRY/USER/telephone_number-field
/NXms/ENTRY/USER/telephone_number-field
/NXms_score_results/ENTRY/USER/telephone_number-field
/NXopt/ENTRY/USER/telephone_number-field
/NXsensor_scan/ENTRY/USER/telephone_number-field
/NXtransmission/ENTRY/operator/telephone_number-field
/NXuser/telephone_number-field
temperature
/NXapm/ENTRY/atom_probe/stage_lab/temperature-field
/NXarchive/entry/sample/temperature-field
/NXarpes/ENTRY/SAMPLE/temperature-field
/NXcanSAS/ENTRY/SAMPLE/temperature-field
/NXcrystal/temperature-field
/NXfilter/temperature-field
/NXiv_temp/ENTRY/DATA/temperature-field
/NXmoderator/temperature-field
/NXmpes/ENTRY/SAMPLE/temperature-field
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/temperature-group
/NXms/ENTRY/ROI_SET/snapshot_set/evolution/temperature-group
/NXms_score_config/ENTRY/time_temperature_history/temperature-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/temperature-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution/temperature-group
/NXmx/ENTRY/SAMPLE/temperature-field
/NXsample/temperature-field
/NXsnsevent/ENTRY/instrument/moderator/temperature-field
/NXsnshisto/ENTRY/instrument/moderator/temperature-field
/NXspe/ENTRY/SAMPLE/temperature-field
/NXxbase/entry/sample/temperature-field
/NXxpcs/entry/sample/temperature-field
temperature_coefficient
/NXcrystal/temperature_coefficient-field
temperature_controller
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/temperature_controller-group
temperature_env
/NXsample/temperature_env-group
temperature_log
/NXcrystal/temperature_log-group
/NXfilter/temperature_log-group
/NXmoderator/temperature_log-group
/NXsample/temperature_log-group
temperature_set
/NXxpcs/entry/sample/temperature_set-field
term
/NXcanSAS/ENTRY/PROCESS/term-field
/NXparameters/TERM-field
tessellating
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/tessellating-group
tetrahedra
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra-group
/NXcg_tetrahedron_set/tetrahedra-group
tetrahedron
/NXcg_tetrahedron_set/tetrahedron-group
tetrahedron_half_edge
/NXcg_tetrahedron_set/tetrahedron_half_edge-group
text
/NXdispersive_material/ENTRY/REFERENCES/text-field
texture_index
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/texture_index-field
texture_strength
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/texture_strength-field
thickness
/NXattenuator/thickness-field
/NXbeam_path/window_NUMBER/thickness-field
/NXcanSAS/ENTRY/SAMPLE/thickness-field
/NXcrystal/thickness-field
/NXem/ENTRY/sample/thickness-field
/NXfilter/thickness-field
/NXflipper/thickness-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/thickness-field
/NXsample/thickness-field
thickness_reduction
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/thickness_reduction-field
thread_identifier
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/thread_identifier-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grid/thread_identifier-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallization_front/thread_identifier-field
three_dimensional_rotation_handedness
/NXem_ebsd/ENTRY/conventions/rotation_conventions/three_dimensional_rotation_handedness-field
/NXem_ebsd_conventions/rotation_conventions/three_dimensional_rotation_handedness-field
/NXms/ENTRY/conventions/rotation_conventions/three_dimensional_rotation_handedness-field
/NXms_score_results/ENTRY/conventions/rotation_conventions/three_dimensional_rotation_handedness-field
threshold
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/ion_to_feature_distances/threshold-field
threshold_distance
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/point_to_triangle/threshold_distance-field
threshold_energy
/NXdetector/threshold_energy-field
/NXdetector_channel/threshold_energy-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/threshold_energy-field
threshold_proximity
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION/threshold_proximity-field
thumbnail
/NXapm/ENTRY/thumbnail-group
/NXem/ENTRY/thumbnail-group
/NXentry/thumbnail-group
/NXsubentry/thumbnail-group
tilt
/NXxnb/entry/name/tilt-link
tilt_1
/NXem/ENTRY/em_lab/stage_lab/tilt_1-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/tilt_1-field
/NXstage_lab/tilt_1-field
tilt_2
/NXem/ENTRY/em_lab/stage_lab/tilt_2-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/STAGE_LAB/tilt_2-field
/NXstage_lab/tilt_2-field
tilt_angle
/NXcorrector_cs/ZEMLIN_TABLEAU/tilt_angle-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/tilt_angle-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/tilt_angle-field
/NXxnb/entry/instrument/detector/tilt_angle-field
time
/NXcg_point_set/time-field
/NXem_ebsd/ENTRY/experiment/time-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time-field
/NXlog/time-field
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/time-field
/NXms_score_config/ENTRY/dispersoid_drag_model/zener_smith_parameter/time-field
/NXms_score_config/ENTRY/time_temperature_history/time-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/time-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/evolution/time-group
/NXms_snapshot/time-field
/NXsnsevent/ENTRY/DASlogs/LOG/time-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/time-field
/NXsnshisto/ENTRY/DASlogs/LOG/time-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/time-field
time_control
/NXlab_electro_chemo_mechanical_preparation/ENTRY/GRINDING_STEP/time_control-field
time_of_flight
/NXdetector/time_of_flight-field
/NXlauetof/entry/control/time_of_flight-field
/NXlauetof/entry/instrument/detector/time_of_flight-field
/NXlauetof/entry/name/time_of_flight-link
/NXmonitor/time_of_flight-field
/NXreftof/entry/control/time_of_flight-field
/NXreftof/entry/data/time_of_flight-link
/NXreftof/entry/instrument/detector/time_of_flight-field
/NXsastof/ENTRY/control/time_of_flight-field
/NXsastof/ENTRY/data/time_of_flight-link
/NXsastof/ENTRY/instrument/detector/time_of_flight-field
/NXsnsevent/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/DATA/time_of_flight-link
/NXsnshisto/ENTRY/MONITOR/time_of_flight-field
/NXsnshisto/ENTRY/instrument/DETECTOR/time_of_flight-field
/NXtofnpd/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofnpd/entry/MONITOR/time_of_flight-field
/NXtofnpd/entry/data/time_of_flight-link
/NXtofraw/entry/MONITOR/time_of_flight-field
/NXtofraw/entry/data/time_of_flight-link
/NXtofraw/entry/instrument/detector/time_of_flight-field
/NXtofsingle/entry/INSTRUMENT/detector/time_of_flight-field
/NXtofsingle/entry/MONITOR/time_of_flight-field
/NXtofsingle/entry/data/time_of_flight-link
time_per_channel
