3.3.3.139. NXreflectron

Status:

base class (contribution), extends NXobject

Description:

Device for reducing flight time differences of ions in ToF experiments. ...

Device for reducing flight time differences of ions in ToF experiments. For atom probe the reflectron can be considered an energy_compensation device, which can e.g. be realized technically as via a Poschenrieder lens (see US patent 3863068 or US patents for the reflectron 6740872, or the curved reflectron 8134119 design).

Symbols:

No symbol table

Groups cited:

NXfabrication, NXtransformations

Structure:

name: (optional) NX_CHAR

Given name/alias.

description: (optional) NX_CHAR

Free-text field to specify further details about the reflectron. ...

Free-text field to specify further details about the reflectron. The field can be used to inform e. g. if the reflectron is flat or curved.

FABRICATION: (optional) NXfabrication

TRANSFORMATIONS: (optional) NXtransformations

Affine transformation(s) which detail where the reflectron ...

Affine transformation(s) which detail where the reflectron is located relative to e.g. the origin of the specimen space reference coordinate system. This group can also be used for specifying how the reflectron is rotated relative to the specimen axis. The purpose of these more detailed instrument descriptions is to support the creation of a digital twin of the instrument for computational science.

Hypertext Anchors

List of hypertext anchors for all groups, fields, attributes, and links defined in this class.

NXDL Source:

https://github.com/nexusformat/definitions/blob/main/contributed_definitions/NXreflectron.nxdl.xml