3.3.3.67. NXcorrector_cs¶
Status:
base class (contribution), extends NXcomponent
Description:
Corrector for aberrations in an electron microscope. ...
Corrector for aberrations in an electron microscope.
Different technology partners use different naming schemes and models for quantifying the aberration coefficients.
The corrector in an electron microscope is composed of multiple lenses and multipole stigmators with vendor-specific details which are often undisclosed.
Symbols:
No symbol table
- Groups cited:
NXaberration_model_ceos, NXaberration_model_nion, NXlens_em, NXprocess
Structure:
ZEMLIN_TABLEAU: (optional) NXprocess
Specific information about the concrete alignment procedure which is a ...
Specific information about the concrete alignment procedure which is a process during which the corrector is configured to enable a calibrated usage of the microscope.
description: (optional) NX_CHAR
Discouraged free-text field to add further details about the alignment ...
Discouraged free-text field to add further details about the alignment procedure.
tilt_angle: (optional) NX_FLOAT {units=NX_ANGLE}
The outer tilt angle of the beam in tableau aquisition.
exposure_time: (optional) NX_FLOAT {units=NX_TIME}
The exposure time of the single tilt images.
magnification: (optional) NX_NUMBER {units=NX_DIMENSIONLESS}
The factor of enlargement of the apparent size, ...
The factor of enlargement of the apparent size, not physical size, of an object.
PROCESS: (optional) NXprocess
Place for storing measured or estimated aberrations (for each image or final).
ceos: (optional) NXaberration_model_ceos
nion: (optional) NXaberration_model_nion
LENS_EM: (optional) NXlens_em
Hypertext Anchors¶
List of hypertext anchors for all groups, fields, attributes, and links defined in this class.