/NXarpes/ENTRY/INSTRUMENT/analyser/time_per_channel-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/time_per_channel-field
time_points
/NXtransmission/ENTRY/instrument/time_points-field
time_stamp
/NXapm_paraprobe_config_clusterer/ENTRY/time_stamp-field
/NXapm_paraprobe_config_distancer/ENTRY/time_stamp-field
/NXapm_paraprobe_config_intersector/ENTRY/time_stamp-field
/NXapm_paraprobe_config_nanochem/ENTRY/time_stamp-field
/NXapm_paraprobe_config_ranger/ENTRY/time_stamp-field
/NXapm_paraprobe_config_selector/ENTRY/time_stamp-field
/NXapm_paraprobe_config_spatstat/ENTRY/time_stamp-field
/NXapm_paraprobe_config_surfacer/ENTRY/time_stamp-field
/NXapm_paraprobe_config_tessellator/ENTRY/time_stamp-field
/NXapm_paraprobe_config_transcoder/ENTRY/time_stamp-field
/NXms_score_config/ENTRY/time_stamp-field
time_temperature_history
/NXms_score_config/ENTRY/time_temperature_history-group
time_zone
/NXmx/ENTRY/INSTRUMENT/time_zone-field
timing
/NXelectrostatic_kicker/timing-field
/NXmagnetic_kicker/timing-field
title
/NXapm/ENTRY/atom_probe/ranging/mass_to_charge_distribution/mass_spectrum/title-field
/NXapm/ENTRY/atom_probe/reconstruction/naive_point_cloud_density_map/DATA/title-field
/NXarchive/entry/title-field
/NXarpes/ENTRY/title-field
/NXcanSAS/ENTRY/title-field
/NXcxi_ptycho/entry_1/title-field
/NXdata/title-field
/NXdirecttof/entry/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/IMAGE_SET/stack/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/adf/stack/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/stack/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/eels/summary/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/kikuchi/stack/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/indexing/ELEMENTNAME/summary/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/stack/title-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray/summary/title-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_color_model/title-field
/NXem_ebsd/ENTRY/correlation/PROCESS/ipf_rgb_map/title-field
/NXem_ebsd/ENTRY/correlation/region_of_interest/roi/title-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_color_model/title-field
/NXem_ebsd/ENTRY/experiment/indexing/PROCESS/ipf_rgb_map/title-field
/NXem_ebsd/ENTRY/experiment/indexing/region_of_interest/roi/title-field
/NXem_ebsd/ENTRY/simulation/IMAGE_SET_EM_KIKUCHI/stack/title-field
/NXentry/title-field
/NXfluo/entry/title-field
/NXindirecttof/entry/title-field
/NXiqproc/ENTRY/title-field
/NXmonopd/entry/title-field
/NXmpes/ENTRY/title-field
/NXmx/ENTRY/title-field
/NXrefscan/entry/title-field
/NXreftof/entry/title-field
/NXsas/ENTRY/title-field
/NXsastof/ENTRY/title-field
/NXscan/ENTRY/title-field
/NXsnsevent/ENTRY/title-field
/NXsnshisto/ENTRY/title-field
/NXsource/bunch_pattern/title-field
/NXsqom/ENTRY/title-field
/NXstxm/ENTRY/title-field
/NXsubentry/title-field
/NXtas/entry/title-field
/NXtofnpd/entry/title-field
/NXtofraw/entry/title-field
/NXtofsingle/entry/title-field
/NXtomo/entry/title-field
/NXtomophase/entry/title-field
/NXtomoproc/entry/title-field
/NXxas/ENTRY/title-field
/NXxasproc/ENTRY/title-field
/NXxbase/entry/title-field
tof_calibration
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction/tof_calibration-group
tof_distance
/NXenergydispersion/tof_distance-field
tolerance
/NXpositioner/tolerance-field
top_dead_center
/NXdisk_chopper/top_dead_center-field
top_up
/NXsource/top_up-field
total
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/composition/total-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/composition/total-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/composition/total-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/composition/total-field
/NXchemical_composition/total-field
total_counts
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/NXsnshisto/ENTRY/total_counts-field
total_elapsed_time
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/NXapm_paraprobe_results_surfacer/ENTRY/performance/total_elapsed_time-field
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/NXapm_paraprobe_results_transcoder/ENTRY/performance/total_elapsed_time-field
/NXcs_profiling/total_elapsed_time-field
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total_flux
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total_flux_integrated
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total_physical_memory
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/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
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/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
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/NXcs_mm_sys/total_physical_memory-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/CS_MM_SYS/total_physical_memory-field
total_uncounted_counts
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/NXsnshisto/ENTRY/total_uncounted_counts-field
transfer_rate
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transformations
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/NXaperture_em/TRANSFORMATIONS-group
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/NXbeam/TRANSFORMATIONS-group
/NXbeam_path/TRANSFORMATIONS-group
/NXbeam_stop/TRANSFORMATIONS-group
/NXbending_magnet/TRANSFORMATIONS-group
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/NXcg_cylinder_set/TRANSFORMATIONS-group
/NXcg_ellipsoid_set/TRANSFORMATIONS-group
/NXcg_geodesic_mesh/TRANSFORMATIONS-group
/NXcg_grid/TRANSFORMATIONS-group
/NXcg_hexahedron_set/TRANSFORMATIONS-group
/NXcg_parallelogram_set/TRANSFORMATIONS-group
/NXcg_point_set/TRANSFORMATIONS-group
/NXcg_polyhedron_set/TRANSFORMATIONS-group
/NXcg_polyline_set/TRANSFORMATIONS-group
/NXcg_sphere_set/TRANSFORMATIONS-group
/NXcg_tetrahedron_set/TRANSFORMATIONS-group
/NXcg_triangle_set/TRANSFORMATIONS-group
/NXcollectioncolumn/TRANSFORMATIONS-group
/NXcollimator/TRANSFORMATIONS-group
/NXcoordinate_system_set/TRANSFORMATIONS-group
/NXcorrector_cs/TRANSFORMATIONS-group
/NXcrystal/TRANSFORMATIONS-group
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/NXcxi_ptycho/sample_1/transformations-group
/NXdeflector/TRANSFORMATIONS-group
/NXdetector/TRANSFORMATIONS-group
/NXdisk_chopper/TRANSFORMATIONS-group
/NXebeam_column/electron_source/TRANSFORMATIONS-group
/NXelectronanalyser/TRANSFORMATIONS-group
/NXem/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
/NXem_ebsd/ENTRY/experiment/TRANSFORMATIONS-group
/NXenvironment/TRANSFORMATIONS-group
/NXfermi_chopper/TRANSFORMATIONS-group
/NXfilter/TRANSFORMATIONS-group
/NXflipper/TRANSFORMATIONS-group
/NXfresnel_zone_plate/TRANSFORMATIONS-group
/NXgrating/TRANSFORMATIONS-group
/NXguide/TRANSFORMATIONS-group
/NXibeam_column/ion_source/TRANSFORMATIONS-group
/NXinsertion_device/TRANSFORMATIONS-group
/NXlens_em/TRANSFORMATIONS-group
/NXmanipulator/TRANSFORMATIONS-group
/NXmirror/TRANSFORMATIONS-group
/NXmoderator/TRANSFORMATIONS-group
/NXmonitor/TRANSFORMATIONS-group
/NXmonochromator/TRANSFORMATIONS-group
/NXms/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/volume_statistics/TRANSFORMATIONS-group
/NXms_score_results/ENTRY/COORDINATE_SYSTEM_SET/TRANSFORMATIONS-group
/NXmx/ENTRY/INSTRUMENT/DETECTOR/TRANSFORMATIONS-group
/NXmx/ENTRY/SAMPLE/TRANSFORMATIONS-group
/NXorientation_set/TRANSFORMATIONS-group
/NXpinhole/TRANSFORMATIONS-group
/NXpolarizer/TRANSFORMATIONS-group
/NXpositioner/TRANSFORMATIONS-group
/NXpulser_apm/SOURCE/TRANSFORMATIONS-group
/NXreflectron/TRANSFORMATIONS-group
/NXregistration/TRANSFORMATIONS-group
/NXsample/TRANSFORMATIONS-group
/NXsensor/TRANSFORMATIONS-group
/NXslit/TRANSFORMATIONS-group
/NXsource/TRANSFORMATIONS-group
/NXspindispersion/TRANSFORMATIONS-group
/NXstage_lab/TRANSFORMATIONS-group
/NXvelocity_selector/TRANSFORMATIONS-group
/NXxraylens/TRANSFORMATIONS-group
translation
/NXcxi_ptycho/data_1/translation-link
/NXcxi_ptycho/entry_1/instrument_1/detector_1/translation-field
/NXcxi_ptycho/sample_1/geometry_1/translation-link
/NXgeometry/TRANSLATION-group
/NXsnsevent/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/translation-group
/NXsnshisto/ENTRY/instrument/APERTURE/origin/translation-group
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/translation-group
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/translation-group
transmission
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/NXcanSAS/ENTRY/SAMPLE/transmission-field
/NXcapillary/transmission-group
/NXcrystal/transmission-group
/NXfilter/transmission-group
/NXlens_opt/transmission-field
/NXpolarizer_opt/transmission-field
/NXsample/transmission-group
/NXsample_component/transmission-group
transmission_spectrum
/NXcanSAS/ENTRY/TRANSMISSION_SPECTRUM-group
transmittance
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transmitting_material
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/NXfermi_chopper/transmitting_material-field
triangle_cluster_identifier
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triangle_identifier
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/triangle_identifier-field
triangle_set
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/NXcg_alpha_complex/triangle_set-group
triangle_set_wrapping
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triangle_soup
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/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup-group
triangles
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles-group
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles-group
/NXcg_triangle_set/triangles-group
triangulation
/NXcg_alpha_complex/triangulation-group
trigger_dead_time
/NXdetector/trigger_dead_time-field
trigger_delay_time
/NXdetector/trigger_delay_time-field
trigger_delay_time_set
/NXdetector/trigger_delay_time_set-field
trigger_internal_delay_time
/NXdetector/trigger_internal_delay_time-field
turbomolecular_pump
/NXapm/ENTRY/atom_probe/turbomolecular_pump-group
twist
/NXvelocity_selector/twist-field
two_time_corr_func
/NXxpcs/entry/twotime/two_time_corr_func-field
twotime
/NXxpcs/entry/twotime-group
type
/NXapm/ENTRY/atom_probe/ion_detector/type-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/random_number_generator/type-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/type-field
/NXarchive/entry/instrument/SOURCE/type-field
/NXarchive/entry/sample/type-field
/NXarpes/ENTRY/INSTRUMENT/SOURCE/type-field
/NXattenuator/type-field
/NXbeam_path/GRATING/type-field
/NXbeam_path/SOURCE/type-field
/NXbeam_splitter/type-field
/NXcapillary/type-field
/NXcg_alpha_complex/type-field
/NXcollimator/type-field
/NXcrystal/type-field
/NXcs_prng/type-field
/NXcxi_ptycho/entry_1/instrument_1/source_1/type-field
/NXdeflector/type-field
/NXdetector/type-field
/NXdisk_chopper/type-field
/NXenvironment/type-field
/NXfermi_chopper/type-field
/NXfiber/type-field
/NXflipper/type-field
/NXfluo/entry/INSTRUMENT/SOURCE/type-field
/NXinsertion_device/type-field
/NXiqproc/ENTRY/instrument/SOURCE/type-field
/NXlens_em/type-field
/NXlens_opt/type-field
/NXmanipulator/type-field
/NXmirror/type-field
/NXmoderator/type-field
/NXmonitor/type-field
/NXmonopd/entry/INSTRUMENT/SOURCE/type-field
/NXmpes/ENTRY/INSTRUMENT/SOURCE/type-field
/NXms_score_config/ENTRY/initial_microstructure/type-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/type-field
/NXnote/type-field
/NXpolarizer/type-field
/NXpolarizer_opt/type-field
/NXrefscan/entry/instrument/SOURCE/type-field
/NXsample/type-field
/NXsas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXsastof/ENTRY/instrument/source/type-field
/NXsensor/type-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/type-field
/NXsnsevent/ENTRY/instrument/SNS/type-field
/NXsnsevent/ENTRY/instrument/moderator/type-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/type-field
/NXsnshisto/ENTRY/instrument/SNS/type-field
/NXsnshisto/ENTRY/instrument/moderator/type-field
/NXsource/type-field
/NXspindispersion/type-field
/NXsqom/ENTRY/instrument/SOURCE/type-field
/NXstxm/ENTRY/INSTRUMENT/SOURCE/type-field
/NXtomo/entry/instrument/SOURCE/type-field
/NXtomophase/entry/instrument/SOURCE/type-field
/NXtomoproc/entry/INSTRUMENT/SOURCE/type-field
/NXtransmission/ENTRY/instrument/DETECTOR/slit/type-field
/NXtransmission/ENTRY/instrument/DETECTOR/type-field
/NXtransmission/ENTRY/instrument/SOURCE/type-field
/NXvelocity_selector/type-field
/NXwaveplate/type-field
/NXxas/ENTRY/INSTRUMENT/SOURCE/type-field
/NXxbase/entry/instrument/source/type-field
type_dict_keyword
/NXms_feature_set/type_dict_keyword-field
type_dict_value
/NXms_feature_set/type_dict_value-field
type_other
/NXpolarizer_opt/type_other-field
ub_matrix
/NXsample/ub_matrix-field
unassigned
/NXclustering/unassigned-field
uncertainty
/NXaberration/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/uncertainty-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/uncertainty-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty-field
/NXms_feature_set/interfaces/uncertainty-group
/NXms_feature_set/lines/uncertainty-group
/NXms_feature_set/points/uncertainty-group
/NXms_feature_set/volumes/uncertainty-group
uncertainty_model
/NXaberration/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_1_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_2_3_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_5_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_0/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_a/uncertainty_model-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_1/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_2/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_3/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_4/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/a_6/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_2/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/b_4/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_1/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_3/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/c_5/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/d_4/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/r_5/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_3/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/ceos/s_5/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_0/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_a/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_1_2_b/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_3_4_b/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_a/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_1_b/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_4_3_b/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_2_a/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_a/uncertainty_model-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_4_b/uncertainty_model-field
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/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU/PROCESS/nion/c_5_6_b/uncertainty_model-field
underload_value
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/NXdetector_channel/underload_value-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/underload_value-field
unit_cell
/NXcrystal/unit_cell-field
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/NXsample/unit_cell-field
/NXtas/entry/SAMPLE/unit_cell-field
/NXxbase/entry/sample/unit_cell-field
unit_cell_a
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/NXfilter/unit_cell_a-field
unit_cell_abc
/NXem_ebsd/ENTRY/correlation/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_abc-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_abc-field
/NXem_ebsd_crystal_structure_model/unit_cell_abc-field
/NXsample/unit_cell_abc-field
/NXsample_component/unit_cell_abc-field
unit_cell_alpha
/NXcrystal/unit_cell_alpha-field
/NXfilter/unit_cell_alpha-field
unit_cell_alphabetagamma
/NXem_ebsd/ENTRY/correlation/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_alphabetagamma-field
/NXem_ebsd/ENTRY/experiment/indexing/EM_EBSD_CRYSTAL_STRUCTURE_MODEL/unit_cell_alphabetagamma-field
/NXem_ebsd_crystal_structure_model/unit_cell_alphabetagamma-field
/NXsample/unit_cell_alphabetagamma-field
/NXsample_component/unit_cell_alphabetagamma-field
unit_cell_b
/NXcrystal/unit_cell_b-field
/NXfilter/unit_cell_b-field
unit_cell_beta
/NXcrystal/unit_cell_beta-field
/NXfilter/unit_cell_beta-field
unit_cell_c
/NXcrystal/unit_cell_c-field
/NXfilter/unit_cell_c-field
unit_cell_class
/NXem_ebsd_crystal_structure_model/unit_cell_class-field
/NXsample/unit_cell_class-field
/NXsample_component/unit_cell_class-field
unit_cell_gamma
/NXcrystal/unit_cell_gamma-field
/NXfilter/unit_cell_gamma-field
unit_cell_volume
/NXcrystal/unit_cell_volume-field
/NXem_ebsd_crystal_structure_model/unit_cell_volume-field
/NXfilter/unit_cell_volume-field
/NXsample/unit_cell_volume-field
/NXsample_component/unit_cell_volume-field
upper_cap_radius
/NXcg_cylinder_set/upper_cap_radius-field
url
/NXcite/url-field
/NXtransmission/ENTRY/operator/url-field
usage
/NXcrystal/usage-field
user
/NXapm/ENTRY/USER-group
/NXapm_composition_space_results/ENTRY/USER-group
/NXapm_paraprobe_results_clusterer/ENTRY/USER-group
/NXapm_paraprobe_results_distancer/ENTRY/USER-group
/NXapm_paraprobe_results_intersector/ENTRY/USER-group
/NXapm_paraprobe_results_nanochem/ENTRY/USER-group
/NXapm_paraprobe_results_ranger/ENTRY/USER-group
/NXapm_paraprobe_results_selector/ENTRY/USER-group
/NXapm_paraprobe_results_spatstat/ENTRY/USER-group
/NXapm_paraprobe_results_surfacer/ENTRY/USER-group
/NXapm_paraprobe_results_tessellator/ENTRY/USER-group
/NXapm_paraprobe_results_transcoder/ENTRY/USER-group
/NXarchive/entry/user-group
/NXem/ENTRY/USER-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/USER-group
/NXem_ebsd/ENTRY/USER-group
/NXentry/USER-group
/NXevent_data_em/USER-group
/NXlab_electro_chemo_mechanical_preparation/ENTRY/USER-group
/NXlab_sample_mounting/ENTRY/USER-group
/NXmpes/ENTRY/USER-group
/NXms/ENTRY/USER-group
/NXms_score_results/ENTRY/USER-group
/NXopt/ENTRY/USER-group
/NXsensor_scan/ENTRY/USER-group
/NXsnsevent/ENTRY/USER-group
/NXsnshisto/ENTRY/USER-group
/NXsubentry/USER-group
/NXtofnpd/entry/user-group
/NXtofraw/entry/user-group
/NXtofsingle/entry/user-group
uuid
/NXapm_composition_space_results/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_clusterer/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_distancer/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_intersector/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_nanochem/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_ranger/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_selector/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_spatstat/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_surfacer/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_tessellator/ENTRY/performance/CS_COMPUTER/uuid-field
/NXapm_paraprobe_results_transcoder/ENTRY/performance/CS_COMPUTER/uuid-field
/NXcs_computer/uuid-field
/NXms_score_results/ENTRY/performance/CS_COMPUTER/uuid-field
value
/NXadc/value-field
/NXaperture_em/value-field
/NXapm/ENTRY/atom_probe/local_electrode/APERTURE_EM/value-field
/NXdac/value-field
/NXdispersion_single_parameter/value-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_SINGLE_PARAMETER/value-field
/NXelectrostatic_kicker/read_current/value-field
/NXelectrostatic_kicker/read_voltage/value-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/value-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/value-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/value-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/value-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/APERTURE_EM/value-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM/value-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/APERTURE_EM/value-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM/value-field
/NXlens_em/value-field
/NXlog/value-field
/NXmagnetic_kicker/read_current/value-field
/NXmagnetic_kicker/read_voltage/value-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/recrystallized_kinetics/value-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/strain/value-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/stress/value-field
/NXorientation/value-field
/NXpid/pv_sensor/value_log/value-field
/NXpositioner/value-field
/NXquadrupole_magnet/read_current/value-field
/NXquadrupole_magnet/read_voltage/value-field
/NXsensor/value-field
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value-field
/NXseparator/read_Bfield_current/value-field
/NXseparator/read_Bfield_voltage/value-field
/NXseparator/read_Efield_current/value-field
/NXseparator/read_Efield_voltage/value-field
/NXsnsevent/ENTRY/DASlogs/LOG/value-field
/NXsnsevent/ENTRY/DASlogs/POSITIONER/value-field
/NXsnsevent/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnsevent/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsnshisto/ENTRY/DASlogs/LOG/value-field
/NXsnshisto/ENTRY/DASlogs/POSITIONER/value-field
/NXsnshisto/ENTRY/instrument/APERTURE/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/origin/orientation/value-field
/NXsnshisto/ENTRY/instrument/DETECTOR/origin/orientation/value-field
/NXsolenoid_magnet/read_current/value-field
/NXsolenoid_magnet/read_voltage/value-field
/NXspin_rotator/read_Bfield_current/value-field
/NXspin_rotator/read_Bfield_voltage/value-field
/NXspin_rotator/read_Efield_current/value-field
/NXspin_rotator/read_Efield_voltage/value-field
value_deriv1
/NXsensor/value_deriv1-field
value_deriv1_log
/NXsensor/value_deriv1_log-group
value_deriv2
/NXsensor/value_deriv2-field
value_deriv2_log
/NXsensor/value_deriv2_log-group
value_log
/NXpid/pv_sensor/value_log-group
/NXsensor/value_log-group
value_timestamp
/NXsensor_scan/ENTRY/INSTRUMENT/ENVIRONMENT/SENSOR/value_timestamp-field
values
/NXdispersion_function/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersion_repeated_parameter/values-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/DISPERSION_REPEATED_PARAMETER/values-field
/NXopt/ENTRY/INSTRUMENT/sample_stage/environment_conditions/PARAMETER/values-field
variable
/NXiqproc/ENTRY/DATA/variable-field
varied_parameter_link
/NXopt/ENTRY/data_collection/varied_parameter_link-field
vector
/NXcxi_ptycho/entry_1/instrument_1/detector_1/transformations/vector-field
velocity
/NXpositioner/velocity-field
velocity_selector
/NXinstrument/VELOCITY_SELECTOR-group
/NXmonochromator/VELOCITY_SELECTOR-group
vendor
/NXapm/ENTRY/atom_probe/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/REFLECTRON/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/analysis_chamber/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/buffer_chamber/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/getter_pump/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/load_lock_chamber/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/pulser/SOURCE/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/roughening_pump/FABRICATION/vendor-field
/NXapm/ENTRY/atom_probe/turbomolecular_pump/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/APERTURE_EM/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/EBEAM_DEFLECTOR/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/APERTURE_EM/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/IBEAM_DEFLECTOR/FABRICATION/vendor-field
/NXem/ENTRY/em_lab/stage_lab/FABRICATION/vendor-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/FABRICATION/vendor-field
/NXfabrication/vendor-field
/NXlab_electro_chemo_mechanical_preparation/ENTRY/grinding_machine/vendor-field
/NXlab_sample_mounting/ENTRY/mounting_machine/vendor-field
version
/NXdispersive_material/ENTRY/version-field
/NXiqproc/ENTRY/reduction/version-field
/NXopt/ENTRY/INSTRUMENT/software/version-field
/NXopt/ENTRY/data_collection/data_software/version-field
/NXopt/ENTRY/derived_parameters/ANALYSIS_program/version-field
/NXprocess/version-field
/NXsnsevent/ENTRY/SNSHistoTool/version-field
/NXsnshisto/ENTRY/SNSHistoTool/version-field
/NXsqom/ENTRY/reduction/version-field
/NXtomoproc/entry/reconstruction/version-field
/NXxasproc/ENTRY/XAS_data_reduction/version-field
vertex_identifier
/NXcg_face_list_data_structure/vertex_identifier-field
vertex_identifier_offset
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/vertex_identifier_offset-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/vertex_identifier_offset-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/vertex_identifier_offset-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/vertex_identifier_offset-field
/NXcg_face_list_data_structure/vertex_identifier_offset-field
/NXcg_half_edge_data_structure/vertex_identifier_offset-field
vertex_incident_half_edge
/NXcg_half_edge_data_structure/vertex_incident_half_edge-field
vertex_normal
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/vertex_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/vertex_normal-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/vertex_normal-group
/NXcg_hexahedron_set/vertex_normal-group
/NXcg_parallelogram_set/vertex_normal-group
/NXcg_polygon_set/vertex_normal-group
/NXcg_polyhedron_set/vertex_normal-group
/NXcg_polyline_set/vertex_normal-group
/NXcg_tetrahedron_set/vertex_normal-group
/NXcg_triangle_set/vertex_normal-group
vertices
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/CG_HEXAHEDRON_SET/hexahedra/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/hexahedra/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/vertices-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/vertices-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/vertices-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/vertices-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/vertices-field
/NXcg_face_list_data_structure/vertices-field
/NXcg_polyline_set/vertices-field
/NXcylindrical_geometry/vertices-field
/NXoff_geometry/vertices-field
vertices_are_unique
/NXcg_face_list_data_structure/vertices_are_unique-field
/NXcg_polyline_set/vertices_are_unique-field
virtual_pixel_interpolation_applied
/NXdetector/virtual_pixel_interpolation_applied-field
/NXmx/ENTRY/INSTRUMENT/DETECTOR/virtual_pixel_interpolation_applied-field
visualization
/NXapm/ENTRY/atom_probe/reconstruction/visualization-group
/NXapm_paraprobe_results_transcoder/ENTRY/visualization-group
voltage
/NXdeflector/voltage-field
/NXebeam_column/electron_source/voltage-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/LENS_EM/voltage-field
/NXem/ENTRY/em_lab/EBEAM_COLUMN/electron_source/voltage-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/LENS_EM/voltage-field
/NXem/ENTRY/em_lab/IBEAM_COLUMN/ion_source/voltage-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/LENS_EM/voltage-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/electron_source/voltage-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/LENS_EM/voltage-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/IBEAM_COLUMN/ion_source/voltage-field
/NXibeam_column/ion_source/voltage-field
/NXiv_temp/ENTRY/DATA/voltage-field
/NXlens_em/voltage-field
/NXsource/voltage-field
voltage_and_bowl_correction
/NXapm/ENTRY/atom_probe/voltage_and_bowl_correction-group
voltage_controller
/NXiv_temp/ENTRY/INSTRUMENT/ENVIRONMENT/voltage_controller-group
volume
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/volume-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/volume-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/volume-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/volume-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/volume-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/volume-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/volume-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/volume-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/volume-field
/NXcg_cylinder_set/volume-field
/NXcg_ellipsoid_set/volume-field
/NXcg_hexahedron_set/volume-field
/NXcg_polyhedron_set/volume-field
/NXcg_sphere_set/volume-field
/NXcg_tetrahedron_set/volume-field
/NXion/volume-field
/NXms_score_results/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/grain_ensemble/volume-field
volume_fraction
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/volume_statistics/volume_fraction-field
/NXsample/volume_fraction-field
/NXsample_component/volume_fraction-field
volume_statistics
/NXms/ENTRY/ROI_SET/snapshot_set/MS_SNAPSHOT/odf/volume_statistics-group
volume_volume_spatial_correlation
/NXapm_paraprobe_config_intersector/ENTRY/VOLUME_VOLUME_SPATIAL_CORRELATION-group
/NXapm_paraprobe_results_intersector/ENTRY/PROCESS/VOLUME_VOLUME_SPATIAL_CORRELATION-group
volumes
/NXms_feature_set/volumes-group
volumetric_feature
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature-group
voronoi_cells
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells-group
voronoi_tessellation
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation-group
voxel_identifier
/NXapm_composition_space_results/ENTRY/voxelization/CG_GRID/voxel_identifier-field
voxelization
/NXapm_composition_space_results/ENTRY/voxelization-group
wall_contact_bottom
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_bottom-group
wall_contact_front
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_front-group
wall_contact_global
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_global-group
wall_contact_left
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_left-group
wall_contact_rear
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_rear-group
wall_contact_right
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_right-group
wall_contact_top
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/wall_contact_top-group
warmup
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/random_number_generator/warmup-field
/NXcs_prng/warmup-field
wavelength
/NXapm/ENTRY/atom_probe/pulser/SOURCE/wavelength-field
/NXcrystal/wavelength-field
/NXdetector/efficiency/wavelength-field
/NXdispersion_table/wavelength-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_TABLE/wavelength-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_TABLE/wavelength-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_TABLE/wavelength-field
/NXfermi_chopper/wavelength-field
/NXfluo/entry/INSTRUMENT/monochromator/wavelength-field
/NXguide/reflectivity/wavelength-field
/NXmonochromator/wavelength-field
/NXmonopd/entry/INSTRUMENT/CRYSTAL/wavelength-field
/NXpulser_apm/SOURCE/wavelength-field
/NXrefscan/entry/instrument/monochromator/wavelength-field
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength-field
/NXsnsevent/ENTRY/instrument/CRYSTAL/wavelength-field
/NXsnshisto/ENTRY/instrument/CRYSTAL/wavelength-field
/NXtransmission/ENTRY/instrument/spectrometer/wavelength-field
/NXvelocity_selector/wavelength-field
/NXxbase/entry/instrument/monochromator/wavelength-field
/NXxlaue/entry/instrument/source/distribution/wavelength-field
wavelength_dispersion
/NXmonochromator/wavelength_dispersion-field
wavelength_error
/NXmonochromator/wavelength_error-field
wavelength_errors
/NXmonochromator/wavelength_errors-field
wavelength_identifier
/NXdispersion_function/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_identifier-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_identifier-field
wavelength_max
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_max-field
/NXdispersion_function/wavelength_max-field
wavelength_min
/NXcanSAS/ENTRY/INSTRUMENT/SOURCE/wavelength_min-field
/NXdispersion_function/wavelength_min-field
wavelength_range
/NXbeam_splitter/wavelength_range-field
/NXdisk_chopper/wavelength_range-field
/NXpolarizer_opt/wavelength_range-field
/NXtransmission/ENTRY/instrument/DETECTOR/wavelength_range-field
/NXtransmission/ENTRY/instrument/SOURCE/wavelength_range-field
/NXtransmission/ENTRY/instrument/spectrometer/GRATING/wavelength_range-field
wavelength_range_coating
/NXbeam_splitter/coating/wavelength_range_coating-field
/NXwaveplate/coating/wavelength_range_coating-field
wavelength_spread
/NXsas/ENTRY/INSTRUMENT/MONOCHROMATOR/wavelength_spread-field
/NXvelocity_selector/wavelength_spread-field
wavelength_unit
/NXdispersion_function/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_x/DISPERSION_FUNCTION/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_y/DISPERSION_FUNCTION/wavelength_unit-field
/NXdispersive_material/ENTRY/dispersion_z/DISPERSION_FUNCTION/wavelength_unit-field
wavelengths
/NXwaveplate/wavelengths-field
waveplate
/NXbeam_path/WAVEPLATE-group
wedge_angle
/NXbeam_splitter/SHAPE/wedge_angle-field
/NXpolarizer_opt/SHAPE/wedge_angle-field
weight
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/cluster_analysis/dbscanID/weight-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/weight-field
/NXdelocalization/weight-field
weighting_model
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/weighting_model-field
/NXdelocalization/weighting_model-field
weinberg_vector
/NXcg_half_edge_data_structure/weinberg_vector-field
width
/NXcg_hexahedron_set/width-field
/NXcg_parallelogram_set/width-field
/NXfermi_chopper/width-field
/NXvelocity_selector/width-field
winding_order
/NXcg_face_list_data_structure/winding_order-field
/NXoff_geometry/winding_order-field
window
/NXapm_paraprobe_results_clusterer/ENTRY/PROCESS/window-group
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window-group
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/window-group
/NXapm_paraprobe_results_ranger/ENTRY/PROCESS/apply_existent_ranging/window-group
/NXapm_paraprobe_results_selector/ENTRY/PROCESS/window-group
/NXapm_paraprobe_results_spatstat/ENTRY/PROCESS/window-group
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/window-group
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/window-group
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/window-group
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW-group
window_correction
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/window_correction-group
window_effects_corrected
/NXopt/ENTRY/INSTRUMENT/sample_stage/WINDOW/window_effects_corrected-field
window_number
/NXbeam_path/window_NUMBER-group
window_triangles
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/window_triangles-group
windowing_method
/NXapm_paraprobe_config_clusterer/ENTRY/cluster_analysis/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_distancer/ENTRY/PROCESS/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_nanochem/ENTRY/PROCESS/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_ranger/ENTRY/PROCESS/apply_existent_ranging/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_selector/ENTRY/roi_selection/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_spatstat/ENTRY/PROCESS/spatial_statistics/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_surfacer/ENTRY/PROCESS/spatial_filter/windowing_method-field
/NXapm_paraprobe_config_tessellator/ENTRY/PROCESS/spatial_filter/windowing_method-field
/NXspatial_filter/windowing_method-field
workflow_description
/NXem_ebsd/ENTRY/workflow_description-field
/NXms/ENTRY/workflow_description-field
workflow_identifier
/NXem_ebsd/ENTRY/workflow_identifier-field
/NXms/ENTRY/workflow_identifier-field
workflow_step_description
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_description-field
workflow_step_identifier
/NXlab_electro_chemo_mechanical_preparation/ENTRY/workflow_step_identifier-field
working_distance
/NXcapillary/working_distance-field
/NXcollectioncolumn/working_distance-field
/NXem/ENTRY/em_lab/OPTICAL_SYSTEM_EM/working_distance-field
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/OPTICAL_SYSTEM_EM/working_distance-field
/NXoptical_system_em/working_distance-field
x
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/NXcxi_ptycho/DATA/x-link
/NXdata/x-field
/NXtomoproc/entry/data/x-field
x_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/x_gap-field
/NXslit/x_gap-field
x_indices
/NXcxi_ptycho/DATA/x_indices-field
x_pixel_offset
/NXdetector/x_pixel_offset-field
/NXsnsevent/ENTRY/DATA/x_pixel_offset-link
/NXsnsevent/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnsevent/ENTRY/instrument/DETECTOR/x_pixel_offset-field
/NXsnshisto/ENTRY/DATA/x_pixel_offset-link
/NXsnshisto/ENTRY/instrument/APERTURE/x_pixel_offset-field
/NXsnshisto/ENTRY/instrument/DETECTOR/x_pixel_offset-field
x_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/x_pixel_size-field
/NXdetector/x_pixel_size-field
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/NXreftof/entry/instrument/detector/x_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/x_pixel_size-field
/NXsastof/ENTRY/instrument/detector/x_pixel_size-field
/NXtomo/entry/instrument/detector/x_pixel_size-field
/NXtomophase/entry/instrument/sample/x_pixel_size-field
/NXxbase/entry/instrument/detector/x_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/x_pixel_size-field
x_position
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/NXcanSAS/ENTRY/SAMPLE/x_position-field
x_rotation_axis_pixel_position
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x_translation
/NXsample/x_translation-field
/NXtomo/entry/sample/x_translation-field
/NXtomophase/entry/sample/x_translation-field
/NXxbase/entry/sample/x_translation-field
xas_data_reduction
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xaxis_alias
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xaxis_boundary_convention
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/NXem_ebsd_conventions/pattern_centre/xaxis_boundary_convention-field
xaxis_direction
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/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame/xaxis_direction-field
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/xaxis_direction-field
/NXem_ebsd/ENTRY/conventions/sample_reference_frame/xaxis_direction-field
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/NXms_score_results/ENTRY/conventions/sample_reference_frame/xaxis_direction-field
xaxis_normalization_direction
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/NXem_ebsd_conventions/pattern_centre/xaxis_normalization_direction-field
xdmf_cell_identifier
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/xdmf_cell_identifier-field
xdmf_cylinder
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/composition_analysis/xdmf_cylinder-group
xdmf_feature_identifier
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/hexahedra/xdmf_feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/xdmf_feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/xdmf_feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/xdmf_feature_identifier-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/xdmf_feature_identifier-field
xdmf_gradient
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/xdmf_gradient-field
xdmf_intensity
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/xdmf_intensity-field
xdmf_ion_identifier
/NXapm_paraprobe_results_distancer/ENTRY/PROCESS/point_to_triangle_set/xdmf_ion_identifier-field
xdmf_topology
/NXapm/ENTRY/atom_probe/reconstruction/visualization/xdmf_topology-field
/NXapm/ENTRY/atom_probe/reconstruction/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_POST_DCOM_STEP/triangles/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/interface_modelling/MESH_CURR_PRE_DCOM_STEP/triangles/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/bounding_box/hexahedron/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/triangles/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/obb/hexahedra/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_close_to_edge/objectID/polyhedron/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/objects/objects_far_from_edge/objectID/polyhedron/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_close_to_edge/objectID/polyhedron/xdmf_topology-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/iso_surface/triangle_soup/volumetric_feature/proxies/proxies_far_from_edge/objectID/polyhedron/xdmf_topology-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/interior_tetrahedra/tetrahedra/xdmf_topology-field
/NXapm_paraprobe_results_surfacer/ENTRY/PROCESS/POINT_SET_WRAPPING/alpha_complex/triangle_set/triangles/xdmf_topology-field
/NXapm_paraprobe_results_tessellator/ENTRY/PROCESS/voronoi_tessellation/voronoi_cells/polyhedra/xdmf_topology-field
/NXapm_paraprobe_results_transcoder/ENTRY/visualization/xdmf_topology-field
xdmf_xyz
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/xdmf_xyz-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/xdmf_xyz-field
xpos
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/xpos-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/xpos-field
xray
/NXem/ENTRY/measurement/EVENT_DATA_EM/xray-group
xraylens
/NXbeam_path/XRAYLENS-group
/NXinstrument/XRAYLENS-group
y
/NXbeam_stop/y-field
/NXcxi_ptycho/DATA/y-link
/NXdata/y-field
/NXtomoproc/entry/data/y-field
y_gap
/NXcanSAS/ENTRY/INSTRUMENT/APERTURE/y_gap-field
/NXslit/y_gap-field
/NXtransmission/ENTRY/instrument/common_beam_mask/y_gap-field
y_indices
/NXcxi_ptycho/DATA/y_indices-field
y_pixel_offset
/NXdetector/y_pixel_offset-field
/NXsnsevent/ENTRY/DATA/y_pixel_offset-link
/NXsnsevent/ENTRY/instrument/DETECTOR/y_pixel_offset-field
/NXsnshisto/ENTRY/DATA/y_pixel_offset-link
/NXsnshisto/ENTRY/instrument/DETECTOR/y_pixel_offset-field
y_pixel_size
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXcxi_ptycho/entry_1/instrument_1/detector_1/y_pixel_size-field
/NXdetector/y_pixel_size-field
/NXlauetof/entry/instrument/detector/y_pixel_size-field
/NXreftof/entry/instrument/detector/y_pixel_size-field
/NXsas/ENTRY/INSTRUMENT/DETECTOR/y_pixel_size-field
/NXsastof/ENTRY/instrument/detector/y_pixel_size-field
/NXtomo/entry/instrument/detector/y_pixel_size-field
/NXtomophase/entry/instrument/sample/y_pixel_size-field
/NXxbase/entry/instrument/detector/y_pixel_size-field
/NXxpcs/entry/instrument/DETECTOR/y_pixel_size-field
y_position
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/y_position-field
/NXcanSAS/ENTRY/SAMPLE/y_position-field
y_rotation_axis_pixel_position
/NXtomo/entry/instrument/detector/y_rotation_axis_pixel_position-field
y_translation
/NXtomo/entry/sample/y_translation-field
/NXtomophase/entry/sample/y_translation-field
/NXxbase/entry/sample/y_translation-field
yaw
/NXcanSAS/ENTRY/INSTRUMENT/DETECTOR/yaw-field
/NXcanSAS/ENTRY/SAMPLE/yaw-field
yaxis_alias
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/yaxis_alias-field
/NXem_ebsd_conventions/processing_reference_frame/yaxis_alias-field
/NXms/ENTRY/conventions/processing_reference_frame/yaxis_alias-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/yaxis_alias-field
yaxis_boundary_convention
/NXem_ebsd/ENTRY/conventions/pattern_centre/yaxis_boundary_convention-field
/NXem_ebsd_conventions/pattern_centre/yaxis_boundary_convention-field
yaxis_direction
/NXem_ebsd/ENTRY/conventions/detector_reference_frame/yaxis_direction-field
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame/yaxis_direction-field
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/yaxis_direction-field
/NXem_ebsd/ENTRY/conventions/sample_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/detector_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/processing_reference_frame/yaxis_direction-field
/NXem_ebsd_conventions/sample_reference_frame/yaxis_direction-field
/NXms/ENTRY/conventions/processing_reference_frame/yaxis_direction-field
/NXms/ENTRY/conventions/sample_reference_frame/yaxis_direction-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/yaxis_direction-field
/NXms_score_results/ENTRY/conventions/sample_reference_frame/yaxis_direction-field
yaxis_normalization_direction
/NXem_ebsd/ENTRY/conventions/pattern_centre/yaxis_normalization_direction-field
/NXem_ebsd_conventions/pattern_centre/yaxis_normalization_direction-field
ypos
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/ypos-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/ypos-field
z
/NXdata/z-field
/NXtomoproc/entry/data/z-field
z_pixel_offset
/NXdetector/z_pixel_offset-field
z_translation
/NXtomo/entry/sample/z_translation-field
/NXtomophase/entry/sample/z_translation-field
zaxis_alias
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/zaxis_alias-field
/NXem_ebsd_conventions/processing_reference_frame/zaxis_alias-field
/NXms/ENTRY/conventions/processing_reference_frame/zaxis_alias-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/zaxis_alias-field
zaxis_direction
/NXem_ebsd/ENTRY/conventions/detector_reference_frame/zaxis_direction-field
/NXem_ebsd/ENTRY/conventions/gnomonic_projection_reference_frame/zaxis_direction-field
/NXem_ebsd/ENTRY/conventions/processing_reference_frame/zaxis_direction-field
/NXem_ebsd/ENTRY/conventions/sample_reference_frame/zaxis_direction-field
/NXem_ebsd_conventions/detector_reference_frame/zaxis_direction-field
/NXem_ebsd_conventions/gnomonic_projection_reference_frame/zaxis_direction-field
/NXem_ebsd_conventions/processing_reference_frame/zaxis_direction-field
/NXem_ebsd_conventions/sample_reference_frame/zaxis_direction-field
/NXms/ENTRY/conventions/processing_reference_frame/zaxis_direction-field
/NXms/ENTRY/conventions/sample_reference_frame/zaxis_direction-field
/NXms_score_results/ENTRY/conventions/processing_reference_frame/zaxis_direction-field
/NXms_score_results/ENTRY/conventions/sample_reference_frame/zaxis_direction-field
zemlin_tableau
/NXcorrector_cs/ZEMLIN_TABLEAU-group
/NXem/ENTRY/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU-group
/NXem/ENTRY/measurement/EVENT_DATA_EM/em_lab/EBEAM_COLUMN/aberration_correction/ZEMLIN_TABLEAU-group
zener_smith_parameter
/NXms_score_config/ENTRY/dispersoid_drag_model/zener_smith_parameter-group
zone_height
/NXfresnel_zone_plate/zone_height-field
zone_material
/NXfresnel_zone_plate/zone_material-field
zone_support_material
/NXfresnel_zone_plate/zone_support_material-field
zpos
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_gradient/zpos-field
/NXapm_paraprobe_results_nanochem/ENTRY/PROCESS/iso_surface_analysis/DELOCALIZATION/grid/scalar_field_magnitude/zpos-field

written: 2024-11-23T02:04:12.020886